SNAS298G August 2005 – January 2015 ADC128S102
PRODUCTION DATA.
MIN | MAX | UNIT | ||
---|---|---|---|---|
Analog Supply Voltage VA | −0.3 | 6.5 | V | |
Digital Supply Voltage VD | −0.3 | VA + 0.3, max 6.5 | V | |
Voltage on Any Pin to GND | −0.3 | VA +0.3 | V | |
Input Current at Any Pin (3) | –10 | 10 | mA | |
Package Input Current(3) | –20 | 20 | mA | |
Power Dissipation at TA = 25°C | See (4) | |||
Junction Temperature | 150 | °C | ||
Storage temperature, Tstg | −65 | 150 | °C | |
For soldering specifications: see product folder at www.ti.com and SNOA549 |
VALUE | UNIT | |||
---|---|---|---|---|
V(ESD) | Electrostatic discharge | Human body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) | ±2500 | V |
Machine model (MM) | ±250 |
MIN | MAX | UNIT | |
---|---|---|---|
Operating Temperature, TA | –40 | 105 | °C |
VA Supply Voltage | 2.7 | 5.25 | V |
VD Supply Voltage | 2.7 | VA | V |
Digital Input Voltage | 0 | VA | V |
Analog Input Voltage | 0 | VA | V |
Clock Frequency | 8 | 16 | MHz |
THERMAL METRIC(1) | ADC128S102 | UNIT | |
---|---|---|---|
PW | |||
16 PINS | |||
RθJA | Junction-to-ambient thermal resistance | 110 | °C/W |
RθJC(top) | Junction-to-case (top) thermal resistance | 42 | |
RθJB | Junction-to-board thermal resistance | 56 | |
ψJT | Junction-to-top characterization parameter | 5 | |
ψJB | Junction-to-board characterization parameter | 55 |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX(1) | UNIT | |
---|---|---|---|---|---|---|
STATIC CONVERTER CHARACTERISTICS | ||||||
Resolution with No Missing Codes | 12 | Bits | ||||
INL | Integral Non-Linearity (End Point Method) | VA = VD = +3.0V | –1 | ±0.4 | 1 | LSB |
VA = VD = +5.0V | –1.2 | ±0.5 | 1.2 | LSB | ||
DNL | Differential Non-Linearity | VA = VD = +3.0V | +0.4 | 0.9 | LSB | |
−0.7 | −0.2 | LSB | ||||
VA = VD = +5.0V | +0.7 | 1.5 | LSB | |||
−0.9 | −0.4 | LSB | ||||
VOFF | Offset Error | VA = VD = +3.0V | –2.3 | +0.8 | 2.3 | LSB |
VA = VD = +5.0V | –2.3 | +1.1 | 2.3 | LSB | ||
OEM | Offset Error Match | VA = VD = +3.0V | –1.5 | ±0.1 | 1.5 | LSB |
VA = VD = +5.0V | –1.5 | ±0.3 | 1.5 | LSB | ||
FSE | Full Scale Error | VA = VD = +3.0V | –2.0 | +0.8 | 2.0 | LSB |
VA = VD = +5.0V | –2.0 | +0.3 | 2.0 | LSB | ||
FSEM | Full Scale Error Match | VA = VD = +3.0V | –1.5 | ±0.1 | 1.5 | LSB |
VA = VD = +5.0V | –1.5 | ±0.3 | 1.5 | LSB | ||
DYNAMIC CONVERTER CHARACTERISTICS | ||||||
FPBW | Full Power Bandwidth (−3dB) | VA = VD = +3.0V | 8 | MHz | ||
VA = VD = +5.0V | 11 | MHz | ||||
SINAD | Signal-to-Noise Plus Distortion Ratio | VA = VD = +3.0V, fIN = 40.2 kHz, −0.02 dBFS |
70 | 73 | dB | |
VA = VD = +5.0V, fIN = 40.2 kHz, −0.02 dBFS |
70 | 73 | dB | |||
SNR | Signal-to-Noise Ratio | VA = VD = +3.0V, fIN = 40.2 kHz, −0.02 dBFS |
70.8 | 73 | dB | |
VA = VD = +5.0V, fIN = 40.2 kHz, −0.02 dBFS |
70.8 | 73 | dB | |||
THD | Total Harmonic Distortion | VA = VD = +3.0V, fIN = 40.2 kHz, −0.02 dBFS |
−88 | −74 | dB | |
VA = VD = +5.0V, fIN = 40.2 kHz, −0.02 dBFS |
−90 | −74 | dB | |||
SFDR | Spurious-Free Dynamic Range | VA = VD = +3.0V, fIN = 40.2 kHz, −0.02 dBFS |
75 | 91 | dB | |
VA = VD = +5.0V, fIN = 40.2 kHz, −0.02 dBFS |
75 | 92 | dB | |||
ENOB | Effective Number of Bits | VA = VD = +3.0V, fIN = 40.2 kHz |
11.3 | 11.8 | Bits | |
VA = VD = +5.0V, fIN = 40.2 kHz, −0.02 dBFS |
11.3 | 11.8 | Bits | |||
ISO | Channel-to-Channel Isolation | VA = VD = +3.0V, fIN = 20 kHz |
82 | dB | ||
VA = VD = +5.0V, fIN = 20 kHz, −0.02 dBFS |
84 | dB | ||||
IMD | Intermodulation Distortion, Second Order Terms | VA = VD = +3.0V, fa = 19.5 kHz, fb = 20.5 kHz |
−89 | dB | ||
VA = VD = +5.0V, fa = 19.5 kHz, fb = 20.5 kHz |
−91 | dB | ||||
Intermodulation Distortion, Third Order Terms | VA = VD = +3.0V, fa = 19.5 kHz, fb = 20.5 kHz |
−88 | dB | |||
VA = VD = +5.0V, fa = 19.5 kHz, fb = 20.5 kHz |
−88 | dB | ||||
ANALOG INPUT CHARACTERISTICS | ||||||
VIN | Input Range | 0 to VA | V | |||
IDCL | DC Leakage Current | –1 | 1 | µA | ||
CINA | Input Capacitance | Track Mode | 33 | pF | ||
Hold Mode | 3 | pF | ||||
DIGITAL INPUT CHARACTERISTICS | ||||||
VIH | Input High Voltage | VA = VD = +2.7V to +3.6V | 2.1 | V | ||
VA = VD = +4.75V to +5.25V | 2.4 | V | ||||
VIL | Input Low Voltage | VA = VD = +2.7V to +5.25V | 0.8 | V | ||
IIN | Input Current | VIN = 0V or VD | –1 | ±0.01 | 1 | µA |
CIND | Digital Input Capacitance | 2 | 4 | pF | ||
DIGITAL OUTPUT CHARACTERISTICS | ||||||
VOH | Output High Voltage | ISOURCE = 200 µA, VA = VD = +2.7V to +5.25V |
VD − 0.5 | V | ||
VOL | Output Low Voltage | ISINK = 200 µA to 1.0 mA, VA = VD = +2.7V to +5.25V |
0.4 | V | ||
IOZH, IOZL | Hi-Impedance Output Leakage Current | VA = VD = +2.7V to +5.25V | –1 | 1 | µA | |
COUT | Hi-Impedance Output Capacitance (2) | 2 | 4 | pF | ||
Output Coding | Straight (Natural) Binary | |||||
POWER SUPPLY CHARACTERISTICS (CL = 10 pF) | ||||||
VA, VD | Analog and Digital Supply Voltages | VA ≥ VD | 2.7 | 5.25 | V | |
IA + ID | Total Supply Current Normal Mode ( CS low) |
VA = VD = +2.7V to +3.6V, fSAMPLE = 1 MSPS, fIN = 40 kHz |
0.76 | 1.5 | mA | |
VA = VD = +4.75V to +5.25V, fSAMPLE = 1 MSPS, fIN = 40 kHz |
2.13 | 3.1 | mA | |||
Total Supply Current Shutdown Mode (CS high) |
VA = VD = +2.7V to +3.6V, fSCLK = 0 ksps |
20 | nA | |||
VA = VD = +4.75V to +5.25V, fSCLK = 0 ksps |
50 | nA | ||||
PC | Power Consumption Normal Mode ( CS low) |
VA = VD = +3.0V fSAMPLE = 1 MSPS, fIN = 40 kHz |
2.3 | 4.5 | mW | |
VA = VD = +5.0V fSAMPLE = 1 MSPS, fIN = 40 kHz |
10.7 | 15.5 | mW | |||
Power Consumption Shutdown Mode (CS high) |
VA = VD = +3.0V fSCLK = 0 ksps |
0.06 | µW | |||
VA = VD = +5.0V fSCLK = 0 ksps |
0.25 | µW | ||||
AC ELECTRICAL CHARACTERISTICS | ||||||
fSCLKMIN | Minimum Clock Frequency | VA = VD = +2.7V to +5.25V | 8 | 0.8 | MHz | |
fSCLK | Maximum Clock Frequency | VA = VD = +2.7V to +5.25V | 16 | MHz | ||
fS | Sample Rate Continuous Mode |
VA = VD = +2.7V to +5.25V | 500 | 50 | ksps | |
1 | MSPS | |||||
tCONVERT | Conversion (Hold) Time | VA = VD = +2.7V to +5.25V | 13 | SCLK cycles | ||
DC | SCLK Duty Cycle | VA = VD = +2.7V to +5.25V | 40% | 30 | ||
70 | 60% | |||||
tACQ | Acquisition (Track) Time | VA = VD = +2.7V to +5.25V | 3 | SCLK cycles | ||
Throughput Time | Acquisition Time + Conversion Time VA = VD = +2.7V to +5.25V |
16 | SCLK cycles | |||
tAD | Aperture Delay | VA = VD = +2.7V to +5.25V | 4 | ns |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX(1) | UNIT | |
---|---|---|---|---|---|---|
tCSH | CS Hold Time after SCLK Rising Edge | 10 | 0 | ns | ||
tCSS | CS Setup Time prior to SCLK Rising Edge | 10 | 4.5 | ns | ||
tEN | CS Falling Edge to DOUT enabled | 5 | 30 | ns | ||
tDACC | DOUT Access Time after SCLK Falling Edge | 17 | 27 | ns | ||
tDHLD | DOUT Hold Time after SCLK Falling Edge | 4 | ns | |||
tDS | DIN Setup Time prior to SCLK Rising Edge | 10 | 3 | ns | ||
tDH | DIN Hold Time after SCLK Rising Edge | 10 | 3 | ns | ||
tCH | SCLK High Time | 0.4 x tSCLK | ns | |||
tCL | SCLK Low Time | 0.4 x tSCLK | ns | |||
tDIS | CS Rising Edge to DOUT High-Impedance | DOUT falling | 2.4 | 20 | ns | |
DOUT rising | 0.9 | 20 | ns |