SGLS148F December   2002  – June 2024 ULQ2003A-Q1 , ULQ2004A-Q1

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics, ULQ2003AT and ULQ2003AQ
    6. 5.6 Electrical Characteristics, ULQ2004AT
    7. 5.7 Switching Characteristics, ULQ2003A and ULQ2004A
    8. 5.8 Dissipation Ratings
    9. 5.9 Typical Characteristics
  7. 6 Parameter Measurement Information
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
    4. 7.4 Device Functional Modes
      1. 7.4.1 Inductive Load Drive
      2. 7.4.2 Resistive Load Drive
  9. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
        1. 8.2.2.1 Drive Current
        2. 8.2.2.2 Low-Level Output Voltage
        3. 8.2.2.3 Power Dissipation and Temperature
      3. 8.2.3 Application Curve
    3. 8.3 System Examples
    4. 8.4 Power Supply Recommendations
    5. 8.5 Layout
      1. 8.5.1 Layout Guidelines
      2. 8.5.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Related Links
    2. 9.2 Support Resources
    3. 9.3 Trademarks
    4. 9.4 Electrostatic Discharge Caution
    5. 9.5 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

Refer to the PDF data sheet for device specific package drawings

Mechanical Data (Package|Pins)
  • PW|16
  • D|16
Thermal pad, mechanical data (Package|Pins)

6 Parameter Measurement Information

ULQ2003A-Q1 ULQ2004A-Q1 ICEX Test Circuit Figure 6-1 ICEX Test Circuit
ULQ2003A-Q1 ULQ2004A-Q1 ICEX Test Circuit Figure 6-2 ICEX Test Circuit
ULQ2003A-Q1 ULQ2004A-Q1 II(off) Test Circuit Figure 6-3 II(off) Test Circuit
ULQ2003A-Q1 ULQ2004A-Q1 II Test Circuit Figure 6-4 II Test Circuit
ULQ2003A-Q1 ULQ2004A-Q1 IR Test Circuit Figure 6-5 IR Test Circuit
ULQ2003A-Q1 ULQ2004A-Q1 VF Test Circuit Figure 6-6 VF Test Circuit
ULQ2003A-Q1 ULQ2004A-Q1 hFE, VCE(sat) Test Circuit
A. II is fixed for measuring VCE(sat), variable for measuring hFE.
Figure 6-7 hFE, VCE(sat) Test Circuit
ULQ2003A-Q1 ULQ2004A-Q1 VI(on) Test Circuit Figure 6-8 VI(on) Test Circuit
ULQ2003A-Q1 ULQ2004A-Q1 Propagation Delay-Time Waveforms Figure 6-9 Propagation Delay-Time Waveforms
ULQ2003A-Q1 ULQ2004A-Q1 Latch-Up Test Circuit and Voltage Waveforms
A. The pulse generator has the following characteristics: PRR = 12.5 kHz, ZO = 50 Ω.
B. CL includes probe and jig capacitance.
C. For testing the ULQ2003A, VIH = 3 V; for the ULQ2004A, VIH = 8 V.
Figure 6-10 Latch-Up Test Circuit and Voltage Waveforms