SLASE49B December   2015  – April 2017 ADC14X250

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Electrical Characteristics: Static Converter Performance
    6. 6.6  Electrical Characteristics: Dynamic Converter Performance
    7. 6.7  Electrical Characteristics: Power Supply
    8. 6.8  Electrical Characteristics: Analog Interface
    9. 6.9  Digital Input Characteristics
    10. 6.10 Electrical Characteristics: Serial Data Output Interface
    11. 6.11 Electrical Characteristics: Digital Input
    12. 6.12 Timing Requirements
    13. 6.13 Typical Characteristics
  7. 7 Parameter Measurement Information
    1. 7.1 JESD204B Interface Functional Characteristics
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1  Amplitude and Phase Imbalance Correction of Differential Analog Input
      2. 8.3.2  Input Clock Divider
      3. 8.3.3  SYSREF Offset Feature and Detection Gate
      4. 8.3.4  DC Offset Correction
      5. 8.3.5  Serial Differential Output Drivers
        1. 8.3.5.1 De-Emphasis Equalization
      6. 8.3.6  ADC Core Calibration
      7. 8.3.7  Data Format
      8. 8.3.8  JESD204B Supported Features
      9. 8.3.9  Transport Layer Configuration
        1. 8.3.9.1 Lane Configuration
        2. 8.3.9.2 Frame Format
        3. 8.3.9.3 ILA Information
      10. 8.3.10 Test Pattern Sequences
      11. 8.3.11 JESD204B Link Initialization
        1. 8.3.11.1 Frame Alignment
        2. 8.3.11.2 Code Group Synchronization
      12. 8.3.12 Sync~ Signal Selection
      13. 8.3.13 SPI
    4. 8.4 Device Functional Modes
      1. 8.4.1 Power-Down and Sleep Modes
    5. 8.5 Register Map
      1. 8.5.1 Register Descriptions
        1. 8.5.1.1  CONFIG_A, [Address: 0x0000], [Default: 0x3C]
        2. 8.5.1.2  DEVICE CONFIG, [Address: 0x0002], [Default: 0x00]
        3. 8.5.1.3  CHIP_TYPE, [Address: 0x0003], [Default: 0x03]
        4. 8.5.1.4  CHIP_ID, [Address: 0x0005, 0x0004], [Default: 0x00, 0x01]
        5. 8.5.1.5  CHIP_VERSION, [Address: 0x0006], [Default: 0x00]
        6. 8.5.1.6  VENDOR_ID, [Address: 0x000D, 0x000C], [Default: 0x04, 0x51]
        7. 8.5.1.7  SPI_CFG, [Address: 0x0010], [Default: 0x01]
        8. 8.5.1.8  OM1 (Operational Mode 1), [Address: 0x0012], [Default: 0x81]
        9. 8.5.1.9  OM2 (Operational Mode 2), [Address: 0x0013], [Default: 0x20]
        10. 8.5.1.10 IMB_ADJ (Imbalance Adjust), [Address: 0x0014], [Default: 0x00]
        11. 8.5.1.11 DC_MODE (DC Offset Correction Mode), [Address: 0x003D], [Default: 0x00]
        12. 8.5.1.12 SER_CFG (Serial Lane Transmitter Configuration), [Address: 0x0047], [Default: 0x00]
        13. 8.5.1.13 JESD_CTRL1 (JESD Configuration Control 1) , [Address: 0x0060], [Default: 0x7D]
        14. 8.5.1.14 JESD_CTRL2 (JESD Configuration Control 2), [Address: 0x0061], [Default: 0x00]
        15. 8.5.1.15 JESD_RSTEP (JESD Ramp Pattern Step), [Addresses: 0x0063, 0x0062], [Default: 0x00, 0x01]
        16. 8.5.1.16 JESD_STATUS (JESD Link Status), [Address: 0x006C], [Default: N/A]
  9. 9 Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 Analog Input Considerations
        1. 9.1.1.1 Differential Analog Inputs and Full Scale Range
        2. 9.1.1.2 Analog Input Network Model
        3. 9.1.1.3 Input Bandwidth
        4. 9.1.1.4 Driving the Analog Input
        5. 9.1.1.5 Clipping
      2. 9.1.2 CLKIN, SYSREF, and SYNCb Input Considerations
        1. 9.1.2.1 Driving the CLKIN+ and CLKIN- Input
        2. 9.1.2.2 Clock Noise and Edge Rate
        3. 9.1.2.3 Driving the SYSREF Input
        4. 9.1.2.4 SYSREF Signaling
        5. 9.1.2.5 SYSREF Timing
        6. 9.1.2.6 Effectively Using the SYSREF Offset and Detection Gate Features
        7. 9.1.2.7 Driving the SYNCb Input
      3. 9.1.3 Output Serial Interface Considerations
        1. 9.1.3.1 Output Serial-Lane Interface
        2. 9.1.3.2 Voltage Swing and De-Emphasis Optimization
        3. 9.1.3.3 Minimizing EMI
      4. 9.1.4 JESD204B System Considerations
        1. 9.1.4.1 Frame and LMFC Clock Alignment Procedure
        2. 9.1.4.2 Link Interruption
        3. 9.1.4.3 Clock Configuration Examples
        4. 9.1.4.4 Configuring the JESD204B Receiver
      5. 9.1.5 SPI
    2. 9.2 Typical Applications
      1. 9.2.1 Design Requirements
      2. 9.2.2 Design Procedure
      3. 9.2.3 Application Performance Plot
      4. 9.2.4 Systems Example
  10. 10Power Supply Recommendations
    1. 10.1 Power Supply Design
    2. 10.2 Decoupling
  11. 11Layout
    1. 11.1 Layout Guidelines
      1. 11.1.1 Layout Example
      2. 11.1.2 Thermal Considerations
  12. 12Device and Documentation Support
    1. 12.1 Device Support
      1. 12.1.1 Related Documentation
        1. 12.1.1.1 Specification Definitions
        2. 12.1.1.2 JESD204B Definitions
    2. 12.2 Receiving Notification of Documentation Updates
    3. 12.3 Community Resources
    4. 12.4 Trademarks
    5. 12.5 Electrostatic Discharge Caution
    6. 12.6 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

1 Features

  • Resolution: 14-Bit
  • Conversion Rate: 250 MSPS
  • Performance:
    • Input: 240 MHz, –3 dBFS
      • SNR: 70.1 dBFS
      • Noise Spectral Density: –151.1 dBFS/Hz
      • SFDR: 87 dBFS
      • Non-HD2 and Non-HD3 SPUR: –92 dBFS
    • No Input SNR: 71.1 dBFS
  • Power Dissipation: 584 mW
  • Performance Rated up to 105°C (at thermal pad)
  • JESD204B Subclass 1 Single Lane Serial Data Interface With Lane Rate Up To 5 Gb/s
  • Buffered Analog Inputs
  • Differential Input Phase and Amplitude Correction
  • Input Sampling Clock Divider (Divide-by-1,2,4,8)
  • 4-Wire Serial Peripheral Interface (SPI)
  • 32-Pin WQFN Package (5×5 mm, 0.5-mm Pitch)

2 Applications

  • High IF Sampling Receivers
  • Multi-Carrier Base Station Receivers
    • GSM/EDGE, CDMA2000, UMTS, LTE, WiMax
  • Diversity, Multi-Mode, and Multiband Receivers
  • Digital Pre-Distortion
  • Software Defined Radio (SDR)
  • Test and Measurement Equipment
  • Communications Instrumentation
  • Radar
  • Portable Instrumentation

3 Description

The ADC14X250 device is a monolithic single-channel high performance analog-to-digital converter capable of converting analog input signals into 14-bit digital words with a sampling rate of 250 MSPS. This converter uses a differential pipelined architecture with integrated input buffer to provide excellent dynamic performance and low power consumption across an extended temperature range from –40°C to 105°C as measured at the device's PCB footprint thermal pad.

The integrated input buffer eliminates charge kickback noise coming from the internal switched capacitor sampling circuits and eases the system-level design of the driving amplifier, anti-aliasing filter, and impedance matching. The buffer can be also be adjusted to correct for phase and amplitude imbalance of the differential input signal path to improve even order harmonic distortion. An input sampling clock divider provides integer divide ratios to simplify system clocking. An integrated low-noise voltage reference eases board level design without requiring external decoupling capacitors. The output digital data is provided through a JESD204B subclass 1 single lane interface from a 32-pin, 5-mm × 5-mm WQFN package. The ADC14X250 operates on 1.2 V, 1.8 V and 3.0 V power supplies. A SPI is available to configure the device that is compatible with 1.2-V to 3-V logic.

Device Information(1)

PART NAME PACKAGE BODY SIZE (NOM)
ADC14X250 WQFN (32) 5.00 × 5.00 mm
  1. For all available packages, see the orderable addendum at the end of the data sheet.

SPACE

1-Tone Spectrum, Input 240 MHz –3 dBFS

ADC14X250 D021_SLASE49.gif

Performance Stability Across
Temperature (240 MHz)

ADC14X250 D005_SLASE49.gif