4 Revision History
Changes from Revision A (November 2003) to Revision B (March 2022)
- Updated the numbering format for tables, figures, and cross-references throughout
the documentGo
- Added Pin Functions, ESD Ratings, Thermal
Information, Recommended Operating Conditions, and Electrical
Characteristics tables, and Detailed Description,
Overview, Functional Block Diagram, Feature Description,
Application and Implementation, Device and Documentation
Support, and Mechanical, Packaging, and Orderable Information
sectionsGo
- Added Pin Functions tableGo
- Changed operating temperature minimum value from –55°C to –40°C in
Absolute Maximum Ratings
Go
- Deleted thermal resistance, θJA specification of 150 °C/W
from Electrical Characteristics; added a Thermal Information
table, with RθJA = 128.2 °C/W and other detailed thermal
parameters.Go
- Changed span error test condition from: IIN = 250 µA to
25 mA to: IOUT = 250 µA to 25 mA in Electrical
Characteristics
Go
- Changed VREF voltage accuracy vs load typical value from
±100 ppm/mA to ±200 ppm/mA in Electrical Characteristics
Go
- Changed bias current vs temperature typical value from 150 pA/°C
to 300 pA/°C in Electrical Characteristics
Go
- Changed Basic Circuit Connections application diagramGo
- Changed External Transistor applications information section to
incorporate additional guidance regarding transistor power dissipation and thermal
concernsGo
- Added Circuit Stability application information
sectionGo