The ADC12J4000 device is a wideband sampling and digital tuning device. Texas Instruments' giga-sample analog-to-digital converter (ADC) technology enables a large block of frequency spectrum to be sampled directly at RF. An integrated DDC (Digital Down Converter) provides digital filtering and down-conversion. The selected frequency block is made available on a JESD204B serial interface. Data is output as baseband 15-bit complex information for ease of downstream processing. Based on the digital down-converter (DDC) decimation and link output rate settings, this data is output on 1 to 5 lanes of the serial interface.
A DDC bypass mode allows the full rate 12-bit raw ADC data to also be output. This mode of operation requires 8 lanes of serial output.
The ADC12J4000 device is available in a 68-pin VQFN package. The device operates over the Industrial (–40°C ≤ TA ≤ 85°C) ambient temperature range.
PART NUMBER | PACKAGE | BODY SIZE (NOM) |
---|---|---|
ADC12J4000 | VQFN (68) | 10.00 mm × 10.00 mm |
Changes from C Revision (July 2015) to D Revision
Changes from B Revision (September 2014) to C Revision
Changes from A Revision (February 2014) to B Revision
PIN | EQUIVALENT CIRCUIT | TYPE | DESCRIPTION | |
---|---|---|---|---|
NAME | NO. | |||
ANALOG | ||||
RBIAS+ | 1 | ![]() |
I/O | External Bias Resistor Connections
External bias resistor terminals. A 3.3 kΩ (±0.1%) resistor should be connected between RBIAS+ and RBIAS–. The RBIAS resistor is used as a reference for internal circuits which affect the linearity of the converter. The value and precision of this resistor should not be compromised. These pins must be isolated from all other signals and grounds. |
RBIAS– | 2 | |||
TDIODE– | 63 | ![]() |
Passive | Temperature Diode
These pins are the positive (anode) and negative (cathode) diode connections for die temperature measurements. Leave these pins unconnected if they are not used. See the Built-In Temperature Monitor Diode section for more details. |
TDIODE+ | 64 | |||
VBG | 68 | ![]() |
O | Bandgap Output Voltage
This pin is capable of sourcing or sinking 100 μA and can drive a load up to 80 pF. Leave this pin unconnected if it is not used in the application. See the The Reference Voltage section for more details. |
VCMO | 3 | O | Common Mode Voltage
The voltage output at this pin must be the common-mode input voltage at the VIN+ and VIN– pins when DC coupling is used. This pin is capable of sourcing or sinking 100 μA and can drive a load up to 80 pF. Leave this pin unconnected if it is not used in the application. |
|
VIN+ | 8 | ![]() |
I | Signal Input
The differential full-scale input range is determined by the full-scale voltage adjust register. An internal peaking inductor (LPEAK) of 5 nH is included for parasitic compensation. |
VIN– | 9 | |||
DATA | ||||
DS0– | 32 | ![]() |
O | Data
CML These pins are the high-speed serialized-data outputs with user-configurable pre-emphasis. These outputs must always be terminated with a 100-Ω differential resistor at the receiver. |
DS0+ | 33 | |||
DS1– | 35 | |||
DS1+ | 36 | |||
DS2– | 38 | |||
DS2+ | 39 | |||
DS3– | 41 | |||
DS3+ | 42 | |||
DS4– | 44 | |||
DS4+ | 45 | |||
DS5–/NCO_0 | 47 | ![]() |
O/I | Data
DS5–/NCO_0, DS5+/NCO_0, DS6–/NCO_1, DS6+/NCO_1, DS7–/NCO_2 and DS7+/NCO_2: When decimation is enabled, these pins become LVCMOS inputs and allow the host device to select the specific NCO frequency or phase accumulator that is active. In this mode the positive (+) and negative (–) pins should be connected together and both driven. An acceptable alternative is to let one of the pair float while the other pin is driven. Connect these inputs to GND if they are not used in the application. |
DS5+/NCO_0 | 48 | |||
DS6−/NCO_1 | 50 | |||
DS6+/NCO_1 | 51 | |||
DS7−/NCO_2 | 53 | |||
DS7+/NCO_2 | 54 | |||
GROUND, RESERVED, DNC | ||||
DNC | 67 | — | Do Not Connect
Do not connect DNC to any circuitry, power, or ground signals. |
|
RSV | 66 | ![]() |
— | Reserved
Connect to Ground or Leave Unconnected: This reserved pin is a logic input for possible future device versions. It is recommended to connect this pin to ground. Floating this pin is also permissible. |
RSV2 | 61 | — | Reserved
Connect to Ground Connect this reserved input pin to ground for proper operation. |
|
Thermal Pad | — | Ground (GND)
The exposed pad on the bottom of the package is the ground return for all supplies. This pad must be connected with multiple vias to the printed circuit board (PCB) ground planes to ensure proper electrical and thermal performance. The exposed center pad on the bottom of the package must be thermally and electrically connected (soldered) to a ground plane to ensure rated performance. |
||
LVCMOS | ||||
OR_T0 | 25 | ![]() |
O | Over-Range
Over-range detection status for T0 and T1 thresholds. Leave these pins unconnected if they are not used in the application. |
OR_T1 | 26 | |||
SCLK | 58 | ![]() |
I | Serial Interface Clock
This pin functions as the serial-interface clock input which clocks the serial data in and out. The Using the Serial Interface section describes the serial interface in more detail. |
SDI | 57 | I | Serial Data In
This pin functions as the serial-interface data input. The Using the Serial Interface section describes the serial interface in more detail. |
|
SYNC~ | 30 | I | SYNC~
This pin provides the JESD204B-required synchronizing request input. A logic-low applied to this input initiates a lane alignment sequence. The choice of LVCMOS or differential SYNC~ is selected through bit 6 of the configuration register 0x202h. Connect this input to GND or VA19 if differential SYNC~ input is used. |
|
SCS | 59 | I | Serial Chip Select (active low)
This pin functions as the serial-interface chip select. The Using the Serial Interface section describes the serial interface in more detail. |
|
SDO | 56 | ![]() |
O | Serial Data Out
This pin functions as the serial-interface data output. The Using the Serial Interface section describes the serial interface in more detail. |
DIFFERENTIAL INPUT | ||||
DEVCLK+ | 15 | ![]() |
I | Device Clock Input
The differential device clock signal must be AC coupled to these pins. The input signal is sampled on the rising edge of CLK. |
DEVCLK– | 16 | |||
SYSREF+ | 19 | I | SYSREF
The differential periodic waveform on these pins synchronizes the device per JESD204B. If JESD204B subclass 1 synchronization is not required and these inputs are not utilized they may be left unconnected. In that case ensure SysRef_Rcvr_En=0 and SysRef_Pr_En=0. |
|
SYSREF– | 20 | |||
SYNC~+/TMST+ | 22 | I | SYNC~/TMST
This differential input provides the JESD204B-required synchronizing request input. A differential logic-low applied to these inputs initiates a lane alignment sequence. For differential SYNC~ usage, ensure that SYNC_DIFF_PD = 0 and SYNC_DIFFSEL = 1. When the LVCMOS SYNC~ is selected these inputs can be used as the differential TIMESTAMP input. For TMST usage, ensure that SYNC_DIFF_PD = 0, SYNC_DIFFSEL = 0, and TIME_STAMP_EN = 1. For additional information see the Time Stamp section. These inputs may be left unconnected if they are not used for either the SYNC~ or TIMESTAMP functions. |
|
SYNC~-/TMST– | 23 | |||
POWER | ||||
VA12 | 6 | — | Analog 1.2 V power supply pins
Bypass these pins to ground using one 10-µF capacitor and two 1-µF capacitors for bulk decoupling plus one 0.1-µF capacitor per pin for individual decoupling. |
|
11 | ||||
14 | ||||
17 | ||||
18 | ||||
21 | ||||
65 | ||||
VA19 | 4 | — | Analog 1.9 V power supply pins
Bypass these pins to ground using one 10-µF capacitor and two 1-µF capacitors for bulk decoupling plus one 0.1-µF capacitor per pin for individual decoupling. |
|
7 | ||||
10 | ||||
13 | ||||
24 | ||||
27 | ||||
60 | ||||
62 | ||||
VD12 | 28 | — | Digital 1.2 V power supply pins
Bypass these pins to ground using one 10-µF capacitor and two 1-µF capacitors for bulk decoupling plus one 0.1-µF capacitor per pin for individual decoupling. |
|
31 | ||||
34 | ||||
37 | ||||
40 | ||||
43 | ||||
46 | ||||
49 | ||||
52 | ||||
55 | ||||
VNEG | 5 | I | VNEG
These pins must be decoupled to ground with a 0.1-µF ceramic capacitor near each pin. These power input pins must be connected to the VNEG_OUT pin with a low resistance path. The connections must be isolated from any noisy digital signals and must also be isolated from the analog input and clock input pins. |
|
12 | ||||
VNEG_OUT | 29 | O | VNEG_OUT
The voltage on this output can range from –1V to +1V. This pin must be decoupled to ground with a 4.7-µF, low ESL, low ESR multi-layer ceramic chip capacitor and connected to the VNEG input pins. This voltage must be isolated from any noisy digital signals, clocks, and the analog input. |
MIN | MAX | UNIT | |||
---|---|---|---|---|---|
Supply voltage | 1.2-V supply | VA12, VD12 | 1.4 | V | |
1.9-V supply | VA19 | 2.2 | |||
1.2-V supply difference between VA12 and VD12 | –200 | 200 | mV | ||
Voltage | On any input pin (except VIN+ or VIN–) | –0.15 | V(VA19) + 0.15 | V | |
On VIN+ or VIN– | 0 | 2 | |||
Voltage difference | |(VIN+) – (VIN–)|(2) | 2 | V | ||
|(DEVCLK+) – (DEVCLK–)| | 2 | ||||
|(SYSREF+) – (SYSREF–)| | 2 | ||||
|(~SYNC+) – (~SYNC–)| | 1 | ||||
RF input power, PI | On VIN+, VIN–, with proper input common mode maintained. FIN ≥ 3 GHz, Z(SOURCE) = 100 Ω, Input_Clamp_EN = 0 or 1 | 11.07 | dBm | ||
On VIN+, VIN–, with proper input common mode maintained. FIN = 1 GHz, Z(SOURCE) = 100 Ω, Input_Clamp_EN = 1 | 14.95 | ||||
On VIN+, VIN–, with proper input common mode maintained. FIN ≤ 100 MHz, Z(SOURCE) = 100 Ω, Input_Clamp_EN = 1 | 20.97 | ||||
Input current | At any pin other than VIN+ or VIN–(4) | –25 | 25 | mA | |
VIN+ or VIN– | –50 | 50 | mA DC | ||
Package(4) (sum of absolute value of all currents forced in or out, not including power supply current) | 100 | mA | |||
Junction temperature, TJ | Power applied. Verified by High Temperature Operation Life testing to 1000 hours. | –40 | 150 | °C | |
Storage temperature, Tstg | –65 | 150 | °C |
VALUE | UNIT | |||
---|---|---|---|---|
V(ESD) | Electrostatic discharge | Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins(1) | ±2000 | V |
Charged device model (CDM), per JEDEC specification JESD22-C101, all pins(2) | ±500 |
THERMAL METRIC(1) | ADC12J4000 | UNIT | |
---|---|---|---|
NKE (VQFN) | |||
68 PINS | |||
RθJA | Thermal resistance, junction-to-ambient | 19.8 | °C/W |
RθJCbot | Thermal resistance, junction-to-case (bottom) | 2.7 | °C/W |
ψJB | Characterization parameter, junction-to-board | 9.1 | °C/W |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
---|---|---|---|---|---|---|---|
DYNAMIC PERFORMANCE CHARACTERISTICS | |||||||
RES | ADC core resolution | Resolution with no missing codes | 12 | Bits | |||
INL | Integral non-linearity | TA = 25°C | ±2 | LSB | |||
TA = TMIN to TMAX | ±3 | ||||||
DNL | Differential non-linearity | TA = 25°C | ±0.25 | LSB | |||
TA = TMIN to TMAX | ±0.3 | ||||||
Peak NPR | Peak noise power ratio | 500-kHz tone spacing from 1 MHz to ƒS / 2−1 MHz, DDC bypass mode 25-MHz wide notch at 320 MHz |
46 | dB | |||
IMD3 | Third-order intermodulation distortion | F1 = 2110 MHz at −13 dBFS F2 = 2170 MHz at −13 dBFS |
–64 | dBc | |||
DDC BYPASS MODE | |||||||
SNR1 | Signal-to-noise ratio, integrated across entire Nyquist bandwidth Input frequency-dependent interleaving spurs included |
FIN = 350 MHz, –1 dBFS, 12-bit DDC bypass mode | 55 | dBFS | |||
FIN = 600 MHz, –1 dBFS, 12-bit DDC bypass mode | TA = 25°C | 54.8 | |||||
TA = TMIN to TMAX | 52.5 | ||||||
TA = 25°C, calibration = BG | 53.9 | ||||||
TA = TMIN to TMAX, calibration = BG | 49.4 | ||||||
FIN = 1500 MHz, –1 dBFS, 12-bit DDC bypass mode | 51.2 | ||||||
FIN = 2400 MHz, –1 dBFS, 12-bit DDC bypass mode | 48.7 | ||||||
SNR2 | Signal-to-noise ratio, integrated across entire Nyquist bandwidth Input frequency-dependent interleaving spurs excluded |
FIN = 600 MHz, –1 dBFS, 12-bit DDC bypass mode | TA = 25°C(4) | 55 | dBFS | ||
TA = TMIN to TMAX(4) | 53 | ||||||
TA = 25°C, calibration = BG(4) | 55 | ||||||
TA = TMIN to TMAX, calibration = BG(4) | 53 | ||||||
SINAD1 | Signal-to-noise and distortion ratio, integrated across entire Nyquist bandwidth Input frequency-dependent interleaving spurs included |
FIN = 350 MHz, –1 dBFS, 12-bit DDC bypass mode | 54.8 | dBFS | |||
FIN = 600 MHz, –1 dBFS, 12-bit DDC bypass mode | TA = 25°C | 54.7 | |||||
TA = TMIN to TMAX | 52.3 | ||||||
TA = 25°C, calibration = BG | 53.8 | ||||||
TA = TMIN to TMAX, calibration = BG | 49.2 | ||||||
FIN = 1500 MHz, –1 dBFS, 12-bit DDC bypass mode | 51.1 | ||||||
FIN = 2400 MHz, –1 dBFS, 12-bit DDC bypass mode | 48.7 | ||||||
SINAD2 | Signal-to-noise and distortion ratio, integrated across DDC output bandwidth Input frequency-dependent interleaving spurs excluded |
FIN = 600 MHz, –1 dBFS, 12-bit DDC bypass mode | TA = 25°C(4) | 54.9 | dBFS | ||
TA = TMIN to TMAX(4) | 52.7 | ||||||
TA = 25°C, calibration = BG(4) | 54.9 | ||||||
TA = TMIN to TMAX, calibration = BG(4) | 52.7 | ||||||
ENOB1 | Effective number of bits, integrated across entire Nyquist bandwidth Input frequency-dependent interleaving spurs included |
FIN = 350 MHz, –1 dBFS, 12-bit DDC bypass mode | 8.8 | Bits | |||
FIN = 600 MHz, –1 dBFS, 12-bit DDC bypass mode | TA = 25°C | 8.8 | |||||
TA = TMIN to TMAX | 8.4 | ||||||
TA = 25°C, calibration = BG | 8.7 | ||||||
TA = TMIN to TMAX, calibration = BG | 7.9 | ||||||
FIN = 1500 MHz, –1 dBFS, 12-bit DDC bypass mode | 8.2 | ||||||
FIN = 2400 MHz, –1 dBFS, 12-bit DDC bypass mode | 7.8 | ||||||
ENOB2 | Effective number of bits, integrated across entire Nyquist bandwidth Input frequency-dependent interleaving spurs excluded |
FIN = 600 MHz, –1 dBFS, 12-bit DDC bypass mode | TA = 25°C(4) | 8.8 | Bits | ||
TA = TMIN to TMAX(4) | 8.5 | ||||||
TA = 25°C, calibration = BG(4) | 8.8 | ||||||
TA = TMIN to TMAX, calibration = BG(4) | 8.5 | ||||||
SFDR1 | Spurious-free dynamic range Input frequency-dependent interleaving spurs included |
FIN = 350 MHz, –1 dBFS, 12-bit DDC bypass mode | 67.4 | dBFS | |||
FIN = 600 MHz, –1 dBFS, 12-bit DDC bypass mode | TA = 25°C | 70.7 | |||||
TA = TMIN to TMAX | 60 | ||||||
TA = 25°C, calibration = BG | 63.4 | ||||||
TA = TMIN to TMAX, calibration = BG | 51.8 | ||||||
FIN = 1500 MHz, –1 dBFS, 12-bit DDC bypass mode | 59.8 | ||||||
FIN = 2400 MHz, –1 dBFS, 12-bit DDC bypass mode | 57.2 | ||||||
SFDR2 | Spurious-free dynamic range Input frequency-dependent interleaving spurs excluded |
FIN = 600 MHz, –1 dBFS, 12-bit DDC bypass mode | TA = 25°C(4) | 73 | dBFS | ||
TA = TMIN to TMAX(4) | 61.6 | ||||||
TA = 25°C, calibration = BG(4) | 74 | ||||||
TA = TMIN to TMAX, calibration = BG (4)mode | 62.8 | ||||||
ƒS/2 | Interleaving offset spur at ½ sampling rate | FIN = 350 MHz, –1 dBFS, 12-bit DDC bypass mode | –75 | dBFS | |||
FIN = 600 MHz, –1 dBFS, 12-bit DDC bypass mode | TA = 25°C | –76 | |||||
TA = TMIN to TMAX | –60 | ||||||
TA = 25°C, calibration = BG | –68 | ||||||
TA = TMIN to TMAX, calibration = BG | –55 | ||||||
FIN = 1500 MHz, –1 dBFS, 12-bit DDC bypass mode | –75 | ||||||
FIN = 2400 MHz, –1 dBFS, 12-bit DDC bypass mode | –75 | ||||||
ƒS/4 | Interleaving offset spur at ¼ sampling rate | FIN = 350 MHz, –1 dBFS, 12-bit DDC bypass mode | –68 | dBFS | |||
FIN = 600 MHz, –1 dBFS, 12-bit DDC bypass mode | TA = 25°C | –70 | |||||
TA = TMIN to TMAX | –55 | ||||||
TA = 25°C, calibration = BG | –61 | ||||||
TA = TMIN to TMAX, calibration = BG | –47.4 | ||||||
FIN = 1500 MHz, –1 dBFS, 12-bit DDC bypass mode | –68 | ||||||
FIN = 2400 MHz, –1 dBFS, 12-bit DDC bypass mode | –68 | ||||||
ƒS/2 – FIN | Interleaving offset spur at ½ sampling rate – input frequency | FIN = 600 MHz, –1 dBFS, 12-bit DDC bypass mode | TA = 25°C | –77 | dBFS | ||
TA = TMIN to TMAX | –61.7 | ||||||
TA = 25°C, calibration = BG | –70 | ||||||
TA = TMIN to TMAX, calibration = BG | –51.9 | ||||||
ƒS/4 + FIN | Interleaving offset spur at ¼ sampling rate + input frequency | FIN = 600 MHz, –1 dBFS, 12-bit DDC bypass mode | TA = 25°C | –74 | dBFS | ||
TA = TMIN to TMAX | –60 | ||||||
TA = 25°C, calibration = BG | –66 | ||||||
TA = TMIN to TMAX, calibration = BG | –52 | ||||||
ƒS/4 – FIN | Interleaving offset spur at ¼ sampling rate – input frequency | FIN = 600 MHz, –1 dBFS, 12-bit DDC bypass mode | TA = 25°C | –76 | dBFS | ||
TA = TMIN to TMAX | –60.4 | ||||||
TA = 25°C, calibration = BG | –67 | ||||||
TA = TMIN to TMAX, calibration = BG | –53.3 | ||||||
THD | Total harmonic distortion | FIN = 350 MHz, –1 dBFS, 12-bit DDC bypass mode | –72 | dBFS | |||
FIN = 600 MHz, –1 dBFS, 12-bit DDC bypass mode | TA = 25°C | –70 | |||||
TA = TMIN to TMAX | –60 | ||||||
TA = 25°C, calibration = BG | –72 | ||||||
TA = TMIN to TMAX, calibration = BG | –60 | ||||||
FIN = 1500 MHz, –1 dBFS, 12-bit DDC bypass mode | –68 | ||||||
FIN = 2400 MHz, –1 dBFS, 12-bit DDC bypass mode | –74 | ||||||
HD2 | Second harmonic distortion | FIN = 350 MHz, –1 dBFS, 12-bit DDC bypass mode | –85 | dBFS | |||
FIN = 600 MHz, –1 dBFS, 12-bit DDC bypass mode | TA = 25°C | –80 | |||||
TA = TMIN to TMAX | –62 | ||||||
TA = 25°C, calibration = BG | –80 | ||||||
TA = TMIN to TMAX, calibration = BG | –62.5 | ||||||
FIN = 1500 MHz, –1 dBFS, 12-bit DDC bypass mode | –71 | ||||||
FIN = 2400 MHz, –1 dBFS, 12-bit DDC bypass mode | –79 | ||||||
HD3 | Third harmonic distortion | FIN = 350 MHz, –1 dBFS, 12-bit DDC bypass mode | –73 | dBFS | |||
FIN = 600 MHz, –1 dBFS, 12-bit DDC bypass mode | TA = 25°C | –75 | |||||
TA = TMIN to TMAX | –61 | ||||||
TA = 25°C, calibration = BG | –80 | ||||||
TA = TMIN to TMAX, calibration = BG | –61.7 | ||||||
FIN = 1500 MHz, –1 dBFS, 12-bit DDC bypass mode | –74 | ||||||
FIN = 2400 MHz, –1 dBFS, 12-bit DDC bypass mode | –76 | ||||||
NSD | Noise spectral density, average NSD across Nyquist bandwidth | 12-bit DDC bypass mode | 50-Ω AC-coupled terminated input | –149 | dBFS/Hz | ||
–150.8 | dBm/Hz | ||||||
FIN = 600 MHz, –1 dBFS | –147.8 | dBFS/Hz | |||||
–149.6 | dBm/Hz | ||||||
DECIMATE-BY-8 MODE | |||||||
SNR1 | Signal-to-noise ratio, integrated across DDC output bandwidth Interleaving spurs included |
FIN = 600 MHz, –1 dBFS, decimate-by-8 mode | 63 | dBFS | |||
Calibration = BG | 61.6 | ||||||
FIN = 2400 MHz, –1 dBFS, decimate-by-8 mode | 54.6 | ||||||
SNR2 | Signal-to-noise ratio, integrated across DDC output bandwidth Interleaving spurs excluded |
FIN = 600 MHz, –1 dBFS, decimate-by-8 mode(4) | 63.3 | dBFS | |||
Calibration = BG | 63.3 | ||||||
SINAD1 | Signal-to-noise and distortion ratio, integrated across DDC output bandwidth Interleaving spurs included |
FIN = 600 MHz, –1 dBFS, Decimate-by-8 mode | 63 | dBFS | |||
Calibration = BG | 61.6 | ||||||
FIN = 2400 MHz, –1 dBFS, decimate-by-8 mode | 54.6 | ||||||
SINAD2 | Signal-to-noise and distortion ratio, integrated across DDC output bandwidth Interleaving spurs excluded |
FIN = 600 MHz, –1 dBFS, decimate-by-8 mode(4) | 63.3 | dBFS | |||
Calibration = BG | 63.3 | ||||||
ENOB1 | Effective number of bits, integrated across DDC output bandwidth Interleaving spurs included |
FIN = 600 MHz, –1 dBFS, decimate-by-8 mode | 10.2 | Bits | |||
Calibration = BG | 10.0 | ||||||
FIN = 2400 MHz, –1 dBFS, decimate-by-8 mode | 8.8 | ||||||
ENOB2 | Effective number of bits, integrated across DDC output bandwidth Interleaving spurs excluded |
FIN = 600 MHz, –1 dBFS, decimate-by-8 mode(5) | 10.2 | Bits | |||
Calibration = BG | 10.2 | ||||||
SFDR1 | Spurious-free dynamic range Interleaving Spurs Included |
FIN = 600 MHz, –1 dBFS, decimate-by-8 mode | 74.9 | dBFS | |||
Calibration = BG | 68.3 | ||||||
SFDR2 | Spurious-free dynamic range Interleaving spurs excluded |
FIN = 600 MHz, –1 dBFS, decimate-by-8 mode(5) | 77.8 | dBFS | |||
Calibration = BG | 77.8 | ||||||
ƒS/2 | Interleaving offset spur at ½ sampling rate(5) | FIN = 600 MHz, –1 dBFS, decimate-by-8 mode | –73 | dBFS | |||
Calibration = BG | –72 | ||||||
ƒS/4 | Interleaving offset spur at ¼ sampling rate(5) | FIN = 600 MHz, –1 dBFS, decimate-by-8 mode | –70 | dBFS | |||
Calibration = BG | –66 | ||||||
ƒS/2 – FIN | Interleaving spur at ½ sampling rate – input frequency(5) | FIN = 600 MHz, –1 dBFS, decimate-by-8 mode | –76 | dBFS | |||
Calibration = BG | –67 | ||||||
ƒS/4 + FIN | Interleaving spur at ¼ sampling rate + input frequency(5) | FIN = 600 MHz, –1 dBFS, decimate-by-8 mode | –72 | dBFS | |||
Calibration = BG | –64 | ||||||
ƒS/4 – FIN | Interleaving spur at ¼ sampling rate – input frequency(5) | FIN = 600 MHz, –1 dBFS, decimate-by-8 mode | –74 | dBFS | |||
Calibration = BG | –67 | ||||||
THD | Total harmonic distortion(6) | FIN = 600 MHz, –1 dBFS, decimate-by-8 mode | –70 | dBFS | |||
Calibration = BG | –72 | ||||||
FIN = 2400 MHz, –1 dBFS, decimate-by-8 mode | –71 | ||||||
HD2 | Second harmonic distortion(6) | FIN = 600 MHz, –1 dBFS, decimate-by-8 mode | –80 | dBFS | |||
Calibration = BG | –79 | ||||||
FIN = 2400 MHz, –1 dBFS, decimate-by-8 mode | –78 | ||||||
HD3 | Third harmonic distortion(6) | FIN = 600 MHz, –1 dBFS, decimate-by-8 mode | –74 | dBFS | |||
Calibration = BG | –80 | ||||||
FIN = 2400 MHz, –1 dBFS, decimate-by-8 mode | –-77 | ||||||
DDC CHARACTERISTICS | |||||||
Alias protection(2) | 80 | dB | |||||
Alias protected bandwidth(2) | 80 | % of output BW | |||||
SFDR-DDC | Spurious-free dynamic range of digital down-converter(2) | 100 | dB | ||||
Implementation loss(2) | 0.5 | dB | |||||
ANALOG INPUT CHARACTERISTICS | |||||||
VID(VIN) | Full-scale analog-differential input range | Minimum FSR setting(6) | 500 | mVPP | |||
Default FSR setting, TA = TMIN to TMAX | 650 | 725 | 800 | ||||
Maximum FSR setting(6) | 950 | ||||||
CI(VIN) | Analog input capacitance(2) | Differential | 0.05 | pF | |||
Each input pin to ground | 1.5 | pF | |||||
RID(VIN) | Differential input resistance | 80 | 95 | 110 | Ω | ||
FPBW | Full power bandwidth | –3 dB — calibration = BG | 2.8 | GHz | |||
–3 dB — calibration = FG | 3.2 | ||||||
Gain flatness | DC to 2 GHz | 1.2 | dB | ||||
2 GHz to 4 GHz | 3.8 | ||||||
DC to 2 GHz — calibration = BG | 1.5 | ||||||
2 GHz to 4 GHz — calibration = BG | 4.5 | ||||||
ANALOG OUTPUT CHARACTERISTICS (VCMO, VBG) | |||||||
V(VCMO) | Common-mode output voltage | I(VCMO) = ±100 µA, TA = 25°C | 1.225 | V | |||
I(VCMO) = ±100 µA, TA = TMIN to TMAX | 1.185 | 1.265 | |||||
TCVO(VCMO) | Common-mode output-voltage temperature coefficient | TA = TMIN to TMAX | -21 | ppm/°C | |||
C(LOAD_VCMO) | Maximum VCMO output load capacitance | 80 | pF | ||||
VO(BG) | Bandgap reference output voltage | I(BG) = ±100 µA, TA = 25°C | 1.248 | V | |||
I(BG) = ±100 µA, TA = TMIN to TMAX | 1.195 | 1.3 | |||||
TCVref(BG) | Bandgap reference voltage temperature coefficient | TA = TMIN to TMAX, I(BG) = ±100 µA |
0 | ppm/°C | |||
C(LOAD_BG) | Maximum bandgap reference output load capacitance | 80 | pF | ||||
TEMPERATURE DIODE CHARACTERISTICS | |||||||
V(TDIODE) | Temperature diode voltage slope | Offset voltage (approx. 0.77 V) varies with process and must be measured for each part. Offset measurement should be done with PowerDown=1 to minimize device self-heating. | 100-µA forward current Device active |
–1.6 | mV/°C | ||
100-µA forward current Device in power-down |
–1.6 | mV/°C | |||||
CLOCK INPUT CHARACTERISTICS (DEVCLK±, SYSREF±, SYNC~/TMST±) | |||||||
VID(CLK) | Differential clock input level | Sine wave clock, TA = TMIN to TMAX | 0.4 | 0.6 | 2 | VPP | |
Square wave clock, TA = TMIN to TMAX | 0.4 | 0.6 | 2 | VPP | |||
II(CLK) | Input current | VI = 0 or VI = VA | ±1 | µA | |||
CI(CLK) | Input capacitance(2) | Differential | 0.02 | pF | |||
Each input to ground | 1 | pF | |||||
RID(CLK) | Differential input resistance | TA = 25°C | 95 | Ω | |||
TA = TMIN to TMAX | 80 | 110 | Ω | ||||
CML OUTPUT CHARACTERISTICS (DS0–DS7±) | |||||||
VOD | Differential output voltage | Assumes ideal 100-Ω load Measured differentially Default pre-emphasis setting |
280 | 305 | 330 | mV peak | |
VO(ofs) | Output offset voltage | 0.6 | V | ||||
IOS | Output short-circuit current | Output+ and output– shorted together | ±6 | mA | |||
Output+ or output– shorted to 0 V | 12 | ||||||
ZOD | Differential output impedance | 100 | Ω | ||||
LVCMOS INPUT CHARACTERISTICS (SDI, SCLK, SCS, SYNC~) | |||||||
VIH | Logic high input voltage | See (6) | 0.83 | V | |||
VIL | Logic low input voltage | See (6) | 0.4 | V | |||
CI | Input capacitance(2)(7) | Each input to ground | 1 | pF | |||
LVCMOS OUTPUT CHARACTERISTICS (SDO, OR_T0, OR_T1) | |||||||
VOH | CMOS H level output | IOH = –400 µA(6) | 1.65 | 1.9 | V | ||
VOL | CMOS L level output | IOH = 400 µA(6) | 0.01 | 0.15 | V | ||
POWER SUPPLY CHARACTERISTICS | |||||||
I(VA19) | Analog 1.9-V supply current | PD = 0, calibration = FG, bypass DDC | 461 | 500 | mA | ||
PD = 0, calibration = BG, bypass DDC | 560 | 600 | |||||
PD = 0, calibration = BG, decimate by 8, DDR = 0, P54 = 1 | 560 | 607 | |||||
I(VA12) | Analog 1.2-V supply current | PD = 0, calibration = FG, bypass DDC | 320 | 385 | mA | ||
PD = 0, calibration = BG, bypass DDC | 364 | 420 | |||||
PD = 0, calibration = BG, decimate by 8, DDR = 0, P54 = 1 | 377 | 428 | |||||
I(VD12) | Digital 1.2-V supply current | PD = 0, calibration = FG, bypass DDC | 445 | 710 | mA | ||
PD = 0, calibration = BG, bypass DDC | 458 | 732 | |||||
PD = 0, calibration = BG, decimate by 8, DDR = 0, P54 = 1 | 541 | 826 | |||||
PC | Power consumption | PD = 0, calibration = FG, bypass DDC | 1.8 | 2.26 | W | ||
PD = 0, calibration = BG, bypass DDC | 2.05 | 2.52 | |||||
PD = 0, calibration = BG, decimate by 8, DDR = 0, P54 = 1 | 2.17 | 2.66 | |||||
PD = 1 | < 50 | mW |
MIN | NOM | MAX | UNIT | |||
---|---|---|---|---|---|---|
DEVICE (SAMPLING) CLOCK | ||||||
ƒ(DEVCLK) | Input DEVCLK frequency | Sampling rate is equal to clock input | 1 | 4 | GHz | |
td(A) | Sampling (aperture) delay | Input CLK transition to sampling instant | 0.64 | ns | ||
t(AJ) | Aperture jitter | 0.1 | ps RMS | |||
t(LAT) | ADC core latency(2) | Decimation = 1, DDR = 1, P54 = 0 | 64 | t(DEVCLK) | ||
t(LAT_DDC) | ADC core and DDC latency(2) | Decimation = 4, DDR = 1, P54 = 0 | 292 | t(DEVCLK) | ||
Decimation = 4, DDR = 1, P54 = 1 | 284 | |||||
Decimation = 8, DDR = 0, P54 = 0 | 384 | |||||
Decimation = 8, DDR = 0, P54 = 1 | 368 | |||||
Decimation = 8, DDR = 1, P54 = 0 | 392 | |||||
Decimation = 8, DDR = 1, P54 = 1 | 368 | |||||
Decimation = 10, DDR = 0, P54 = 0 | 386 | |||||
Decimation = 10, DDR = 1, P54 = 0 | 386 | |||||
Decimation = 16, DDR = 0, P54 = 0 | 608 | |||||
Decimation = 16, DDR = 0, P54 = 1 | 560 | |||||
Decimation = 16, DDR = 1, P54 = 0 | 608 | |||||
Decimation = 16, DDR = 1, P54 = 1 | 560 | |||||
Decimation = 20, DDR = 0, P54 = 0 | 568 | |||||
Decimation = 20, DDR = 1, P54 = 0 | 568 | |||||
Decimation = 32, DDR = 0, P54 = 0 | 1044 | |||||
Decimation = 32, DDR = 0, P54 = 1 | 948 | |||||
Decimation = 32, DDR = 1, P54 = 0 | 1044 | |||||
JESD204B INTERFACE LINK TIMING CHARACTERISTICS (REFER TO Figure 1) | ||||||
td(LMFC) | SYSREF to LMFC delay Functional delay between SYSREF assertion latched and LMFC frame boundary(2) |
All decimation modes | 40 | t(DEVCLK) | ||
td(TX) | LMFC to frame boundary delay - DDC bypass mode Functional delay from LMFC frame boundary to beginning of next multi-frame in transmitted data.(3) |
Decimation = 1, DDR = 1, P54 = 0 | 52.7 | t(DEVCLK) | ||
td(TX) | LMFC to frame boundary delay - decimation modes Functional delay from LMFC frame boundary to beginning of next multi-frame in transmitted data(3) |
Decimation = 4, DDR = 1, P54 = 0 | 52.7 | t(DEVCLK) | ||
Decimation = 4, DDR = 1, P54 = 1 | 43.9 | |||||
Decimation = 8, DDR = 0, P54 = 0 | 60.7 | |||||
Decimation = 8, DDR = 0, P54 = 1 | 51.5 | |||||
Decimation = 8, DDR = 1, P54 = 0 | 52.7 | |||||
Decimation = 8, DDR = 1, P54 = 1 | 43.9 | |||||
Decimation = 10, DDR = 0, P54 = 0 | 60.7 | |||||
Decimation = 10, DDR = 1, P54 = 0 | 52.7 | |||||
Decimation = 16, DDR = 0, P54 = 0 | 60.7 | |||||
Decimation = 16, DDR = 0, P54 = 1 | 51.5 | |||||
Decimation = 16, DDR = 1, P54 = 0 | 52.7 | |||||
Decimation = 16, DDR = 1, P54 = 1 | 43.9 | |||||
Decimation = 20, DDR = 0, P54 = 0 | 60.7 | |||||
Decimation = 20, DDR = 1, P54 = 0 | 52.7 | |||||
Decimation = 32, DDR = 0, P54 = 0 | 60.7 | |||||
Decimation = 32, DDR = 0, P54 = 1 | 51.5 | |||||
Decimation = 32, DDR = 1, P54 = 0 | 52.7 | |||||
tsu(SYNC~-F) | SYNC~ to LMFC setup time(1)
Required SYNC~ setup time relative to the internal LMFC boundary. |
40 | t(DEVCLK) | |||
th(SYNC~-F) | SYNC~ to LMFC hold time(1)
Required SYNC~ hold time relative to the internal LMFC boundary. |
–8 | ||||
t(SYNC~) | SYNC~ assertion time Required SYNC~ assertion time before deassertion to initiate a link resynchronization. |
4 | Frame clock cycles | |||
td(LMFC) | Delay from SYSREF sampled high by DEVCLK to internal LMFC boundary | 40 | t(DEVCLK) | |||
t(ILA) | Duration of initial lane alignment sequence | 4 | Multi-frame clock cycles | |||
SYSREF | ||||||
tsu(SYS) | Setup time SYSREF relative to DEVCLK rising edge(6) | 40 | ps | |||
th(SYS) | Hold time SYSREF relative to DEVCLK rising edge(6) | 40 | ps | |||
t(PH_SYS) | SYSREF assertion duration after rising edge event. | 8 | t(DEVCLK) | |||
t(PL_SYS) | SYSREF deassertion duration after falling edge event. | 8 | t(DEVCLK) | |||
t(SYS) | Period SYSREF± | DDR = 0, P54 = 0 | K × F × 10 | t(DEVCLK) | ||
DDR = 0, P54 = 1 | K × F × 8 | |||||
DDR = 1, P54 = 0 | K × F × 5 | |||||
DDR = 1, P54 = 1 | K × F × 4 | |||||
SERIAL INTERFACE (REFER TO Figure 2) | ||||||
ƒ(SCK) | Serial clock frequency(2) | 20 | MHz | |||
t(PH) | Serial clock high time | 20 | ns | |||
t(PL) | Serial clock low time | 20 | ns | |||
tsu | Serial-data to serial-clock rising setup time(2) | 10 | ns | |||
th | Serial-data to serial clock rising hold time(2) | 10 | ns | |||
t(CSS) | SCS-to-serial clock rising setup time | 10 | ns | |||
t(CSH) | SCS-to-serial clock falling hold time | 10 | ns | |||
t(IAG) | Inter-access gap | 10 | ns |
PARAMETER | TEST CONDITIONS | MIN | NOM | MAX | UNIT | |
---|---|---|---|---|---|---|
DEVICE (SAMPLING) CLOCK | ||||||
td(A) | Sampling (aperture) delay | Input CLK transition to sampling instant | 0.64 | ns | ||
t(AJ) | Aperture jitter | 0.1 | ps RMS | |||
t(LAT) | ADC core latency. See (2) | Decimation = 1, DDR = 1, P54 = 0 | 64 | t(DEVCLK) | ||
CALIBRATION TIMING CHARACTERISTICS (REFER TO THE CALIBRATION SECTION) | ||||||
t(CAL) | Calibration cycle time | Calibration = FG, T_AUTO=1 | 227 × 106 | t(DEVCLK) | ||
Calibration = FG, T_AUTO=0 | 102 × 106 | |||||
JESD204B INTERFACE LINK TIMING CHARACTERISTICS (REFER TO Figure 1) | ||||||
td(LMFC) | SYSREF to LMFC delay Functional delay between SYSREF assertion latched and LMFC frame boundary(2) |
All decimation modes | 40 | t(DEVCLK) | ||
td(TX) | LMFC to Frame Boundary delay - DDC Bypass Mode Functional delay from LMFC frame boundary to beginning of next multi-frame in transmitted data(3) |
Decimation = 1, DDR = 1, P54 = 0 | 52.7 | t(DEVCLK) | ||
td(TX) | LMFC to frame boundary delay - decimation modes Functional delay from LMFC frame boundary to beginning of next multi-frame in transmitted data(3) |
Decimation = 4, DDR = 1, P54 = 0 | 52.7 | t(DEVCLK) | ||
Decimation = 4, DDR = 1, P54 = 1 | 43.9 | |||||
Decimation = 8, DDR = 0, P54 = 0 | 60.7 | |||||
Decimation = 8, DDR = 0, P54 = 1 | 51.5 | |||||
Decimation = 8, DDR = 1, P54 = 0 | 52.7 | |||||
Decimation = 8, DDR = 1, P54 = 1 | 43.9 | |||||
Decimation = 10, DDR = 0, P54 = 0 | 60.7 | |||||
Decimation = 10, DDR = 1, P54 = 0 | 52.7 | |||||
Decimation = 16, DDR = 0, P54 = 0 | 60.7 | |||||
Decimation = 16, DDR = 0, P54 = 1 | 51.5 | |||||
Decimation = 16, DDR = 1, P54 = 0 | 52.7 | |||||
Decimation = 16, DDR = 1, P54 = 1 | 43.9 | |||||
Decimation = 20, DDR = 0, P54 = 0 | 60.7 | |||||
Decimation = 20, DDR = 1, P54 = 0 | 52.7 | |||||
Decimation = 32, DDR = 0, P54 = 0 | 60.7 | |||||
Decimation = 32, DDR = 0, P54 = 1 | 51.5 | |||||
Decimation = 32, DDR = 1, P54 = 0 | 52.7 | |||||
td(LMFC) | Delay from SYSREF sampled high by DEVCLK to internal LMFC boundary | 40 | t(DEVCLK) | |||
t(ILA) | Duration of initial lane alignment sequence | 4 | Multi-frame clock cycles |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
SERIAL DATA OUTPUTS | ||||||
Serialized output bit rate | 1 | 10 | Gbps | |||
Serialized output bit rate | DDR = 0, P54 = 0 | ƒS | ||||
DDR = 0, P54 = 1 | 1.25 × ƒS | |||||
DDR = 1, P54 = 0 | 2 × ƒS | |||||
DDR = 1, P54 = 1 | 2.5 × ƒS | |||||
tTLH | LH transition time — differential | 10% to 90%, 8 Gbps | 35 | ps | ||
tTHL | HL transition time — differential | 10% to 90%, 8 Gbps | 35 | ps | ||
UI | Unit interval | 8 Gbps serial rate | 125 | ps | ||
DDJ | Data dependent jitter | 8 Gbps serial rate | 11.3 | ps | ||
RJ | Random Jitter | 8 Gbps serial rate | 1.4 | ps | ||
SERIAL INTERFACE | ||||||
t(OZD) | SDO tri-state to driven | See Figure 2 | 5 | ns | ||
t(ODZ) | SDO driven to tri-state | 2.5 | 5 | ns | ||
t(OD) | SDO output delay | 20 | ns |
DDC bypass mode | Sampling rate = 4000 MSPS |
DDC bypass mode | FIN = 608 MHz |
DDC bypass mode | FIN = 608 MHz |
DDC bypass mode | FIN = 351 MHz |
DDC bypass mode | Sampling rate = 4000 MSPS |
FIN = 608 MHz |
DDC bypass mode | FIN = 608 MHz |
DDC bypass mode | FIN = 351 MHz |
DDC bypass mode | FIN = 608 MHz |
DDC bypass mode | FIN = 608 MHz |
DDC bypass mode | FIN = 351 MHz |
FIN = 608 MHz |
DDC bypass mode |
Foreground calibration mode |
DDC bypass mode | Foreground calibration mode |
Background calibration mode |
DDC bypass mode | FIN = 608 MHz |
DDC bypass mode | FIN = 2483 MHz |
DDC bypass mode | FIN = 608 MHz |
DDC bypass mode | Input frequency = 351 MHz |
DDC bypass mode | FIN = 608 MHz |
FIN = 2483 MHz |
DDC bypass mode | FIN = 608 MHz |
DDC bypass mode | Sampling rate = 4000 MSPS |
DDC bypass mode | FIN = 608 MHz |
DDC bypass mode | FIN = 351 MHz |
DDC bypass mode | FIN = 600 MHz |
DDC bypass mode |
DDC bypass mode | FIN = 608 MHz |
DDC bypass mode | Foreground calibration mode |
Foreground calibration mode |
The ADC12J4000 device is an ultra-wideband sampling and digital tuning subsystem. The device combines a very-wideband and high sampling-rate ADC front-end with a configurable digital-down conversion block. This combination provides the necessary features to facilitate the development of flexible software-defined radio products for a wide range of communications applications.
The ADC12J4000 device is based on an ultra high-speed ADC core. The core uses an interleaved calibrated folding and interpolating architecture that results in very high sampling rate, very good dynamic performance, and relatively low-power consumption. This ADC core is followed by a configurable DDC block which is implemented on a small geometry CMOS. The DDC block provides a range of decimation settings that allow the product to work in ultra-wideband, wideband, and more-narrow-band receive systems. The output data from the DDC block is transmitted through a JESD204B-compatible multi-lane serial-output system. This system minimizes the number of data pairs required to convey the output data to the downstream processing circuitry.
The analog input is sampled on the rising edge of CLK and the digital equivalent of that data is available in the serialized datastream t(LAT) or t(LAT_DDC) input clock cycles later.
The ADC12J4000 device converts as long as the input clock signal is present. The fully-differential comparator design and the innovative design of the sample-and-hold amplifier, together with calibration, enables very good performance at input frequencies beyond 3 GHz. The ADC12J4000 data is output on a high-speed serial JESD204B interface.
A differential input signal must be used to drive the ADC12J4000 device. Operation with a single-ended signal is not recommended as performance suffers. The input signals can be either be AC coupled or DC coupled. The analog inputs are internally connected to the VCMO bias voltage. When DC-coupled input signals are used, the common mode voltage of the applied signal must meet the device Input common mode requirements. See VCMI in the Recommended Operating Conditions table.
The full-scale input range for each converter can be adjusted through the serial interface. See the Full Scale Range Adjust section.
The buffered analog inputs simplify the task of driving these inputs and the RC pole that is generally used at sampling ADC inputs is not required. If an amplifier circuit before the ADC is desired, use care when selecting an amplifier with adequate noise and distortion performance and adequate gain at the frequencies used for the application. If gain is not required, a balun (balanced-to-unbalanced transformer) is generally used to provide single ended (SE) to differential conversion.
The input impedance of VIN± consists of two 50-Ω resistors in series between the inputs and a capacitance from each of these inputs to ground. A resistance of approximately 20 kΩ exists from the center point of the 50-Ω resistors to the on-chip VCMO providing self-biasing for AC-coupled applications.
Performance is good in both DC-coupled mode and AC coupled mode, provided the common-mode voltage at the analog input is within specifications.
The ADC12J4000 maximum DC input voltage is limited to the range 0 to 2 V to prevent damage to the device. To help maintain these limits, an active input clamping circuit is incorporated which sources or sinks input currents up to ±50 mA. The clamping circuit is enabled by default and is controlled via the Input_Clamp_EN bit (register 0x034, bit 5). The protection provided by this circuit is limited as follows:
With these limitations in mind, analysis has been done to determine the allowable input signal levels as a function of input frequency when the Input Clamp is enabled, assuming the source impedance matches the input impedance of the device (100-Ω differential). This information is incorporated in the Absolute Maximum Ratings table.
The easiest way to accomplish SE-to-differential conversion for AC-coupled signals is with an appropriate balun.
Figure 49 shows a generic depiction of a SE-to-differential signal conversion using a balun. The circuitry specific to the balun depends on the type of balun selected and the overall board layout. TI recommends that the system designer contact the manufacturer of the selected balun to aid in designing the best performing single-ended to differential conversion circuit using that particular balun.
When selecting a balun, understanding the input architecture of the ADC is important. Specific balun parameters must be considered. The balun must match the impedance of the analog source to the on-chip 100-Ω differential input termination of the ADC12J4000 device. The range of this input termination resistor is described in the Electrical Characteristics table as the specification RID.
Also, as a result of the ADC architecture, the phase and amplitude balance are important. The lowest possible phase and amplitude imbalance is desired when selecting a balun. The phase imbalance must be no more than ±2.5° and the amplitude imbalance must be limited to less than 1 dB at the desired input frequency range.
Finally, when selecting a balun, the voltage standing-wave ratio (VSWR), bandwidth, and insertion loss of the balun must also be considered. The VSWR aids in determining the overall transmission line termination capability of the balun when interfacing to the ADC input. The insertion loss must be considered so that the signal at the balun output is within the specified input range of the ADC as described in the Electrical Characteristics table as the specification VID.
Table 1 lists the recommended baluns for specific signal frequency ranges.
MINIMUM FREQUENCY (MHz) | MAXIMUM FREQUENCY (MHz) | IMPEDANCE RATIO | PART NUMBER | MANUFACTURER |
---|---|---|---|---|
4.5 | 3000 | 1:1 | TC1-1-13MA+ | Mini-Circuits |
400 | 3000 | 1:2 | B0430J50100AHF | Anaren |
30 | 1800 | 1:2 | ADTL2-18+ | Mini-Circuits |
10 | 4000 | 1:2 | TCM2-43X+ | Mini-Circuits |
When a DC-coupled signal source is used, the common mode voltage of the applied signal must be within a specified range (VCMI). To achieve this range, the common mode of the driver should be based on the VCMO output provided for this purpose.
Full-scale distortion performance degrades as the input common-mode voltage deviates from VCMO. Therefore, maintaining the input common-mode voltage within the VCMI range is important.
Table 2 lists the recommended amplifiers for DC-coupled usage or if AC-coupling with gain is required.
–3-dB BANDWIDTH (MHz) | MIN GAIN (dB) | MAX GAIN (dB) | GAIN TYPE | PART NUMBER |
---|---|---|---|---|
7000 | 16 | 16 | Fixed | LMH3401 |
2800 | 0 | 17 | Resistor set | LMH6554 |
2400 | 6 | 26 | Digital programmable | LMH6881 |
900 | –1.16 | 38.8 | Digital programmable | LMH6518 |
The ADC12J4000 device has no provision to adequately process single-ended input signals. The best way to handle single-ended signals is to convert these signals to balanced differential signals before presenting the signals to the ADC.
The ADC12J4000 device has a differential clock input, DEVCLK+ and DEVCLK–, that must be driven with an AC-coupled differential clock-signal. The clock inputs are internally terminated and biased. The input clock signal must be capacitively coupled to the clock pins as shown in Figure 50.
The differential sample-clock line pair must have a characteristic impedance of 100 Ω and must be terminated at the clock source of that 100-Ω characteristic impedance. The input clock line must be as short and direct as possible. The ADC12J4000 clock input is internally terminated with an untrimmed 100-Ω resistance.
Insufficient input clock levels results in poor dynamic performance. Excessively-high input-clock levels can cause a change in the analog-input offset voltage. To avoid these issues, maintain the input clock level within the range specified in the Electrical Characteristics table.
The low times and high times of the input clock signal can affect the performance of any ADC. The ADC12J4000 device features a duty-cycle clock-correction circuit which maintains performance over temperature. The ADC meets the performance specification when the input clock high times and low times are maintained as specified in the Electrical Characteristics table.
High-speed high-performance ADCs such as the ADC12J4000 device require a very-stable input clock-signal with minimum phase noise or jitter. ADC jitter requirements are defined by the ADC resolution or ENOB (effective number of bits), maximum ADC input frequency, and the input signal amplitude relative to the ADC input full-scale range. Use Equation 1 to calculate the maximum jitter (the sum of the jitter from all sources) allowed to prevent a jitter-induced reduction in SNR.
where
Note that the maximum jitter previously described is the root sum square (RSS) of the jitter from all sources, including that from the clock source, the jitter added by noise coupling at board level and that added internally by the ADC clock circuitry, in addition to any jitter added to the input signal. Because the effective jitter added by the ADC is beyond user control, the best option is to minimize the jitter from the clock source, the sum of the externally-added input clock jitter and the jitter added by any circuitry to the analog signal.
Input clock amplitudes above those specified in the Recommended Operating Conditions table can result in increased input-offset voltage. Increased input-offset voltage causes the converter to produce an output code other than the expected 2048 when both input pins are at the same potential.
To ensure that system-gain management has the quickest-possible response time, a low-latency configurable over-range function is included. The over-range function works by monitoring the raw 12-bit samples exiting the ADC module. The upper 8 bits of the magnitude of the ADC data are checked against two programmable thresholds, OVR_T0 and OVR_T1. The following table lists how a raw ADC value is converted to an absolute value for a comparison of the thresholds.
ADC SAMPLE (OFFSET BINARY) |
ADC SAMPLE (2's COMPLEMENT) |
ABSOLUTE VALUE | UPPER 8 BITS USED FOR COMPARISON |
---|---|---|---|
1111 1111 1111 (4095) | 0111 1111 1111 (+2047) | 111 1111 1111 (2047) | 1111 1111 (255) |
1111 1111 0000 (4080) | 0111 1111 0000 (+2032) | 111 1111 0000 (2032) | 1111 1110 (254) |
1000 0000 0000 (2048) | 0000 0000 0000 (0) | 000 0000 0000 (0) | 0000 0000 (0) |
0000 0001 0000 (16) | 1000 0001 0000 (-2032) | 111 1111 0000 (2032) | 1111 1110 (254) |
0000 0000 0000 (0) | 1000 0000 0000 (-2048) | 111 1111 1111 (2047) | 1111 1111 (255) |
If the upper 8 bits of the absolute value equal or exceed the OVR_T0 or OVR_T1 threshold during the monitoring period, then the over-range bit associated with the threshold is set to 1, otherwise the over-range bit is 0. The resulting over-range bits are embedded into the complex output data samples and output on OR_T0 and OR_T1. Table 3 lists the outputs, related data samples, threshold settings and the monitoring period equation.
EMBEDDED OVER-RANGE OUTPUTS | ASSOCIATED THRESHOLD | ASSOCIATED SAMPLES | MONITORING PERIOD (ADC SAMPLES) |
---|---|---|---|
OR_T0 | OVR_T0 | In-Phase (I) samples | 2OVR_N(1) |
OR_T1 | OVR_T1 | Quadrature (Q) samples |
OVR_N | MONITORING PERIOD |
---|---|
0 | 1 |
1 | 2 |
2 | 4 |
3 | 8 |
4 | 16 |
5 | 32 |
6 | 64 |
7 | 128 |
Typically, the OVR_T0 threshold can be set near the full-scale value (228 for example). When the threshold is triggered, a typical system can turn down the system gain to avoid clipping. The OVR_T1 threshold can be set much lower. For example, the OVR_T1 threshold can be set to 64 (−12 dBFS). If the input signal is strong, the OVR_T1 threshold is tripped occasionally. If the input is quite weak, the threshold is never tripped. The downstream logic device monitors the OVR_T1 bit. If OVR_T1 stays low for an extended period of time, then the system gain can be increased until the threshold is occasionally tripped (meaning the peak level of the signal is above −12 dBFS).
The OR_T0 threshold is embedded as the LSB along with the upper 15 bits of every complex I sample. The OR_T1 threshold is embedded as the LSB along with the upper 15 bits of every complex Q sample.
The reference voltage for the ADC12J4000 device is derived from an internal bandgap reference. A buffered version of the reference voltage is available at the VBG pin for user convenience. This output has an output-current capability of ±100 μA. The VBG output must be buffered if more current is required. No provision exists for the use of an external reference voltage, but the full-scale input voltage can be adjusted through the full-scale-range register settings.
The internal reference voltage is used to generate a stable common-mode voltage reference for the analog Inputs and the DEVCLK and SYSREF differential-clock inputs.
An external bias resistor, in combination with the on-chip voltage reference is used to provide an accurate and stable source of bias currents for internal circuitry. Using an external accurate resistor minimizes variation in device power consumption and performance.
The ADC input full-scale range can be adjusted through the GAIN_FS register setting (registers 0x022 and 0x023). The adjustment range is approximately 500 mVPP to 950 mVPP. The full-scale range adjustment is useful for matching the input-signal amplitude to the ADC full scale, or to match the full-scale range of multiple ADCs when developing a multi-converter system.
The ADC-input offset voltage can be adjusted through the OFFSET_FS register setting (registers 0x025 and 0x026). The adjustment range is approximately 28 mV to –28 mV differential.
NOTE
Offset adjust has no effect when background calibration mode is enabled.
The power-down bit (PD) allows the ADC12J4000 device to be entirely powered down. The serial data output drivers are disabled when PD is high. When the device returns to normal operation, the JESD204 link must be re-established, and the ADC pipeline and decimation filters contain meaningless information and must be flushed.
A built-in thermal monitoring diode junction is made available on the TDIODE+ and TDIODE– pins. This diode facilitates temperature monitoring and characterization of the device in higher ambient temperature environments. While the on-chip diode is not highly characterized, the diode can be used effectively by performing a baseline measurement at a known ambient or board temperature with the device in power-down (PD) mode. Recommended monitoring ICs include the LM95233 device and similar remote-diode temperature monitoring products from Texas Instruments.
The digitized data is the input to the digital down-converter block. This block provides frequency conversion and decimation filtering to allow a specific range of frequencies to be selected and output in the digital data stream.
The DDC contains a complex numerically-controlled oscillator and a complex mixer. The oscillator generates a complex exponential sequence shown in Equation 2.
The frequency (ω) is specified by the a 32-bit register setting. The complex exponential sequence is multiplied by the real input from the ADC to mix the desired carrier down to 0 Hz.
Within the DDC, eight different frequency and phase settings are always available for use. Each of the eight settings uses a different phase accumulator within the NCO. Because all eight phase accumulators are continuously running independently, rapid switching between different NCO frequencies is possible allowing rapid tuning of different signals.
The specific frequency-phase pair in use is selected through either the NCO_x input pins, or the NCO_SEL configuration bits (register 0x20D, bits 2:0). The CFG_MODE bit (register 0x20C, bit 0) is used to choose whether the input pins or selection bits are used. When the CFG_MODE bit is set to 0, the NCO_x input pins select the active NCO frequency and phase setting. When the CFG_MODE bit is set to 1, the NCO_SEL register settings select the active NCO frequency and phase setting.
The frequency for each phase accumulator is programmed independently through the NCO_FREQn (and optionally NCO_RDIV) settings. The phase offset for each accumulator is programmed independently through the NCO_PHASEn register settings.
When the CFG_MODE bit is set to 0, the state of these three inputs determines the active NCO frequency and phase accumulator settings.
When the CFG_MODE bit is set to 1, the state of these register bits determines the active NCO frequency and phase accumulator settings.
In basic NCO frequency-setting mode, the NCO frequency setting is set by the 32-bit register value, NCO_FREQn (n = preset 0 trough 7, see the NCO Frequency (Preset x) Register section).
NOTE
Changing the register setting after the JESD204B interface is running results in non-deterministic NCO phase. If deterministic phase is required, the JESD204B link must be re-initialized after changing the register setting. See the Multiple ADC Synchronization section.
In basic NCO frequency mode, the frequency step size is very small and many frequencies can be synthesized, but sometimes an application requires very specific frequencies that fall between two frequency steps. For example with ƒS equal to 2457.6 MHz and a desired ƒ(NCO) equal to 5.02 MHz the value for NCO_FREQ is 8773085.867. Truncating the fractional portion results in an ƒ(NCO) equal to 5.0199995 MHz, which is not the desired frequency.
To produce the desired frequency, the NCO_RDIV parameter is used to force the phase accumulator to arrive at specific frequencies without error. First, select a frequency step size (ƒ(STEP)) that is appropriate for the NCO frequency steps required. The typical value of ƒ(STEP) is 10 kHz. Next, program the NCO_RDIV value according to Equation 4.
The result of Equation 4 must be an integer value. If the value is not an integer, adjust either of the parameters until the result in an integer value.
For example, select a value of 1920 for NCO_RDIV.
NOTE
NCO_RDIV values larger than 8192 can degrade the NCO SFDR performance and are not recommended.
Now use Equation 5 to calculate the NCO_FREQ register value.
Alternatively, the following equations can be used:
ƒ(DEVCLK) (MHz) | NCO_RDIV |
---|---|
3686.4 | 2880 |
3072 | 2400 |
2949.12 | 2304 |
2457.6 | 1920 |
1966.08 | 1536 |
1474.56 | 1152 |
1228.8 | 960 |
The NCO phase-offset setting is set by the 16-bit register value NCO_PHASEn (n = preset 0 trough 7, see the NCO Phase (Preset x) Register section). The value is left-justified into a 32-bit field and then added to the phase accumulator.
Use Equation 8 to calculate the phase offset in radians.
NOTE
Changing the register setting after the JESD204B interface is running results in non-deterministic NCO phase. If deterministic phase is required, the JESD204B link must be re-initialized after changing the register setting. See Multiple ADC Synchronization.
The DDC Filter elements incorporate a programmable sample delay. The delay can be programmed from 0 to (decimation setting – 0.5) ADC sample periods. The delay step-size is 0.5 ADC sample periods. The delay settings are programmed through the DDC_DLYn parameter.
D (Decimation Setting) | Min Delay (t(DEVCLK)) | Max Delay (t(DEVCLK)) |
---|---|---|
4 | 0 | 3.5 |
8 | 0 | 7.5 |
10 | 0 | 9.5 |
16 | 0 | 15.5 |
20 | 0 | 19.5 |
32 | 0 | 31.5 |
The decimation filters are arranged to provide a programmable overall decimation of 4, 8, 10, 16, 20, or 32. The input and output of each filter is complex. The output data consists of 15-bit complex baseband information. Table 7 lists the effective output sample rates.
DECIMATION SETTING | COMPLEX SAMPLE OUTPUT RATE AND RESULTING BANDWIDTH (OUTPUT SAMPLE = 15-BIT I + 15-BIT Q + 2-BIT OR) |
|||||
---|---|---|---|---|---|---|
ƒ(DEVCLK) | ƒ(DEVCLK) = 4000 MHz | |||||
OUTPUT RATE (MSPS) | RAW OUTPUT BANDWIDTH (MHz) | ALIAS PROTECTED BANDWIDTH (MHz) | OUTPUT RATE (MSPS) | RAW OUTPUT BANDWIDTH (MHz) |
ALIAS PROTECTED BANDWIDTH (MHz) |
|
4 | ƒ(DEVCLK) / 4 | ƒ(DEVCLK) / 4 | 0.8 × ƒ(DEVCLK) / 4 | 1000 | 1000 | 800 |
8 | ƒ(DEVCLK) / 8 | ƒ(DEVCLK)N / 8 | 0.8 × ƒ(DEVCLK) / 8 | 500 | 500 | 400 |
10 | ƒ(DEVCLK) / 10 | ƒ(DEVCLK) / 10 | 0.8 × ƒ(DEVCLK) / 10 | 400 | 400 | 320 |
16 | ƒ(DEVCLK) / 16 | ƒ(DEVCLK) / 16 | 0.8 × ƒ(DEVCLK) / 16 | 250 | 250 | 200 |
20 | ƒ(DEVCLK) / 20 | ƒ(DEVCLK) / 20 | 0.8 × ƒ(DEVCLK) / 20 | 200 | 200 | 160 |
32 | ƒ(DEVCLK) / 32 | ƒ(DEVCLK) / 32 | 0.8 × ƒ(DEVCLK) / 32 | 125 | 125 | 100 |
For maximum efficiency a group of high speed filter blocks are implemented with specific blocks used for each decimation setting. The first table below describes the combination of filter blocks used for each decimation setting. The next table lists the coefficient details and decimation factor of each filter block.
Decimation Setting | Filter Blocks Used |
---|---|
4 | CS19, CS55 |
8 | CS11, CS15, CS55 |
10 | CS11, CS139 |
16 | CS7, CS11, CS15, CS55 |
20 | CS7, CS11, CS139 |
32 | CS7, CS7, CS11, CS15, CS55 |
Filter Coefficient Set (Decimation Factor of Filter) | |||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|
CS7 (2) | CS11 (2) | CS15 (2) | CS19 (2) | CS55 (2) | CS139 (5) | ||||||
–65 | –65 | 109 | 109 | –327 | –327 | 22 | 22 | –37 | –37 | –5 | –5 |
0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | –9 | –9 |
577 | 577 | –837 | –837 | 2231 | 2231 | –174 | –174 | 118 | 118 | –9 | –9 |
1024 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | –5 | –5 | |
4824 | 4824 | –8881 | –8881 | 744 | 744 | –291 | –291 | 0 | 0 | ||
8192 | 0 | 0 | 0 | 0 | 0 | 0 | 20 | 20 | |||
39742 | 39742 | –2429 | –2429 | 612 | 612 | 33 | 33 | ||||
65536 | 0 | 0 | 0 | 0 | 33 | 33 | |||||
10029 | 10029 | –1159 | –1159 | 21 | 21 | ||||||
16384 | 0 | 0 | 0 | 0 | |||||||
2031 | 2031 | –54 | –54 | ||||||||
0 | 0 | –88 | –88 | ||||||||
–3356 | –3356 | –89 | –89 | ||||||||
0 | 0 | –56 | –56 | ||||||||
5308 | 5308 | 0 | 0 | ||||||||
0 | 0 | 119 | 119 | ||||||||
–8140 | –8140 | 196 | 196 | ||||||||
0 | 0 | 199 | 199 | ||||||||
12284 | 12284 | 125 | 125 | ||||||||
0 | 0 | 0 | 0 | ||||||||
–18628 | –18628 | –234 | –234 | ||||||||
0 | 0 | –385 | –385 | ||||||||
29455 | 29455 | –393 | –393 | ||||||||
0 | 0 | –248 | –248 | ||||||||
–53191 | –53191 | 0 | 0 | ||||||||
0 | 0 | 422 | 422 | ||||||||
166059 | 166059 | 696 | 696 | ||||||||
262144 | 711 | 711 | |||||||||
450 | 450 | ||||||||||
0 | 0 | ||||||||||
–711 | –711 | ||||||||||
–1176 | –1176 | ||||||||||
–1206 | –1206 | ||||||||||
–766 | –766 | ||||||||||
0 | 0 | ||||||||||
1139 | 1139 | ||||||||||
1893 | 1893 | ||||||||||
1949 | 1949 | ||||||||||
1244 | 1244 | ||||||||||
0 | 0 | ||||||||||
–1760 | –1760 | ||||||||||
–2940 | –2940 | ||||||||||
–3044 | –3044 | ||||||||||
–1955 | –1955 | ||||||||||
0 | 0 | ||||||||||
2656 | 2656 | ||||||||||
4472 | 4472 | ||||||||||
4671 | 4671 | ||||||||||
3026 | 3026 | ||||||||||
0 | 0 | ||||||||||
–3993 | –3993 | ||||||||||
–6802 | –6802 | ||||||||||
–7196 | –7196 | ||||||||||
–4730 | –4730 | ||||||||||
0 | 0 | ||||||||||
6159 | 6159 | ||||||||||
10707 | 10707 | ||||||||||
11593 | 11593 | ||||||||||
7825 | 7825 | ||||||||||
0 | 0 | ||||||||||
–10423 | –10423 | ||||||||||
–18932 | –18932 | ||||||||||
–21629 | –21629 | ||||||||||
–15618 | –15618 | ||||||||||
0 | 0 | ||||||||||
24448 | 24448 | ||||||||||
52645 | 52645 | ||||||||||
78958 | 78958 | ||||||||||
97758 | 97758 | ||||||||||
104858 |
The DDC output data consist of 15-bit complex data plus the two over-range threshold-detection control bits. The following table lists the data format:
16-BIT OUTPUT WORD | ||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
CHANNEL | 15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 | 7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
I | DDC Output In-Phase (I) 15 bit | OR_T0 | ||||||||||||||
Q | DDC Output Quadrature (Q) 15 bit | OR_T1 |
The decimation setting is adjustable over the following settings:
NOTE
Because the output format is complex I+Q, the effective output bandwidth is approximately two-times the value for a real output with the same decimation factor.
The DDC gain boost (register 0x200, bit 4) provides additional gain through the DDC block. With a setting of 1 the final filter has 6.02-dB gain. With a setting of 0, the final filter has a 0-dB gain. This setting is recommended when the NCO is set near DC.
The data outputs (DSx±) are very high-speed differential outputs and conform to the JESD204B JEDEC standard. A CML (current-mode logic)-type output driver is used for each output pair. Output pre-emphasis is adjustable to compensate for longer PCB-trace lengths.
The ADC12J4000 output data is transmitted on up to eight high-speed serial-data lanes. The output data from the ADC or DDC is formatted to the eight lanes, 8b10b encoded, and serialized. Up to four different serial output rates are possible depending on the decimation mode setting: 1x, 1.25x, 2x, and 2.5x. In 1x mode, the output serializers run at the same bit rate as the frequency of the applied DEVCLK. In 1.25x mode, the output serializers run at a bit rate that is 1.25-times that of the applied DEVCLK, and so on. For example, for a 1.6-GHz input DEVCLK, the output rates are 1.6 Gbps in 1x mode, 2 Gbps in 1.25x mode, 3.2 Gbps in 2x mode and 4 Gbps in 2.5x mode.
Scrambling randomizes the 8b10b encoded data, spreading the frequency content of the data interface. This reduces the peak EMI energy at any given frequency reducing the possibility of feedback to the device inputs impacting performance. The scrambler is disabled by default and is enabled via SCR (register 0x201, bit 7).
The frames per multi-frame (K) setting can be adjusted within constraints that are dependant on the selected decimation (D) and serial rate (DDR) settings. The K-minus-1 (KM1) register setting (register 0x201, bits 6:2) must be one less than the desired K setting.
The serial rate can be either 1ƒ(CLK) (DDR = 0) or 2ƒ(CLK) (DDR = 1).
The JESD interface must be disabled (JESD_EN is set to 0) while any of the other JESD parameters are changed. While JESD_EN is set 0 the block is held in reset and the serializers are powered down. The clocks for this section are also gated off to further save power. When the parameters have been set as desired the JESD block can be enabled (JESD_EN is set to 1).
Several different JESD204B test modes are available to assist in link verification and debugging. The list of modes follows.
NOTE
PRBS test signals are output directly, without 8b10b encoding.
The high-speed serial-output drivers incorporate a configurable pre-emphasis feature. This feature allows the output drive waveform to be optimized for different PCB materials and signal transmission distances. The pre-emphasis setting is adjusted through the serializer pre-emphasis setting in register 0x040, bits 3 to 0. The default setting is 4d. Higher values will increase the pre-emphasis to compensate for more lossy PCB materials. This adjustment is best used in conjunction with an eye-diagram analysis capability in the receiver. The pre-emphasis setting should be adjusted to optimize the eye-opening for the hardware configuration and line rates needed.
Output data is generated by the DDC then formatted according to the selected decimation and output rate settings. When less than the maximum of eight lanes are active, lanes are disabled beginning with the highest numerical lanes. For example when only two lanes are active, lanes 0 and 1 are active, while all higher lanes are inactive.
PARAMETER | DESCRIPTION | USER CONFIGURED OR DERIVED | STANDARD JESD204B LINK PARAMETER |
---|---|---|---|
D | Decimation factor, determined by DMODE register | User | No |
DDR | Serial line rate: 1 = DDR rate (2x), 0 = SDR rate (1x) | User | No |
P54 | Enable 5/4 PLL to increase line rate by 1.25x. | User | No |
0 = no PLL (1x), 1 = enable PLL (1.25x) | |||
K | Number of frames per multiframe | User | Yes |
N | Bits per sample (before adding control bits and tails bits) | Derived | Yes |
CS | Control bits per sample | Derived | Yes |
N’ | Bits per sample (after adding control bits and tail bits). Must be a multiple of 4. | Derived | Yes |
L | Number of serial lanes | Derived | Yes |
F | Number of octets (bytes) per frame (per lane) | Derived | Yes |
M | Number of (logical) converters | Derived | Yes |
S | Number of samples per converter per frame | Derived | Yes |
CF | Number of control words per frame | Derived | Yes |
HD | 1=High density mode (samples may be broken across lanes), 0 = normal mode (samples may not be broken across lanes) | Derived | Yes |
KS | Legal adjustment step for K, to ensure that the multi-frame clock is a sub-harmonic of other internal clocks | Derived | No |
USER SPECIFIED PARAMETERS | DERIVED PARAMETERS | OTHER INFORMATION | ||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|
DECIMATION FACTOR (D) | DDR | P54 | N | CS | N’ | L | F | M | S | KS | LEGAL K RANGE | BIT RATE / ADC CLOCK(2) |
1 | 1 | 0 | 12 | 0 | 12 | 8 | 8 | 8 | 5 | 2 | 4-32 | 2x |
4 | 1 | 0 | 15 | 1 | 16 | 5 | 4 | 2 | 5 | 4 | 8-32 | 2x |
4 | 1 | 1 | 15 | 1 | 16 | 4 | 2 | 2 | 2 | 2 | 10-32 | 2.5x |
8 | 0 | 0 | 15 | 1 | 16 | 5 | 4 | 2 | 5 | 2 | 6-32 | 1x |
8 | 0 | 1 | 15 | 1 | 16 | 4 | 2 | 2 | 2 | 1 | 9-32 | 1.25x |
8 | 1 | 0 | 15 | 1 | 16 | 3 | 8 | 2 | 5 | 2 | 4-32 | 2x |
8 | 1 | 1 | 15 | 1 | 16 | 2 | 2 | 2 | 1 | 2 | 10-32 | 2.5x |
10 | 0 | 0 | 15 | 1 | 16 | 4 | 2 | 2 | 2 | 4 | 12-32 | 1x |
10 | 1 | 0 | 15 | 1 | 16 | 2 | 2 | 2 | 1 | 8 | 16-32 | 2x |
16 | 0 | 0 | 15 | 1 | 16 | 3 | 8 | 2 | 5 | 1 | 3-32 | 1x |
16 | 0 | 1 | 15 | 1 | 16 | 2 | 2 | 2 | 1 | 1 | 9-32 | 1.25x |
16 | 1 | 0 | 15 | 1 | 16 | 2 | 16 | 2 | 5 | 1 | 2-32 | 2x |
16 | 1 | 1 | 15 | 1 | 16 | 1 | 4 | 2 | 1 | 1 | 5-32 | 2.5x |
20 | 0 | 0 | 15 | 1 | 16 | 2 | 2 | 2 | 1 | 4 | 12-32 | 1x |
20 | 1 | 0 | 15 | 1 | 16 | 1 | 4 | 2 | 1 | 4 | 8-32 | 2x |
32 | 0 | 0 | 15 | 1 | 16 | 2 | 16 | 2 | 5 | 1 | 2-32 | 1x |
32 | 0 | 1 | 15 | 1 | 16 | 1 | 4 | 2 | 1 | 1 | 5-32 | 1.25x |
32 | 1 | 0 | 15 | 1 | 16 | 1 | 32 | 2 | 5 | 1 | 1-32 | 2x |
Output data is formatted in a specific optimized fashion for each decimation and DDR setting combination. For bypass mode (decimation = 1) the 12-bit offset binary values are mapped to the 8-bit characters. For the DDC mode the 16-bit values (15-bit complex data plus 1 bit OR_Tn) are mapped to the 8-bit characters. The following tables list the specific mapping formats. In all mappings the T or tail bits are 0 (zero).
TIME → | ||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
CHAR NUMBER | 0 | 1 | 2 | 3 | 4 | 5 | 6 | 7 | ||||||||
Lane 0 | C0S0 | C0S1 | C0S2 | C0S3 | C0S4 | T | ||||||||||
Lane 1 | C1S0 | C1S1 | C1S2 | C1S3 | C1S4 | T | ||||||||||
Lane 2 | C2S0 | C2S1 | C2S2 | C2S3 | C2S4 | T | ||||||||||
Lane 3 | C3S0 | C3S1 | C3S2 | C3S3 | C3S4 | T | ||||||||||
Lane 4 | C4S0 | C4S1 | C4S2 | C4S3 | C4S4 | T | ||||||||||
Lane 5 | C5S0 | C5S1 | C5S2 | C5S3 | C5S4 | T | ||||||||||
Lane 6 | C6S0 | C6S1 | C6S2 | C6S3 | C6S4 | T | ||||||||||
Lane 7 | C7S0 | C7S1 | C7S2 | C7S3 | C7S4 | T | ||||||||||
Frame n |
TIME → | ||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
CHAR NUMBER | 0 | 1 | 2 | 3 | 4 | 5 | 6 | 7 | ||||||||
Lane 0 | S0 | S8 | S16 | S24 | S32 | T | ||||||||||
Lane 1 | S1 | S9 | S17 | S25 | S33 | T | ||||||||||
Lane 2 | S2 | S10 | S18 | S26 | S34 | T | ||||||||||
Lane 3 | S3 | S11 | S19 | S27 | S35 | T | ||||||||||
Lane 4 | S4 | S12 | S20 | S28 | S36 | T | ||||||||||
Lane 5 | S5 | S13 | S21 | S29 | S37 | T | ||||||||||
Lane 6 | S6 | S14 | S22 | S30 | S38 | T | ||||||||||
Lane 7 | S7 | S15 | S23 | S31 | S39 | T | ||||||||||
Frame n |
TIME → | ||||
---|---|---|---|---|
CHAR NUMBER | 0 | 1 | 2 | 3 |
Lane 0 | I0 | I1 | ||
Lane 1 | I2 | I3 | ||
Lane 2 | I4 | Q0 | ||
Lane 3 | Q1 | Q2 | ||
Lane 4 | Q3 | Q4 | ||
Frame n |
TIME → | ||||||
---|---|---|---|---|---|---|
CHAR NUMBER | 0 | 1 | 2 | 3 | 4 | 5 |
Lane 0 | I0 | I2 | I4 | |||
Lane 1 | I1 | I3 | I5 | |||
Lane 2 | Q0 | Q2 | Q4 | |||
Lane 3 | Q1 | Q3 | Q5 | |||
Frame n |
Frame n + 1 |
Frame n + 2 |
TIME → | ||||
---|---|---|---|---|
CHAR NUMBER | 0 | 1 | 2 | 3 |
Lane 0 | I0 | I1 | ||
Lane 1 | I2 | I3 | ||
Lane 2 | I4 | Q0 | ||
Lane 3 | Q1 | Q2 | ||
Lane 4 | Q3 | Q4 | ||
Frame n |
TIME → | ||||||
---|---|---|---|---|---|---|
CHAR NUMBER | 0 | 1 | 2 | 3 | 4 | 5 |
Lane 0 | I0 | I2 | I4 | |||
Lane 1 | I1 | I3 | I5 | |||
Lane 2 | Q0 | Q2 | Q4 | |||
Lane 3 | Q1 | Q3 | Q5 | |||
Frame n |
Frame n + 1 |
Frame n + 2 |
TIME → | ||||||||
---|---|---|---|---|---|---|---|---|
CHAR NUMBER | 0 | 1 | 2 | 3 | 4 | 5 | 6 | 7 |
Lane 0 | I0 | I1 | I2 | I3 | ||||
Lane 1 | I4 | Q0 | Q1 | Q2 | ||||
Lane 2 | Q3 | Q4 | T | T | ||||
Frame n |
TIME → | ||||||
---|---|---|---|---|---|---|
CHAR NUMBER | 0 | 1 | 2 | 3 | 4 | 5 |
Lane 0 | I0 | I1 | I2 | |||
Lane 1 | Q0 | Q1 | Q2 | |||
Frame n |
Frame n + 1 |
Frame n + 2 |
TIME → | ||||||||
---|---|---|---|---|---|---|---|---|
CHAR NUMBER | 0 | 1 | 2 | 3 | 4 | 5 | 6 | 7 |
Lane 0 | I0 | I2 | I4 | I6 | ||||
Lane 1 | I1 | I3 | I5 | I7 | ||||
Lane 2 | Q0 | Q2 | Q4 | Q6 | ||||
Lane 3 | Q1 | Q3 | Q5 | Q7 | ||||
Frame n |
Frame n + 1 |
Frame n + 2 |
Frame n + 3 |
TIME → | ||||||||
---|---|---|---|---|---|---|---|---|
CHAR NUMBER | 0 | 1 | 2 | 3 | 4 | 5 | 6 | 7 |
Lane 0 | I0 | I1 | I2 | I3 | ||||
Lane 1 | Q0 | Q1 | Q2 | Q3 | ||||
Frame n |
Frame n + 1 |
Frame n + 2 |
Frame n+3 |
TIME → | ||||||||
---|---|---|---|---|---|---|---|---|
CHAR NUMBER | 0 | 1 | 2 | 3 | 4 | 5 | 6 | 7 |
Lane 0 | I0 | I1 | I2 | I3 | ||||
Lane 1 | I4 | Q0 | Q1 | Q2 | ||||
Lane 2 | Q3 | Q4 | T | T | ||||
Frame n |
TIME → | ||||||
---|---|---|---|---|---|---|
CHAR NUMBER | 0 | 1 | 2 | 3 | 4 | 5 |
Lane 0 | I0 | I1 | I2 | |||
Lane 1 | Q0 | Q1 | Q2 | |||
Frame n |
Frame n + 1 |
Frame n + 2 |
TIME → | ||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
CHAR NUMBER | 0 | 1 | 2 | 3 | 4 | 5 | 6 | 7 | 8 | 9 | 10 | 11 | 12 | 13 | 14 | 15 |
Lane 0 | I0 | I1 | I2 | I3 | I4 | Q0 | Q1 | Q2 | ||||||||
Lane 1 | Q3 | Q4 | T | T | T | T | T | T | ||||||||
Frame n |
TIME → | ||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|
CHAR NUMBER | 0 | 1 | 2 | 3 | 4 | 5 | 6 | 7 | 8 | 9 | 10 | 11 |
Lane 0 | I0 | Q0 | I1 | Q1 | I2 | Q2 | ||||||
Frame n | Frame n + 1 | Frame n + 2 |
TIME → | ||||||||
---|---|---|---|---|---|---|---|---|
CHAR NUMBER | 0 | 1 | 2 | 3 | 4 | 5 | 6 | 7 |
Lane 0 | I0 | I1 | I2 | I3 | ||||
Lane 1 | Q0 | Q1 | Q2 | Q3 | ||||
Frame n |
Frame n + 1 |
Frame n + 2 |
Frame n + 3 |
TIME → | ||||||||
---|---|---|---|---|---|---|---|---|
CHAR NUMBER | 0 | 1 | 2 | 3 | 4 | 5 | 6 | 7 |
Lane 0 | I0 | Q0 | I1 | Q1 | ||||
Frame n | Frame n + 1 |
TIME → | ||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
CHAR NUMBER | 0 | 1 | 2 | 3 | 4 | 5 | 6 | 7 | 8 | 9 | 10 | 11 | 12 | 13 | 14 | 15 |
Lane 0 | I0 | I1 | I2 | I3 | I4 | Q0 | Q1 | Q2 | ||||||||
Lane 1 | Q3 | Q4 | T | T | T | T | T | T | ||||||||
Frame n |
TIME → | ||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|
CHAR NUMBER | 0 | 1 | 2 | 3 | 4 | 5 | 6 | 7 | 8 | 9 | 10 | 11 |
Lane 0 | I0 | Q0 | I1 | Q1 | I2 | Q2 | ||||||
Frame n | Frame n + 1 | Frame n + 2 |
TIME → | ||||||||||||||||||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
CHAR NUMBER | 0 | 1 | 2 | 3 | 4 | 5 | 6 | 7 | 8 | 9 | 10 | 11 | 12 | 13 | 14 | 15 | 16 | 17 | 18 | 19 | 20 | 21 | 22 | 23 | 24 | 25 | 26 | 27 | 28 | 29 | 30 | 31 |
Lane 0 | I0 | I1 | I2 | I3 | I4 | Q0 | Q1 | Q2 | Q3 | Q4 | T | T | T | T | T | T | ||||||||||||||||
Frame n |
The formatted data is 8b10b encoded and output on the serial lanes. The 8b10b encoding provides a number of specific benefits, including:
The JESD204B standard defines methods for synchronization and deterministic latency in a multi-converter system. This device is a JESD204B Subclass 1 device and conforms to the various aspects of link operation as described in section 5.3.3 of the JESD204B standard. The specific signals used to achieve link operation are described briefly in the following sections.
The SYSREF is a periodic signal which is sampled by the device clock, and is used to align the boundary of the local multi-frame clock inside the data converter. SYSREF
is required to be a sub-harmonic of the LMFC internal timing. To meet this requirement, the timing of SYSREF is dependent on the device clock frequency and the LMFC frequency as determined by the selected DDC decimation and frames per multi-frame settings. This clock is typically in the range of 10 MHz to 300 MHz. See the Multiple ADC Synchronization section for more details on SYSREF timing requirements.
SYNC~ is asserted by the receiver to initiate a synchronization event.
Single ended and differential SYNC~ inputs are provided. The SYNC_DIFFSEL bit (register 0x202, bit 6) is used to select which input is used. Using the single ended SYNC~ input is recommended, as this frees the differential SYNC~/TMST input pair for use in the Time Stamp function. To assert SYNC~, a logic low is applied. To deassert SYNC~ a logic high is applied.
When configured through the TIME_STAMP_EN register setting (register 0x050, bit 5), the SYNC~ differential input (pins 22 and 23) can be used as a time-stamp input. The time-stamp feature enables the user to capture the timing of an external trigger event relative to the sampled signal. When enabled, the LSB of the 12-bit ADC digital output captures the trigger information. In effect, the 12-bit converter becomes an 11-bit converter and the LSB acts as a 1-bit converter with the same latency as the 11-bit converter. The trigger must be applied to the differential SYNC~/TMST inputs. The trigger can be asynchronous to the ADC sampling clock and is sampled at approximately the same time as the analog input.
Code-group synchronization is achieved using the following process:
The initial-lane alignment sequence transmitted by the ADC device is defined in additional detail in JESD204B section 5.3.3.5.
The second function for the SYSREF input is to facilitate the precise synchronization of multiple ADCs in a system.
One key challenge is to ensure that this synchronization works is to ensure that the SYSREF inputs are repeatedly captured by the input CLK. Two key elements must occur for the SYSREF inputs to be captured. First, the SYSREF input must be created so that it is synchronous to the input DEVCLK, be an integer sub-harmonic of the multi-frame (K × t(FRAME)) and a repeatable and fixed-phase offset. When this constraint is achieved, repeatedly capturing SYSREF is easier. To further ease this task, the SYSREF signal is routed through a user-adjustable delay which eases the timing requirements with respect to the input DEVCLK signal. The SYSREF delay RDEL is adjusted through bits 3 through 0 in register 0x032.
As long as the SYSREF signal has a fixed timing relationship to DEVCLK, the internal delay can be used to maximize the setup and hold times between the internally delayed SYSREF and the internal DEVCLK signal. These timing relationships are listed in the Timing Requirements table. To find the proper delay setting, the RDEL value is adjusted from minimum to maximum while applying SYSREF and monitoring the SysRefDet and Dirty Capture detect bits. The SysRefDet bit is set whenever a rising edge of SYSREF is detected. The Dirty Capture bit is set whenever the setup or hold time between DEVCLK and the delayed SYSREF is insufficient. The SysRefDetClr bit is used to clear the SysRefDet bit. The Clear Dirty Capture bit is used to clear that bit.
This procedure should be followed to determine the range of delay settings where a clean SYSREF capture is achieved. The delay value at the center of the clean capture range must be loaded as the final RDEL setting. Table 31 lists a summary of the control bits that are used and the monitor bits that are read.
BIT NAME | REGISTER ADDRESS | REGISTER BIT | FUNCTION |
---|---|---|---|
RDEL | 0x032 | 3:0 | Adjust relative delay between DEVCLK and SYSREF |
SysRefDet | 0x031 | 7 | Detect if a SYSREF rising edge has been captured (not self clearing) |
Dirty Capture | 0x031 | 6 | Detect if SYSREF rising edge capture failed setup/hold (not self clearing) |
SysRefDetClr | 0x030 | 5 | Clear SYSREF detection bit |
Clear Dirty Capture | 0x030 | 4 | Clear Dirty Capture detection bit |
SysRef_Rcvr_En | 0x030 | 7 | Enable SYSREF receiver. See the CLKGEN_0 descriptions in the Clock Generator Control 0 Register section for more information. |
SysRef_Pr_En | 0x030 | 6 | Enable SYSREF processing. See the CLKGEN_0 descriptions in the Clock Generator Control 0 Register section for more information. |
One final aspect of multi-device synchronization relates to phase alignment of the NCO phase accumulators when DDC modes are enabled. The NCO phase accumulators are reset during the ILA phase of link startup which means that for multiple ADCs to have NCO phase alignment, all links must be enabled in the same LMFC period. Enabling all links in the same LMFC period requires synchronizing the SYNC~ de-assertion across all data receivers in the system, so that all of the SYNC~ signals are released during the same LMFC period. Using large K values and resulting longer LMFC periods will ease this task, at the expense of potentially higher latency in the receiving device.
In DDC bypass mode (decimation = 1) the raw 12 bit data from the ADC is output at the full sampling rate.
In the DDC modes (decimation > 1) complex (I,Q) data is output at a lower sample rate as determined by the decimation factor (4, 8, 10, 16, 20, and 32).
Calibration adjusts the ADC core to optimize the following device parameters:
All calibration processes occur internally. Calibration does not require any external signals to be present and works properly as long as the device is maintained within the values listed in the Recommended Operating Conditions table.
In foreground mode the calibration process interrupts normal ADC operation and no output data is available during this time (the output code is forced to a static value). The calibration process should be repeated if the device temperature changes by more than 20ºC to ensure rated performance is maintained. Foreground calibration is initiated by setting the CAL_SFT bit (register 0x050, bit 3) which is self clearing. The foreground calibration process finishes within t(CAL) number of DEVCLK cycles. The process occurs somewhat longer when the timing calibration mode is enabled.
NOTE
Initiating a foreground calibration asynchronously resets the calibration control logic and may glitch internal device clocks. Therefore after setting the CAL_SFT bit clearing and then setting JESD_EN is necessary. If resetting the JESD204B link is undesirable for system reasons, background calibration mode may be preferred.
In background mode an additional ADC core is powered-up for a total of 5 ADC cores. At any given time, one core is off-line and not used for data conversion. This core is calibrated in the background and then placed on-line simultaneous with another core going off-line for calibration. This process operates continuously without interrupting data flow in the application and ensures that all cores are optimized in performance regardless of any changes of temperature. The background calibration cycle rate is fixed and is not adjustable by the user.
Because of the additional circuitry active in background calibration mode, a slight degradation in performance occurs in comparison to foreground calibration mode at a fixed temperature. As a result of this degradation, using foreground calibration mode is recommended if the expected change in operating temperature is <30°C. Using background calibration mode is recommended if the expected change in operating temperature is >30°C. The exact difference in performance is dependent on the DEVCLK (sampling clock) frequency, and the analog input signal frequency and amplitude. For this reason, device and system performance should be evaluated using both calibration modes before finalizing the choice of calibration mode.
To enable the background calibration feature, set the CAL_BCK bit (register 0x057, bit 0) and the CAL_CONT bit (register 0x057, bit 1). The value written to the register 0x057 to enable background calibration is therefore 0x013h. After writing this value to register 0x057, set the CAL_SFT bit in register 0x050 to perform the one-time foreground calibration to begin the process.
NOTE
The ADC offset-adjust feature has no effect when background calibration mode is enabled.
The timing calibration process optimizes the matching of sample timing for the 4 internally interleaved converters. This process minimize the presence of any timing related interleaving spurs in the captured spectrum. The timing calibration feature is disabled by default, but using this feature is highly recommended. To enable timing calibration, set the T_AUTO bit (register 0x066, bit 0). When this bit is set, the timing calibration performs each time the CAL_SFT bit is set.
CAL_CONT, CAL_BCK | T_AUTO | LOW_SIG_EN | INITIAL ONE-TIME CALIBRATION CAL_SFT 0 → 1 (tDEVCLK) |
BACKGROUND CALIBRATION CYCLE(1)
(ALL CORES) (tDEVCLK) |
---|---|---|---|---|
0 | 0 | 0 | 102 E+6 | N/A |
0 | 0 | 1 | 64 E+6 | N/A |
0 | 1 | 0 | 227 E+6 | N/A |
0 | 1 | 1 | 189 E+6 | N/A |
1 | 0 | 0 | 127.5 E+6 | 816 E+6 |
1 | 0 | 1 | 80 E+6 | 512 E+6 |
1 | 1 | 0 | 283.75 E+6 | 816 E+6 |
1 | 1 | 1 | 236.25 E+6 | 512 E+6 |
A number of device test modes are available. These modes insert known patterns of information into the device data path for assistance with system debug, development, or characterization.
The 12-bit ADC core has a built-in test-pattern generator. This mode is helpful for verifying the full data link from the ADC to the data receiver when in DDC bypass mode. When the test-pattern mode is enabled, the ADC output data is replaced by a pattern that repeats every two frames. The data sequence is is shown in Table 33 (shown for default settings with foreground calibration mode).
LANE (CONVERTER ID) | SAMPLE NUMBER (SID) | ||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|
0 | 1 | 2 | 3 | 4 | 5 | 6 | 7 | 8 | 9 | ||
0 | 0x000 | 0xFFF | 0x000 | 0xFFF | 0x000 | 0xFFF | 0x000 | 0xFFF | 0x000 | 0xFFF | |
1 | 0x008 | 0xFF7 | 0x008 | 0xFF7 | 0x008 | 0xFF7 | 0x008 | 0xFF7 | 0x008 | 0xFF7 | |
2 | 0x010 | 0xFEF | 0x010 | 0xFEF | 0x010 | 0xFEF | 0x010 | 0xFEF | 0x010 | 0xFEF | |
3 | 0x020 | 0xFDF | 0x020 | 0xFDF | 0x020 | 0xFDF | 0x020 | 0xFDF | 0x020 | 0xFDF | |
4 | 0x040 | 0xFBF | 0x040 | 0xFBF | 0x040 | 0xFBF | 0x040 | 0xFBF | 0x040 | 0xFBF | |
5 | 0x100 | 0xEFF | 0x100 | 0xEFF | 0x100 | 0xEFF | 0x100 | 0xEFF | 0x100 | 0xEFF | |
6 | 0x200 | 0xDFF | 0x200 | 0xDFF | 0x200 | 0xDFF | 0x200 | 0xDFF | 0x200 | 0xDFF | |
7 | 0x400 | 0xBFF | 0x400 | 0xBFF | 0x400 | 0xBFF | 0x400 | 0xBFF | 0x400 | 0xBFF |
BANK | LOCATION | LOW VALUE | HIGH VALUE |
---|---|---|---|
0 | Lane n | 0x000 | 0xFFF |
Lane n+4 | 0x040 | 0xFBF | |
1 | Lane n | 0x004 | 0xFFE |
Lane n+4 | 0x080 | 0xF7F | |
2 | Lane n | 0x008 | 0xFF7 |
Lane n+4 | 0x100 | 0xEFF | |
3 | Lane n | 0x010 | 0xFEF |
Lane n+4 | 0x200 | 0xDFF | |
4 | Lane n | 0x020 | 0xFDF |
Lane n+4 | 0x400 | 0xBFF |
Test modes are enabled by setting the appropriate configuration of the JESD204B_TEST setting (Register 0x202, Bits 3:0). Each test mode is described in detail in the following sections. Regardless of the test mode, the serializer outputs are powered up based on the configuration decimation and DDR settings. The test modes should only be enabled while the JESD204B link is disabled.
The PRBS test modes bypass the 8B10B encoder. These test modes produce pseudo-random bit streams that comply with the ITU-T O.150 specification. These bit streams are used with lab test equipment that can self-synchronize to the bit pattern and therefore the initial phase of the pattern is not defined.
The sequences are defined by a recursive equation. For example, the PRBS7 sequence is defined as shown in Equation 9.
where
PRBS TEST MODE | SEQUENCE | SEQUENCE LENGTH (bits) |
---|---|---|
PRBS7 | y[n] = y[n – 6]y[n – 7] | 127 |
PRBS15 | y[n] = y[n – 14]y[n – 15] | 32767 |
PRBS23 | y[n] = y[n – 18]y[n – 23] | 8388607 |
The initial phase of the pattern is unique for each lane.
In the ramp test mode, the JESD204B link layer operates normally, but the transport layer is disabled and the input from the formatter is ignored. After the ILA sequence, each lane transmits an identical octet stream that increments from 0x00 to 0xFF and repeats.
The short-transport test mode is available when the device is operated in DDC bypass mode (decimation = 1). The short transport pattern has a length of one frame. Table 36 lists the formula followed by each sample of the pattern.
BIT | |||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|
11 | 10 | 9 | 8 | 7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
~LID | LID | SID+1 |
LID is the lane ID (0 to 7) and SID is the sample number within the frame (0 to 4). The entire pattern has a length of one frame and is listed in Table 37.
LANE (CONVERTER ID) | SAMPLE NUMBER (SID) | |||||
---|---|---|---|---|---|---|
0 | 1 | 2 | 3 | 4 | ||
0 | 0xF01 | 0xF02 | 0xF03 | 0xF04 | 0xF05 | |
1 | 0xE11 | 0xE12 | 0xE13 | 0xE14 | 0xE15 | |
2 | 0xD21 | 0xD22 | 0xD23 | 0xD24 | 0xD25 | |
3 | 0xC31 | 0xC32 | 0xC33 | 0xC34 | 0xC35 | |
4 | 0xB41 | 0xB42 | 0xB43 | 0xB44 | 0xB45 | |
5 | 0xA51 | 0xA52 | 0xA53 | 0xA54 | 0xA55 | |
6 | 0x961 | 0x962 | 0x963 | 0x964 | 0x965 | |
7 | 0x871 | 0x872 | 0x873 | 0x874 | 0x875 |
The long-transport test mode is available in all DDC modes (decimation > 1). Patterns are generated in accordance with the JESD204B standard and are different for each output format.
Table 38 lists one example of the long transport test pattern:
TIME → | ||||||||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
CHAR NO. | 0 | 1 | 2 | 3 | 4 | 5 | 6 | 7 | 8 | 9 | 10 | 11 | 12 | 13 | 14 | 15 | 16 | 17 | 18 | 19 | 20 | 21 |
Lane 0 | 0x0003 | 0x0002 | 0x8000 | 0x8000 | 0x8000 | 0x8000 | 0x8000 | 0x8000 | 0x8000 | 0x8000 | 0x0003 | |||||||||||
Lane 1 | 0x0002 | 0x0005 | 0x8000 | 0x8000 | 0x8000 | 0x8000 | 0x8000 | 0x8000 | 0x8000 | 0x8000 | 0x0002 | |||||||||||
Lane 2 | 0x0004 | 0x0002 | 0x8001 | 0x8000 | 0x8000 | 0x8000 | 0x8000 | 0x8000 | 0x8000 | 0x8000 | 0x0004 | |||||||||||
Lane 3 | 0x0004 | 0x0004 | 0x8000 | 0x8001 | 0x8000 | 0x8000 | 0x8000 | 0x8000 | 0x8000 | 0x8000 | 0x0004 | |||||||||||
Frame n |
Frame n + 1 |
Frame n + 2 |
Frame n + 3 |
Frame n + 4 |
Frame n + 5 |
Frame n + 6 |
Frame n + 7 |
Frame n + 8 |
Frame n + 9 |
Frame n + 10 |
If multiple devices are all programmed to the transport layer test mode (while JESD_EN = 0), then JESD_EN is set to 1, and then SYSREF is used to align the LMFC of the devices, the patterns will be aligned to the SYSREF event (within the skew budget of JESD204B). For more details see JESD204B, section 5.1.6.3.
In this test mode, the controller transmits a continuous stream of D21.5 characters (alternating 0s and 1s).
In this test mode, the controller transmits a continuous stream of K28.5 characters.
In this test mode, the JESD204B link layer operates normally with one exception: when the ILA sequence completes, the sequence repeats indefinitely. Whenever the receiver issues a synchronization request, the transmitter will initiate code group synchronization. Upon completion of code group synchronization, the transmitter will repeatedly transmit the ILA sequence. If there is no active code group synchronization request at the moment the transmitter enters the test mode, the transmitter will behave as if it received one.
A 12-octet repeating pattern is defined in INCITS TR-35-2004. The purpose of this pattern is to generate white spectral content for JESD204B compliance and jitter testing. Table 39 lists the pattern before and after 8b10b encoding.
OCTET NUMBER | Dx.y NOTATION | 8-BIT INPUT TO 8b10b ENCODER | 20b OUTPUT OF 8b10b ENCODER (2 CHARACTERS) |
---|---|---|---|
0 | D30.5 | 0xBE | 0x86BA6 |
1 | D23.6 | 0xD7 | |
2 | D3.1 | 0x23 | 0xC6475 |
3 | D7.2 | 0x47 | |
4 | D11.3 | 0x6B | 0xD0E8D |
5 | D15.4 | 0x8F | |
6 | D19.5 | 0xB3 | 0xCA8B4 |
7 | D20.0 | 0x14 | |
8 | D30.2 | 0x5E | 0x7949E |
9 | D27.7 | 0xFB | |
10 | D21.1 | 0x35 | 0xAA665 |
11 | D25.2 | 0x59 |
The serial interface is accessed using the following four pins: serial clock (SCLK), serial-data in (SDI), serial-data out (SDO), and serial-interface chip-select (SCS). Registers access is enabled through the SCS pin.
Each register access consists of 24 bits, as shown in Figure 2. The first bit is high for a read and low for a write.
The next 15 bits are the address of the register that is to be written to. During write operations, the last 8 bits are the data written to the addressed register. During read operations, the last 8 bits on SDI are ignored, and, during this time, the SDO outputs the data from the addressed register. The serial protocol details are illustrated in Figure 52.
The serial interface supports streaming reads and writes. In this mode, the initial 24 bits of the transaction specifics the access type, register address, and data value as normal. Additional clock cycles of write or read data are immediately transferred, as long as the SCS input is maintained in the asserted (logic low) state. The register address auto increments (default) or decrements for each subsequent 8 bit transfer of the streaming transaction. The ADDR_ASC bit (register 000h, bits 5 and 2) controls whether the address value ascends (increments) or descends (decrements). Streaming mode can be disabled by setting the ADDR_STATIC bit (register 010h, bit 0). The streaming mode transaction details are shown in Figure 53.
See the Register Map section for detailed information regarding the registers.
NOTE
The serial interface must not be accessed during calibration of the ADC. Accessing the serial interface during this time impairs the performance of the device until the device is calibrated correctly. Writing or reading the serial registers also reduces dynamic performance of the ADC for the duration of the register access time.
Several groups of registers provide control and configuration options for this device. Each following register description also shows the power-on reset (POR) state of each control bit.
NOTE
All multi-byte registers are arranged in little-endian format (the least-significant byte is stored at the lowest address) unless explicitly stated otherwise.
Address | Reset | Type | Register |
---|---|---|---|
Standard SPI-3.0 (0x000 to 0x00F) | |||
0x000 | 0x3C | R/W | Configuration A Register |
0x001 | 0x00 | R | Configuration B Register |
0x002 | 0x00 | R/W | Device Configuration Register |
0x003 | 0x03 | R | Chip Type Register |
0x004-0x005 | Undefined | R | RESERVED |
0x006 | 0x13 | R | Chip Version Register |
0x007-0x00B | Undefined | R | RESERVED |
0x00C-0x00D | 0x0451 | R | Vendor Identification Register |
0x00E-0x00F | Undefined | R | RESERVED |
User SPI Configuration (0x010 to 0x01F) | |||
0x010 | 0x00 | R/W | User SPI Configuration Register |
0x011-0x01F | Undefined | R | RESERVED |
General Analog, Bias, Band Gap, and Track and Hold (0x020 to 0x02F) | |||
0x020 | 0x9D | R/W | RESERVED |
0x021 | 0x00 | R/W | Power-On Reset Register |
0x022 | 0x40 | R/W | I/O Gain 0 Register |
0x023 | 0x00 | R/W | I/O Gain 1 Register |
0x024 | 0x00 | R/W | RESERVED |
0x025 | 0x40 | R/W | I/O Offset 0 Register |
0x026 | 0x00 | R/W | I/O Offset 1 Register |
0x027 | 0x06 | R/W | RESERVED |
0x028 | 0xBA | R/W | RESERVED |
0x029 | 0xD4 | R/W | RESERVED |
0x02A | 0xEA | R/W | RESERVED |
0x02B-0x02F | Undefined | R | RESERVED |
Clock (0x030 to 0x03F) | |||
0x030 | 0xC0 | R/W | Clock Generator Control 0 Register |
0x031 | 0x07 | R | Clock Generator Status Register |
0x032 | 0x80 | R/W | Clock Generator Control 2 Register |
0x033 | 0xC3 | R/W | Analog Miscellaneous Register |
0x034 | 0x2F | R/W | Input Clamp Enable Register |
0x035 | 0xDF | R/W | RESERVED |
0x036 | 0x00 | R/W | RESERVED |
0x037 | 0x45 | R/W | RESERVED |
0x038-0x03F | Undefined | R/W | RESERVED |
Serializer (0x040 to 0x04F) | |||
0x040 | 0x04 | R/W | Serializer Configuration Register |
0x041-0x04F | Undefined | R | RESERVED |
ADC Calibration (0x050 to 0x1FF) | |||
0x050 | 0x06 | R/W | Calibration Configuration 0 Register |
0x051 | 0xF4 | R/W | Calibration Configuration 1 Register |
0x052 | 0x00 | R/W | RESERVED |
0x053 | 0x5C | R/W | RESERVED |
0x054 | 0x1C | R/W | RESERVED |
0x055 | 0x92 | R/W | RESERVED |
0x056 | 0x20 | R/W | RESERVED |
0x057 | 0x10 | R/W | Calibration Background Control Register |
0x058 | 0x00 | R/W | ADC Pattern and Over-Range Enable Register |
0x059 | 0x00 | R/W | RESERVED |
0x05A | 0x00 | R/W | Calibration Vectors Register |
0x05B | Undefined | R | Calibration Status Register |
0x05C | 0x00 | R/W | RESERVED |
0x05D-0x05E | Undefined | R/W | RESERVED |
0x05F | 0x00 | R/W | RESERVED |
0x060 | Undefined | R | RESERVED |
0x061 | Undefined | R | RESERVED |
0x062 | Undefined | R | RESERVED |
0x063 | Undefined | R | RESERVED |
0x064 | Undefined | R | RESERVED |
0x065 | Undefined | R | RESERVED |
0x066 | 0x02 | R/W | Timing Calibration Register |
0x067 | 0x01 | R/W | RESERVED |
0x068 | Undefined | R | RESERVED |
0x069 | Undefined | R | RESERVED |
0x06A | 0x00 | R/W | RESERVED |
0x06B | 0x20 | R/W | RESERVED |
0x06C-0x1FF | Undefined | R | RESERVED |
Digital Down Converter and JESD204B (0x200-0x27F) | |||
0x200 | 0x10 | R/W | Digital Down-Converter (DDC) Control |
0x201 | 0x0F | R/W | JESD204B Control 1 |
0x202 | 0x00 | R/W | JESD204B Control 2 |
0x203 | 0x00 | R/W | JESD204B Device ID (DID) |
0x204 | 0x00 | R/W | JESD204B Control 3 |
0x205 | Undefined | R/W | JESD204B and System Status Register |
0x206 | 0xF2 | R/W | Overrange Threshold 0 |
0x207 | 0xAB | R/W | Overrange Threshold 1 |
0x208 | 0x00 | R/W | Overrange Period |
0x209-0x20B | 0x00 | R/W | RESERVED |
0x20C | 0x00 | R/W | DDC Configuration Preset Mode |
0x20D | 0x00 | R/W | DDC Configuration Preset Select |
0x20E-0x20F | 0x0000 | R/W | Rational NCO Reference Divisor |
PRESET 0 | |||
0x210-0x213 | 0xC0000000 | R/W | NCO Frequency (Preset 0) |
0x214-0x215 | 0x0000 | R/W | NCO Phase (Preset 0) |
0x216 | 0xFF | R/W | DDC Delay (Preset 0) |
0x217 | 0x00 | R/W | RESERVED |
PRESET 1 | |||
0x218-0x21B | 0xC0000000 | R/W | NCO Frequency (Preset 1) |
0x21C-0x21D | 0x0000 | R/W | NCO Phase (Preset 1) |
0x21E | 0xFF | R/W | DDC Delay (Preset 1) |
0x21F | 0x00 | R/W | RESERVED |
PRESET 2 | |||
0x220-0x223 | 0xC0000000 | R/W | NCO Frequency (Preset 2) |
0x224-0x225 | 0x0000 | R/W | NCO Phase (Preset 2) |
0x226 | 0xFF | R/W | DDC Delay (Preset 2) |
0x227 | 0x00 | R/W | RESERVED |
PRESET 3 | |||
0x228-0x22B | 0xC0000000 | R/W | NCO Frequency (Preset 3) |
0x22C-0x22D | 0x0000 | R/W | NCO Phase (Preset 3) |
0x22E | 0xFF | R/W | DDC Delay (Preset 3) |
0x22F | 0x00 | R/W | RESERVED |
PRESET 4 | |||
0x230-0x233 | 0xC0000000 | R/W | NCO Frequency (Preset 4) |
0x234-0x235 | 0x0000 | R/W | NCO Phase (Preset 4) |
0x236 | 0xFF | R/W | DDC Delay (Preset 4) |
0x237 | 0x00 | R/W | RESERVED |
PRESET 5 | |||
0x238-0x23B | 0xC0000000 | R/W | NCO Frequency (Preset 5) |
0x23C-0x23D | 0x0000 | R/W | NCO Phase (Preset 5) |
0x23E | 0xFF | R/W | DDC Delay (Preset 5) |
0x23F | 0x00 | R/W | RESERVED |
PRESET 6 | |||
0x240-0x243 | 0xC0000000 | R/W | NCO Frequency (Preset 6) |
0x244-0x245 | 0x0000 | R/W | NCO Phase (Preset 6) |
0x246 | 0xFF | R/W | DDC Delay (Preset 6) |
0x247 | 0x00 | R/W | RESERVED |
PRESET 7 | |||
0x248-0x24B | 0xC0000000 | R/W | NCO Frequency (Preset 7) |
0x24C-0x24D | 0x0000 | R/W | NCO Phase (Preset 7) |
0x24E | 0xFF | R/W | DDC Delay (Preset 7) |
0x24F-0x251 | 0x00 | R/W | RESERVED |
0x252-0x27F | Undefined | R | RESERVED |
Reserved | |||
0x0280-0x7FFF | Undefined | R | RESERVED |
Address | Reset | Acronym | Register Name | Section |
---|---|---|---|---|
0x000 | 0x3C | CFGA | Configuration A Register | Go |
0x001 | 0x00 | CFGB | Configuration B Register | Go |
0x002 | 0x00 | DEVCFG | Device Configuration Register | Go |
0x003 | 0x03 | CHIP_TYPE | Chip Type Register | Go |
0x004-0x005 | 0x0000 | RESERVED | RESERVED | |
0x006 | 0x13 | CHIP_VERSION | Chip Version Register | Go |
0x007-0x00B | Undefined | RESERVED | RESERVED | |
0x00C-0x00D | 0x0451 | VENDOR_ID | Vendor Identification Register | Go |
0x00E-0x00F | Undefined | RESERVED | RESERVED |
All writes to this register must be a palindrome (for example: bits [3:0] are a mirror image of bits [7:4]). If the data is not a palindrome, the entire write is ignored.
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
SWRST | RESERVED | ADDR_ASC | RESERVED | RESERVED | ADDR_ASC | RESERVED | SWRST |
R/W-0 | R/W-0 | R/W-1 | R/W-1 | R/W-1 | R/W-1 | R/W-0 | R/W-0 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7 | SWRST | R/W | 0 | Setting this bit causes all registers to be reset to their default state. This bit is self-clearing. |
6 | RESERVED | R/W | 0 | |
5 | ADDR_ASC | R/W | 1 | This bit is NOT reset by a soft reset (SWRST) 0 : descend – decrement address while streaming (address wraps from 0x0000 to 0x7FFF) 1 : ascend – increment address while streaming (address wraps from 0x7FFF to 0x0000) (default) |
4 | RESERVED | R/W | 1 | Always returns 1 |
3 | RESERVED | R/W | 1100 | Palindrome bits bit 3 = bit 4, bit 2 = bit 5, bit 1 = bit 6, bit 0 = bit 7 |
2 | ADDR_ASC | R/W | ||
1 | RESERVED | R/W | ||
0 | SWRST | R/W |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
RESERVED | |||||||
R - 0x00h |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7:0 | RESERVED | R | 0000 0000 |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
RESERVED | MODE | ||||||
R/W-000000 | R/W-00 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7-2 | RESERVED | R/W | 0000 00 | |
1-0 | MODE | R/W | 00 | SPI 3.0 specification has 1 as low power functional mode and 2 as low power fast resume. This chip does not support these modes. 0: Normal Operation – full power and full performance (default) 1: Normal Operation – full power and full performance (default) 2: Power Down – Everything powered down 3: Power Down – Everything powered down |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
RESERVED | CHIP_TYPE | ||||||
R-0000 | R-0011 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7-4 | RESERVED | R | 0000 | |
3-0 | CHIP_TYPE | R | 0011 | Always returns 0x3, indicating that the part is a high speed ADC. |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
CHIP_VERSION | |||||||
R-0001 0011 |
15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
VENDOR_ID | |||||||
R-0x04h | |||||||
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
VENDOR_ID | |||||||
R-0x51h |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15-0 | VENDOR_ID | R | 0x0451h | Always returns 0x0451 (TI Vendor ID) |
Address | Reset | Acronym | Register Name | Section |
---|---|---|---|---|
0x010 | 0x00 | USR0 | User SPI Configuration Register | Go |
0x011-0x01F | Undefined | RESERVED | RESERVED |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
RESERVED | ADDR_STATIC | ||||||
R/W-0000 000 | R/W-0 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7-1 | RESERVED | R/W | 0000 000 | |
0 | ADDR_STATIC | R/W | 0 | 0 : Use ADDR_ASC bit to define what happens to address during streaming (default). 1 : Address stays static throughout streaming operation. Useful for reading/writing calibration vector information at CAL_VECTOR register. |
Address | Reset | Acronym | Register Name | Section |
---|---|---|---|---|
0x020 | 0x9D | RESERVED | RESERVED | |
0x021 | 0x00 | POR | Power-On Reset Register | Go |
0x022 | 0x40 | IO_GAIN_0 | I/O Gain 0 Register | Go |
0x023 | 0x00 | IO_GAIN_1 | I/O Gain 1 Register | Go |
0x024 | 0x00 | RESERVED | RESERVED | |
0x025 | 0x40 | IO_OFFSET_0 | I/O Offset 0 Register | Go |
0x026 | 0x00 | IO_OFFSET_1 | I/O Offset 1 Register | Go |
0x027 | 0x06 | RESERVED | RESERVED | |
0x028 | 0xBA | RESERVED | RESERVED | |
0x029 | 0xD4 | RESERVED | RESERVED | |
0x02A | 0xAA | RESERVED | RESERVED | |
0x02B-0x02F | Undefined | RESERVED | RESERVED |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
RESERVED | SPI_RES | ||||||
R/W-0000 000 | R/W-0 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7-1 | RESERVED | R/W | 0000 000 | |
0 | SPI_RES | R/W | 0 | Reset all digital. Emulates a power on reset (not self-clearing). Write a 0 and then write a 1 to emulate a reset. Transition from 0—>1 initiates reset. Default: 0 |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
RESERVED | GAIN_FS[14] | GAIN_FS[13] | GAIN_FS[12] | GAIN_FS[11] | GAIN_FS[10] | GAIN_FS[9] | GAIN_FS[8] |
R/W-0 | R/W-1 | R/W-0 | R/W-0 | R/W-0 | R/W-0 | R/W-0 | R/W-0 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7 | RESERVED | R/W | 0 | |
6-0 | GAIN_FS[14:8] | R/W | 100 0000 | MSB Bits for GAIN_FS[14:0]. (See the IO_GAIN_1 description in General Analog, Bias, Band Gap, and Track and Hold (0x020 to 0x02F)) |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
GAIN_FS[7] | GAIN_FS[6] | GAIN_FS[5] | GAIN_FS[4] | GAIN_FS[3] | GAIN_FS[2] | GAIN_FS[1] | GAIN_FS[0] |
R/W-0 | R/W-0 | R/W-0 | R/W-0 | R/W-0 | R/W-0 | R/W-0 | R/W-0 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7-0 | GAIN_FS[7:0] | R/W | 0000 0000 | LSB bits for GAIN_FS[14:0] GAIN_FS[14:0] Value 0x0000 500 mVp-p 0x4000 725 mVp-p (default) 0x7FFF 950 mVp-p |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
RESERVED | OFFSET_FS[14] | OFFSET_FS[13] | OFFSET_FS[12] | OFFSET_FS[11] | OFFSET_FS[10] | OFFSET_FS[9] | OFFSET_FS[8] |
R/W-0 | R/W-1 | R/W-0 | R/W-0 | R/W-0 | R/W-0 | R/W-0 | R/W-0 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7 | RESERVED | R/W | 0 | |
6-0 | OFFSET_FS[14:8] | R/W | 100 0000 | MSB Bits for OFFSET_FS[14:0]. The ADC offset adjust feature has no effect when Background Calibration Mode is enabled. (See IO_OFFSET_1 description in the General Analog, Bias, Band Gap, and Track and Hold (0x020 to 0x02F) section). |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
OFFSET_FS[7] | OFFSET_FS[6] | OFFSET_FS[5] | OFFSET_FS[4] | OFFSET_FS[3] | OFFSET_FS[2] | OFFSET_FS[1] | OFFSET_FS[0] |
R/W-0 | R/W-0 | R/W-0 | R/W-0 | R/W-0 | R/W-0 | R/W-0 | R/W-0 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7-0 | OFFSET_FS[7:0] | R/W | 0000 0000 | LSB bits for OFFSET_FS[14:0]. OFFSET_FS[14:0] adjusts the offset of the entire ADC (all banks are impacted). OFFSET_FS[14:0] Value 0x0000 –28-mV offset 0x4000 no offset (default) 0x7FFF 28-mV offset The ADC offset adjust feature has no effect when Background Calibration Mode is enabled. |
Address | Reset | Acronym | Register Name | Section |
---|---|---|---|---|
0x030 | 0xC0 | CLKGEN_0 | Clock Generator Control 0 Register | Go |
0x031 | 0x07 | CLKGEN_1 | Clock Generator Status Register | Go |
0x032 | 0x80 | CLKGEN_2 | Clock Generator Control 2 Register | Go |
0x033 | 0xC3 | ANA_MISC | Analog Miscellaneous Register | Go |
0x034 | 0x2F | IN_CL_EN | Clamp Enable Register | Go |
0x035 | 0xDF | RESERVED | RESERVED | |
0x036 | 0x00 | RESERVED | RESERVED | |
0x037 | 0x45 | RESERVED | RESERVED | |
0x038-0x03F | Undefined | RESERVED | RESERVED |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
SysRef_Rcvr_En | SysRef_Pr_En | SysRefDetClr | Clear Dirty Capture | RESERVED | DC_LVPECL_CLK_en | DC_LVPECL_SYSREF_en | DC_LVPECL_TS_en |
R/W-1 | R/W-1 | R/W-0 | R/W-0 | R/W-0 | R/W-0 | R/W-0 | R/W-0 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7 | SysRef_Rcvr_En | R/W | 1 | Default: 1 0 : SYSREF receiver is disabled. 1 : SYSREF receiver is enabled (default) |
6 | SysRef_Pr_En | R/W | 1 | To power down the SYSREF receiver, clear this bit first, then clear SysRef_Rcvr_En. To power up the SYSREF receiver, set SysRef_Rcvr_En first, then set this bit. Default: 1 0 : SYSREF Processor is disabled. 1 : SYSREF Processor is enabled (default) |
5 | SysRefDetClr | R/W | 0 | Default: 0 Write a 1 and then a 0 to clear the SysRefDet status bit. |
4 | Clear Dirty Capture | R/W | 0 | Default: 0 Write a 1 and then a 0 to clear the DC status bit. |
3 | RESERVED | R/W | 0 | Default: 0 |
2 | DC_LVPECL_CLK_en | R/W | 0 | Default: 0 Set this bit if DEVCLK is a DC-coupled LVPECL signal through a 50-Ω resistor. |
1 | DC_LVPECL_SYSREF_en | R/W | 0 | Default: 0 Set this bit if SYSREF is a DC-coupled LVPECL signal through a 50-Ω resistor. |
0 | DC_LVPECL_TS_en | R/W | 0 | Default: 0 Set this bit if TimeStamp is a DC-coupled LVPECL signal through a 50-Ω resistor. |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
SysRefDet | Dirty Capture | RESERVED | |||||
R-0 | R-0 | R-00 0111 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7 | SysRefDet | R | 0 | When high, indicates that a SYSREF rising edge was detected. To clear this bit, write SysRefDetClr to 1 and then back to 0. |
6 | Dirty Capture | R | 0 | When high, indicates that a SYSREF rising edge occurred very close to the device clock edge, and setup or hold is not ensured (dirty capture). To clear this bit, write CDC to1 and then back to 0. NOTE: When sweeping the timing on SYSREF, it may jump across the clock edge without triggering this bit. The REALIGNED status bit must be used to detect this (see the JESD_STATUS register description in Digital Down Converter and JESD204B (0x200-0x27F)) |
5-0 | RESERVED | R | 00 0111 | Reserved register. Always returns 000111b |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
RESERVED | RDEL | ||||||
R/W-1000 | R/W-0000 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7-4 | RESERVED | R/W | 1000 | Default: 1000b |
3-0 | RDEL | R/W | 0000 | Adjusts the delay of the SYSREF input signal with respect to DEVCLK. Each step delays SYSREF by 20 ps (nominal) Default: 0 Range: 0 to 15 decimal |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
RESERVED | SYNC_DIFF_PD | RESERVED | |||||
R/W-1100 0 | R/W-0 | R/W-11 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7-3 | RESERVED | R/W | 1100 0 | |
2 | SYNC_DIFF_PD | R/W | 0 | Set this bit to power down the differential SYNC~± inputs for the JESD204B interface. The SYNC~± inputs can also serve as the TimeStamp input receiver for the TimeStamp function.
The receiver must be powered up to support the time stamp or differential SYNC~. Default: 0b |
1-0 | RESERVED | R/W | 11 | Default: 11b |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
RESERVED | INPUT_CLAMP_EN | RESERVED | |||||
R/W-00 | R/W-1 | R/W-0 1111 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7-6 | RESERVED | R/W | 00 | Default: 00b |
5 | INPUT_CLAMP_EN | R/W | 1 | Set this bit to enable the analog input active clamping circuit. Enabled by default. Default: 1b |
4-0 | RESERVED | R/W | 0 1111 | Default: 01111b |
Address | Reset | Acronym | Register Name | Section |
---|---|---|---|---|
0x040 | 0x04 | SER_CFG | Serializer Configuration Register | Go |
0x041-0x04F | Undefined | RESERVED | RESERVED |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
RESERVED | SERIALIZER PRE-EMPHASIS | ||||||
R/W-0000 | R/W-0100 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7-4 | RESERVED | R/W | 0000 | |
3-0 | SERIALIZER PRE-EMPHASIS | R/W | 0100 | Control bits for the pre-emphasis strength of the serializer output driver. Pre-emphasis is required to compensate the low pass behavior of the PCB trace. Default: 4d |
Address | Reset | Acronym | Register Name | Section |
---|---|---|---|---|
0x050 | 0x06 | CAL_CFG0 | Calibration Configuration 0 Register | Go |
0x051 | 0xF4 | CAL_CFG1 | Calibration Configuration 1 Register | Go |
0x052 | 0x00 | RESERVED | RESERVED | |
0x053 | 0x5C | RESERVED | RESERVED | |
0x054 | 0x1C | RESERVED | RESERVED | |
0x055 | 0x92 | RESERVED | RESERVED | |
0x056 | 0x20 | RESERVED | RESERVED | |
0x057 | 0x10 | CAL_BACK | Calibration Background Control Register | Go |
0x058 | 0x00 | ADC_PAT_OVR_EN | ADC Pattern and Over-Range Enable Register | Go |
0x059 | 0x00 | RESERVED | RESERVED | |
0x05A | 0x00 | CAL_VECTOR | Calibration Vectors Register | Go |
0x05B | Undefined | CAL_STAT | Calibration Status Register | Go |
0x05C | 0x00 | RESERVED | RESERVED | |
0x05D-0x05E | Undefined | RESERVED | RESERVED | |
0x05F | 0x00 | RESERVED | RESERVED | |
0x060 | Undefined | RESERVED | RESERVED | |
0x061 | Undefined | RESERVED | RESERVED | |
0x062 | Undefined | RESERVED | RESERVED | |
0x063 | Undefined | RESERVED | RESERVED | |
0x064 | Undefined | RESERVED | RESERVED | |
0x065 | Undefined | RESERVED | RESERVED | |
0x066 | 0x02 | T_CAL | Timing Calibration Register | Go |
0x067 | 0x01 | RESERVED | RESERVED | |
0x068 | Undefined | RESERVED | RESERVED | |
0x069 | Undefined | RESERVED | RESERVED | |
0x06A | 0x00 | RESERVED | RESERVED | |
0x06B | 0x20 | RESERVED | RESERVED | |
0x06C-0x1FF | Undefined | RESERVED | RESERVED |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
RESERVED | TIME_STAMP_EN | CALIBRATION_READ_WRITE_EN | CAL_SFT | RESERVED | |||
R/W-00 | R/W-0 | R/W-0 | R/W-0 | R/W-110 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7-6 | RESERVED | R/W | 00 | |
5 | TIME_STAMP_EN | R/W | 0 | Enables the capture of the external time stamp signal to allow tracking of input signal. Default: 0 |
4 | CALIBRATION_READ_WRITE_EN | R/W | 0 | Enables the scan register to read or write calibration vectors at register 0x05A. Default: 0 |
3 | CAL_SFT(1) | R/W | 0 | Software calibration bit. Set bit to initiate foreground calibration. This bit is self-clearing. This bit resets the calibration state machine. Most calibration SPI registers are not synchronized to the calibration clock. Changing them may corrupt the calibration state machine. Always set CAL_SFT AFTER making any changes to the calibration registers. |
2-0 | RESERVED | R/W | 110 | Default: 110 |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
RESERVED | LOW_SIG_EN | RESERVED | |||||
R/W-1 | R/W-111 | R/W-0100 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7 | RESERVED | R/W | 1 | |
6-4 | LOW_SIG_EN | R/W | 111 | Controls signal range optimization for calibration processes. 111: Calibration is optimized for lower amplitude input signals (< –10dBFS). 000: Calibration is optimized for large (-1dBFS) input signals. Default: 111 but recommend 000 for large input signals. |
3-0 | RESERVED | R/W | 0100 |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
RESERVED | CAL_CONT | CAL_BCK | |||||
R/W-0001 00 | R/W-0 | R/W-0 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7-2 | RESERVED | R/W | 0001 00 | Set to 0001 00b |
1 | CAL_CONT | R/W | 0 | CAL_CONT is the only calibration register bit that can be modified while background calibration is ongoing. This bit must be set to 0 before modifying any of the other bits. 0 : Pause or stop background calibration sequence. 1 : Start background calibration sequence. |
0 | CAL_BCK | R/W | 0 | Background calibration mode enabled. When pausing background calibration leave this bit set, only change CAL_CONT to 0. If CAL_BCK is set to 0 after background calibration has been operation the calibration processes may stop in an incomplete condition. Set CAL_SFT to perform a foreground calibration |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
RESERVED | ADC_PAT_EN | OR_EN | RESERVED | ||||
R/W-0000 0 | R/W-0 | R/W-0 | R/W-0 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7-3 | RESERVED | R/W | 0000 0 | Set to 00000b |
2 | ADC_PAT_EN | R/W | 0 | Enable ADC test pattern |
1 | OR_EN | R/W | 0 | Enable over-range output |
0 | RESERVED | R/W | 0 | Set to 0 |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
CAL_DATA | |||||||
R/W-0000 0000 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7-0 | CAL_DATA | R/W | 0000 0000 | Repeated reads of this register outputs all the calibration register values for analysis if the CALIBRATION_READ_WRITE_EN bit is set. Repeated writes of this register inputs all the calibration register values for configuration if the CAL_RD_EN bit is set. |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
RESERVED | CAL_CONT_OFF | FIRST_CAL_DONE | |||||
R-0000 10 | R-X | R-X |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7-2 | RESERVED | R | 0000 10XX | |
1 | CAL_CONT_OFF | R | X | After clearing CAL_CONT, calibration does not stop immediately. Use this register to confirm it has stopped before changing calibration settings. 0: Indicates calibration is running (foreground or background) 1: Indicates that calibration is finished or stopped because CAL_CONT = 0 |
0 | FIRST_CAL_DONE | R | X | Indicates first calibration sequence has been done and ADC is operational. |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
RESERVED | T_AUTO | ||||||
R/W-0000 001 | R/W-0 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7-1 | RESERVED | R/W | 0000 001 | Set to 0000001b |
0 | T_AUTO | R/W | 0 | Set to enable automatic timing optimization. Timing calibration will occur once CAL_SFT is set. |
Address | Reset | Acronym | Register Name | Section |
---|---|---|---|---|
0x200 | 0x10 | DDC_CTRL1 | Digital Down-Converter (DDC) Control | Go |
0x201 | 0x0F | JESD_CTRL1 | JESD204B Control 1 | Go |
0x202 | 0x00 | JESD_CTRL2 | JESD204B Control 2 | Go |
0x203 | 0x00 | JESD_DID | JESD204B Device ID (DID) | Go |
0x204 | 0x00 | JESD_CTRL3 | JESD204B Control 3 | Go |
0x205 | Undefined | JESD_STATUS | JESD204B and System Status Register | Go |
0x206 | 0xF2 | OVR_T0 | Overrange Threshold 0 | Go |
0x207 | 0xAB | OVR_T1 | Overrange Threshold 1 | Go |
0x208 | 0x00 | OVR_N | Overrange Period | Go |
0x209-0x20B | 0x00 | RESERVED | RESERVED | |
0x20C | 0x00 | NCO_MODE | DDC Configuration Preset Mode | Go |
0x20D | 0x00 | NCO_SEL | DDC Configuration Preset Select | Go |
0x20E-0x20F | 0x0000 | NCO_RDIV | Rational NCO Reference Divisor | Go |
0x210-0x213 | 0xC0000000 | NCO_FREQ0 | NCO Frequency (Preset 0) | Go |
0x214-0x215 | 0x0000 | NCO_PHASE0 | NCO Phase (Preset 0) | Go |
0x216 | 0xFF | DDC_DLY0 | DDC Delay (Preset 0) | Go |
0x217 | 0x00 | RESERVED | RESERVED | |
0x218-0x21B | 0xC0000000 | NCO_FREQ1 | NCO Frequency (Preset 1) | Go |
0x21C-0x21D | 0x0000 | NCO_PHASE1 | NCO Phase (Preset 1) | Go |
0x21E | 0xFF | DDC_DLY1 | DDC Delay (Preset 1) | Go |
0x21F | 0x00 | RESERVED | RESERVED | |
0x220-0x223 | 0xC0000000 | NCO_FREQ2 | NCO Frequency (Preset 2) | Go |
0x224-0x225 | 0x0000 | NCO_PHASE2 | NCO Phase (Preset 2) | Go |
0x226 | 0xFF | DDC_DLY2 | DDC Delay (Preset 2) | Go |
0x227 | 0x00 | RESERVED | RESERVED | |
0x228-0x22B | 0xC0000000 | NCO_FREQ3 | NCO Frequency (Preset 3) | Go |
0x22C-0x22D | 0x0000 | NCO_PHASE3 | NCO Phase (Preset 3) | Go |
0x22E | 0xFF | DDC_DLY3 | DDC Delay (Preset 3) | Go |
0x22F | 0x00 | RESERVED | RESERVED | |
0x230-0x233 | 0xC0000000 | NCO_FREQ4 | NCO Frequency (Preset 4) | Go |
0x234-0x235 | 0x0000 | NCO_PHASE4 | NCO Phase (Preset 4) | Go |
0x236 | 0xFF | DDC_DLY4 | DDC Delay (Preset 4) | Go |
0x237 | 0x00 | RESERVED | RESERVED | |
0x238-0x23B | 0xC0000000 | NCO_FREQ5 | NCO Frequency (Preset 5) | Go |
0x23C-0x23D | 0x0000 | NCO_PHASE5 | NCO Phase (Preset 5) | Go |
0x23E | 0xFF | DDC_DLY5 | DDC Delay (Preset 5) | Go |
0x23F | 0x00 | RESERVED | RESERVED | |
0x240-0x243 | 0xC0000000 | NCO_FREQ6 | NCO Frequency (Preset 6) | Go |
0x244-0x245 | 0x0000 | NCO_PHASE6 | NCO Phase (Preset 6) | Go |
0x246 | 0xFF | DDC_DLY6 | DDC Delay (Preset 6) | Go |
0x247 | 0x00 | RESERVED | RESERVED | |
0x248-0x24B | 0xC0000000 | NCO_FREQ7 | NCO Frequency (Preset 7) | Go |
0x24C-0x24D | 0x0000 | NCO_PHASE7 | NCO Phase (Preset 7) | Go |
0x24E | 0xFF | DDC_DLY7 | DDC Delay (Preset 7) | Go |
0x24F-0x251 | 0x00 | RESERVED | RESERVED | |
0x252-0x27F | Undefined | RESERVED | RESERVED |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
RESERVED | SFORMAT | DDC GAIN BOOST | DMODE | ||||
R/W-00 | R/W-0 | R/W-1 | R/W-0000 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7-6 | RESERVED | R/W | 00 | |
5 | SFORMAT | R/W | 0 | Output sample format for bypass mode: 0 : Offset binary (default) 1 : Signed 2s complement(1) |
4 | DDC GAIN BOOST | R/W | 1 | 0 : Final filter has 0-dB gain (recommended when NCO is set near DC). 1 : Final filter has 6.02-dB gain (default) |
3-0 | DMODE(2) | R/W | 0000 | 0 : Bypass mode (12-bit output, decimate-by-1, DDC off) (default)
1 : Reserved 2 : decimate-by-4 3 : decimate-by-8 4 : decimate-by-10 5 : decimate-by-16 6 : decimate-by-20 7 : decimate-by-32 8..15 : RESERVED |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
SCR | K_Minus_1 | DDR | JESD_EN | ||||
R/W-0 | R/W-000 11 | R/W-1 | R/W-1 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7 | SCR | R/W | 0 | 0 : Scrambler disabled (default) 1 : Scrambler enabled |
6-2 | K_Minus_1 | R/W | 000 11 | K is the number of frames per multiframe, and K – 1 is programmed here. Default: K = 4, K_Minus_1 = 3. Depending on the decimation (D) and serial rate (DDR), there are constraints on the legal values of K. |
1 | DDR | R/W | 1 | 0 : SDR serial rate (ƒ(BIT) = ƒS) 1 : DDR serial rate (ƒ(BIT) = 2ƒS) (default) |
0 | JESD_EN(1) | R/W | 1 | 0 : Block disabled 1 : Normal operation (default) |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
P54 | SYNC_DIFFSEL | RESERVED | JESD204B_TEST | ||||
R/W-0 | R/W-0 | R/W-00 | R/W-0000 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7 | P54 | R/W | 0 | 0 : Disable 5/4 PLL. Serial bit rate is 1x or 2x based on DDR parameter. 1 : Enable 5/4 PLL. Serial bit rate is 1.25x or 2.5x based on DDR parameter. |
6 | SYNC_DIFFSEL | R/W | 0 | 0 : Use SYNC_SE_N input for SYNC_N function 1 : Use SYNC_DIFF_N input for SYNC_N function |
5-4 | RESERVED | R/W | 00 | Set to 00b |
3-0 | JESD204B_TEST(1) | R/W | 0000 | See 0 : Test mode disabled. Normal operation (default) 1 : PRBS7 test mode 2 : PRBS15 test mode 3 : PRBS23 test mode 4 : Ramp test mode 5 : Short and long transport layer test mode 6 : D21.5 test mode 7 : K28.5 test mode 8 : Repeated ILA test mode 9 : Modified RPAT test mode 10: Serial outputs held low 11: Serial outputs held high 12 through 15 : RESERVED |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
JESD_DID | |||||||
R/W-0000 0000 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7-0 | JESD_DID(1) | R/W | 0000 0000 | Specifies the DID value that is transmitted during the second multiframe of the JESD204B ILA. |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
RESERVED | FCHAR | ||||||
R/W-0000 00 | R/W-00 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7-2 | RESERVED | R/W | 0000 00 | |
1-0 | FCHAR(1) | R/W | 00 | Specify which comma character is used to denote end-of-frame. This character is transmitted opportunistically according to JESD204B Section 5.3.3.4. When using a JESD204B receiver, always use FCHAR=0. When using a general purpose 8-b or 10-b receiver, the K28.7 character can cause issues. When K28.7 is combined with certain data characters, a false, misaligned comma character can result, and some receivers realign to the false comma. To avoid this, program FCHAR to 1 or 2. 0 : Use K28.7 (default) (JESD204B compliant) 1 : Use K28.1 (not JESD204B compliant) 2 : Use K28.5 (not JESD204B compliant) 3 : Reserved |
See the JESD204B Synchronization Features section for more details.
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
RESERVED | LINK_UP | SYNC_STATUS | REALIGNED | ALIGNED | PLL_LOCKED | RESERVED | |
R/W-0 | R/W-0 | R/W-X | R/W-X | R/W-0 | R/W-0 | R/W-00 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7 | RESERVED | R/W | 0 | Always returns 0 |
6 | LINK_UP | R/W | 0 | When set, indicates that the JESD204B link is in the DATA_ENC state. |
5 | SYNC_STATUS | R/W | X | Returns the state of the JESD204B SYNC~ signal (SYNC_SE_N or SYNC_DIFF_N). 0 : SYNC~ asserted 1 : SYNC~ deasserted |
4 | REALIGNED | R/W | X | When high, indicates that the div8 clock, frame clock, or multiframe clock phase was realigned by SYSREF. Writing a 1 to this bit clears it. |
3 | ALIGNED | R/W | 0 | When high, indicates that the multiframe clock phase has been established by SYSREF. The first SYSREF event after enabling the JESD204B encoder will set this bit. Writing a 1 to this bit clears it. |
2 | PLL_LOCKED | R/W | 0 | When high, indicates that the PLL is locked. |
1-0 | RESERVED | R/W | 0 | Always returns 0 |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
OVR_T0 | |||||||
R/W-1111 0010 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7-0 | OVR_T0 | R/W | 1111 0010 | Over-range threshold 0. This parameter defines the absolute sample level that causes control bit 0 to be set. Control bit 0 is attached to the DDC I output samples. The detection level in dBFS (peak) is 20log10(OVR_T0 / 256) Default: 0xF2 = 242 → –0.5 dBFS |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
OVR_T1 | |||||||
R/W-1010 1011 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7-0 | OVR_T1 | R/W | 1010 1011 | Overrange threshold 1. This parameter defines the absolute sample level that causes control bit 1 to be set. Control bit 1 is attached to the DDC Q output samples. The detection level in dBFS (peak) is 20log10(OVR_T1 / 256) Default: 0xAB = 171 → –3.5 dBFS |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
RESERVED | OVR_N | ||||||
R/W-0000 0 | R/W-000 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7-3 | RESERVED | R/W | 0000 0 | |
2-0 | OVR_N(1) | R/W | 000 | This bit adjusts the monitoring period for the OVR[1:0] output bits. The period is scaled by 2OVR_N. Incrementing this field doubles the monitoring period. |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
RESERVED | CFG_MODE | ||||||
R/W-0000 000 | R/W-0 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7-1 | RESERVED | R/W | 0000 000 | |
0 | CFG_MODE | R/W | 0 | The NCO frequency and phase are set by the NCO_FREQx and NCO_PHASEx registers, where x is the configuration preset (0 through 7). The DDC delay setting is defined by the DDC_DLYx register. 0 : Use NCO_[2:0] input pins to select the active DDC and NCO configuration preset. 1 : Use the NCO_SEL register to select the active DDC and NCO configuration preset. |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
RESERVED | NCO_SEL | ||||||
R/W-0000 0 | R/W-000 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7-3 | RESERVED | R/W | 0000 0 | |
2-0 | NCO_SEL | R/W | 000 | When NCO_MODE = 1, this register is used to select the active configuration preset. |
15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
NCO_RDIV | |||||||
R/W-0x00h | |||||||
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
NCO_RDIV | |||||||
R/W-0x00h |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15-0 | NCO_RDIV | R/W | 0x0000h | Sometimes the 32-bit NCO frequency word does not provide the desired frequency step size and can only approximate the desired frequency. This results in a frequency error. Use this register to eliminate the frequency error. Use this equation to compute the proper value to program:
Equation 10. NCO_RDIV = ƒS / ƒ(STEP) / 128
where
For example, if ƒS= 3072 MHz, and ƒ(STEP) = 10 KHz then:
Equation 11. NCO_RDIV = 3072 MHz / 10 KHz / 128 = 2400
Any combination of ƒS and ƒ(STEP) that results in a fractional value for NCO_RDIV is not supported. Values of NCO_RDIV larger than 8192 can degrade the NCO’s SFDR performance and are not recommended. This register is used for all configuration presets. |
31 | 30 | 29 | 28 | 27 | 26 | 25 | 24 |
NCO_FREQ_x | |||||||
R/W-0xC0h | |||||||
23 | 22 | 21 | 20 | 19 | 18 | 17 | 16 |
NCO_FREQ_x | |||||||
R/W-0x00h | |||||||
15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
NCO_FREQ_x | |||||||
R/W-0x00h | |||||||
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
NCO_FREQ_x | |||||||
R/W-0x00h |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
31-0 | NCO_FREQ_x | R/W | 0xC0000000h | Changing this register after the JESD204B interface is running results in non-deterministic NCO phase. If deterministic phase is required, the JESD204B interface must be re-initialized after changing this register. The NCO frequency (ƒ(NCO)) is:
Equation 12. ƒ(NCO) = NCO_FREQ_x × 2–32 × ƒS
where
This register can be interpreted as signed or unsigned. Use this equation to determine the value to program:
Equation 13. NCO_FREQ_x = 232 × ƒ(NCO) / ƒS
If the equation does not result in an integer value, you must choose an alternate frequency step (ƒ(STEP) ) and program the NCO_RDIV register. Then use one of the following equations to compute NCO_FREQ_x:
Equation 14. NCO_FREQ_x = round(232 × ƒ(NCO) / ƒS)
Equation 15. NCO_FREQ_x = round(225 × ƒ(NCO) / ƒ(STEP) / NCO_RDIV)
|
15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
NCO_PHASE_x | |||||||
R/W-0x00h | |||||||
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
NCO_PHASE_x | |||||||
R/W-0x00h |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15-0 | NCO_PHASE_x | R/W | 0x0000h | This value is MSB-justified into a 32−bit field and then added to the phase accumulator. The phase (in radians) is
Equation 16. NCO_PHASE_x × 2–16 × 2π
This register can be interpreted as signed or unsigned. |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
DDC_DLY_x | |||||||
R/W-0xFFh |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
7-0 | DDC_DLY_x | R/W | 0xFFh | DDC delay for configuration preset 0 This register provides fine adjustments to the DDC group delay. The step size is one half of an ADC sample period (t(DEVCLK) / 2). This is equivalent to Equation 17.
Equation 17. tO / (2 × D) The legal range for this register is 0 to 2D-1. Illegal values result in undefined behavior.where
Example: When D = 8, the legal register range is 0 to 15. The step size is tO / 16 and the maximum delay is 15 × tO / 16. Programming this register to 0xFF (the default value) powers down and bypasses the fractional delay filter which reduces the DDC latency by 34 ADC sample periods (as compared to the 0 setting). |
NOTE
Information in the following applications sections is not part of the TI component specification, and TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining suitability of components for their purposes. Customers should validate and test their design implementation to confirm system functionality.
The ADC12J4000 device is a wideband sampling and digital tuning device. The ADC input captures input signals from DC to greater than 3 GHz. The DDC performs digital-down conversion and programmable decimation filtering, and outputs complex (15 bit I and 15 bit Q) data. In DDC Bypass Mode (Decimation = 1) the raw 12 bit ADC data is also available. The resulting output data is output on the JESD204B data interface for capture by the downstream capture or processing device. Most frequency-domain applications benefit from DDC capability to select the desired frequency band and provide only the necessary bandwidth of output data, minimizing the required number of data signals. Time domain applications generally require the raw 12-bit ADC output data provided by the DDC bypass feature.
An RF Sampling Receiver is used to directly sample a signal in the RF frequency range and provide the data for the captured signal to downstream processing. The wide input bandwidth, high sampling rate, and DDC features of the ADC12J4000 make it ideally suited for this application.
For this design example, use the parameters listed in Table 87.
DESIGN PARAMETERS | EXAMPLE VALUES |
---|---|
Signal center frequency | 2500 MHz |
Signal bandwidth | 100 MHz |
Signal nominal amplitude | –7 dBm |
Signal maximum amplitude | 6 dBm |
Minimum SINAD (in bandwidth of interest) | 48 dBc |
Minimum SFDR (in bandwidth of interest) | 60 dBc |
Use the following steps to design the RF receiver:
The LMK048xx JESD204B clocking devices can provide the DEVCLK clock and other system clocks for ƒ(DEVCLK) < 3101 MHz.
For DEVCLK frequencies up to 4 GHz the consider using the LMX2581 and TRF3765 devices as the DEVCLK source. Use the LMK048xx device to provide the JESD204B clocks. For additional device information, see the Related Documentation section.
The following curves show an RF signal at 2497.97 MHz captured at a sample rate of 4000 MSPS. Figure 95 shows the spectrum for the full Nyquist band. Figure 96 shows the spectrum for the output data in decimate-by-32 mode with ƒ(NCO) equal to 2500 MHz. Figure 96 shows the ability to provide only the spectrum of interest in the decimated output data. Figure 96 also shows how proper selection of the sampling rate can ensure interleaving tones are outside the band of interest and outside the decimated frequency range. Lastly, Figure 96 shows the reduction in the noise floor provided by the processing gain of decimation.
DDC Bypass Mode | ƒS = 4000 MSPS | |
FIN = 2497.97 MHz at –7 dBFS |
ƒS = 4000 MSPS | ƒ(NCO) = 2500 MHz | |
FIN = 2497.97 MHz at –7 dBFS |
The ADC12J4000 device is equally well-suited for high-speed time-domain applications such as oscilloscopes. The following typical application is for a generic high-speed oscilloscope. Adjustable gain is provided by the front-end resistor ladder and selection mux, and the gain adjustments of the LMH6518 device. Additional gain fine-tuning can be achieved using the full-scale range adjustment features of the ADC.
For this design example, use the parameters listed in Table 88.
DESIGN PARAMETERS | EXAMPLE VALUES |
---|---|
Maximum sample rate | 4000 MSPS |
Maximum input frequency | 1500 MHz |
1-dB flat-frequency range | 0 to 1000 MHz |
Signal maximum amplitude | 6 dBm |
Signal minimum amplitude | 48 dBc |
Maximum capture depth | 1 million points |
Use the following primary steps to design a 12-bit oscilloscope:
The following curves show the time-domain sample data for a 150-MHz input signal at –1 dBFS, sampled at 4000 MSPS using the ADC12J4000 device. Figure 98 shows the raw time-domain data. Figure 99 shows the spectrum of the captured signal which shows the additional capability of a 12-bit ADC oscilloscope to provide basic spectrum-analysis functions with reasonable performance.
FIN = 147.97 MHz at –1 dBFS | ƒS = 4000 MSPS |
FIN = 149.97 MHz at –1 dBFS | ƒS = 4000 MSPS |
The JESD204B interface requires a specific startup and alignment sequence. The general order of that sequence is listed in the following steps.
NOTE
If deterministic latency is not required this step can be omitted.
Driving the inputs (analog or digital) beyond the power supply rails. For device reliability, an input must not go more than 150 mV below the ground pins or 150 mV above the supply pins. Exceeding these limits even on a transient basis can cause faulty, or erratic, operation and can impair device reliability. High-speed digital circuits exhibiting undershoot that goes more than a volt below ground is common. To control overshoot, the impedance of high-speed lines must be controlled and these lines must be terminated in the characteristic impedance.
Care must be taken not to overdrive the inputs of the ADC12J4000 device. Such practice can lead to conversion inaccuracies and even to device damage.
Incorrect analog input common-mode voltage in the DC-coupled mode. As described in the The Analog Inputs and DC Coupled Input Usage sections, the input common-mode voltage (VCMI) must remain the specified range as referenced to the VCMO pin, which has a variability with temperature that must also be tracked. Distortion performance is degraded if the input common mode voltage is outside the specified VCMI range.
Using an inadequate amplifier to drive the analog input. Use care when choosing a high frequency amplifier to drive the ADC12J4000 device because many high-speed amplifiers have higher distortion than the ADC12J4000 device which results in overall system performance degradation.
Driving the clock input with an excessively high level signal. The ADC input clock level must not exceed the level described in the Recommended Operating Conditions table because the input offset can change if these levels are exceeded.
Inadequate input clock levels. As described in the Using the Serial Interface section, insufficient input clock levels can result in poor performance. Excessive input-clock levels can result in the introduction of an input offset.
Using a clock source with excessive jitter, using an excessively long input clock signal trace, or having other signals coupled to the input clock signal trace. These pitfalls cause the sampling interval to vary which causes excessive output noise and a reduction in SNR performance.
Failure to provide adequate heat removal. As described in the Thermal Management section, providing adequate heat removal is important to ensure device reliability. Adequate heat removal is primarily provided by properly connecting the thermal pad to the circuit board ground planes. Multiple vias should be arranged in a grid pattern in the area of the thermal pad. These vias will connect the topside pad to the internal ground planes and to a copper pour area on the opposite side of the printed circuit board.
Data-converter-based systems draw sufficient transient current to corrupt their own power supplies if not adequately bypassed. A 10-µF capacitor must be placed within one inch (2.5 cm) of the device power pins for each supply voltage. A 0.1-µF capacitor must be placed as close as possible to each supply pin, preferably within 0.5 cm. Leadless chip capacitors are preferred due to their low-lead inductance.
As is the case with all high-speed converters, the ADC12J4000 device must be assumed to have little power-supply noise-rejection. Any power supply used for digital circuitry in a system where a large amount of digital power is consumed must not be used to supply power to the ADC12J4000 device. If not a dedicated supply, the ADC supplies must be the same supply used for other analog circuitry.
The ADC12J4000 device is specified to operate with nominal supply voltages of 1.9 V (VA19) and 1.2 V (VA12, VD12). For detailed information regarding the operating voltage minimums and maximums see the Recommended Operating Conditions table.
During power-up the voltage on all 1.9-V supplies must always be equal to or greater than the voltage on the 1.2-V supplies. Similarly, during power-down, the voltage on the 1.2-V supplies must always be lower than or equal to that of the 1.9-V supplies. In general, supplying all 1.9-V buses from a single regulator, and all 1.2-V buses from a single regulator is the easiest method to ensure that the 1.9-V supplies are greater than the 1.2-V supplies. If the 1.2-V buses are generated from separate regulators, they must rise and fall together (within 200 mV).
The voltage on a pin, including a transient basis, must not have a voltage that is in excess of the supply voltage or below ground by more than 150 mV. A pin voltage that is higher than the supply or that is below ground can be a problem during startup and shutdown of power. Ensure that the supplies to circuits driving any of the input pins, analog or digital, do not rise faster than the voltage at the ADC12J4000 power pins.
The values in the Absolute Maximum Ratings table must be strictly observed including during power up and power down. A power supply that produces a voltage spike at power turnon, turnoff, or both can destroy the ADC12J4000 device. Many linear regulators produce output spiking at power on unless there is a minimum load provided. Active devices draw very little current until the supply voltages reach a few hundred millivolts. The result can be a turn-on spike that destroys the ADC12J4000 device, unless a minimum load is provided for the supply. A 100-Ω resistor at the regulator output provides a minimum output current during power up to ensure that no turn-on spiking occurs. Whether a linear or switching regulator is used, TI recommends using a soft-start circuit to prevent overshoot of the supply.