JAJSNQ4 March   2023 ADC34RF52

PRODUCTION DATA  

  1. 1 特長
  2. 2 アプリケーション
  3. 3 概要
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Electrical Characteristics - Power Consumption
    6. 6.6  Electrical Characteristics - DC Specifications
    7. 6.7  Electrical Characteristics - AC Specifications (Dither DISABLED)
    8. 6.8  Electrical Characteristics - AC Specifications (Dither ENABLED)
    9. 6.9  Timing Requirements
    10. 6.10 Typical Characteristics
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Analog Inputs
        1. 7.3.1.1 Input Bandwidth and Full-Scale
        2. 7.3.1.2 Input Imbalance
        3. 7.3.1.3 Overrange Indication
        4. 7.3.1.4 Analog out-of-band dither
      2. 7.3.2 Sampling Clock Input
      3. 7.3.3 SYSREF
        1. 7.3.3.1 SYSREF Capture Detection
      4. 7.3.4 ADC Foreground Calibration
        1. 7.3.4.1 Calibration Control
        2. 7.3.4.2 ADC Switch
        3. 7.3.4.3 Calibration Configuration
      5. 7.3.5 Decimation Filter
        1. 7.3.5.1 Decimation Filter Response
        2. 7.3.5.2 Decimation Filter Configuration
        3. 7.3.5.3 20-bit Output Mode
        4. 7.3.5.4 Numerically Controlled Oscillator (NCO)
        5. 7.3.5.5 NCO Frequency programming using the SPI interface
        6. 7.3.5.6 Fast Frequency Hopping
          1. 7.3.5.6.1 Fast frequency hopping using the GPIO1/2 pins
          2. 7.3.5.6.2 Fast frequency hopping using GPIO1/2, SEN and SDATA pins
          3. 7.3.5.6.3 Fast frequency hopping using the fast SPI
      6. 7.3.6 JESD204B Interface
        1. 7.3.6.1 JESD204B Initial Lane Alignment (ILA)
          1. 7.3.6.1.1 SYNC Signal
        2. 7.3.6.2 JESD204B Frame Assembly
          1. 7.3.6.2.1 JESD204B Frame Assembly in Bypass Mode
          2. 7.3.6.2.2 JESD204B Frame Assembly with Real Decimation - Single Band
          3. 7.3.6.2.3 JESD204B Frame Assembly with Decimation - Single Band
          4. 7.3.6.2.4 JESD204B Frame Assembly with Decimation - Dual Band
        3. 7.3.6.3 SERDES Output MUX
      7. 7.3.7 Test Pattern
        1. 7.3.7.1 Transport Layer
        2. 7.3.7.2 Link Layer
        3. 7.3.7.3 Internal Capture Memory Buffer
    4. 7.4 Device Functional Modes
      1. 7.4.1 Bypass Mode
      2. 7.4.2 Digital Averaging
    5. 7.5 Programming
      1. 7.5.1 GPIO Pin Control
      2. 7.5.2 Configuration using the SPI interface
        1. 7.5.2.1 Register Write
        2. 7.5.2.2 Register Read
    6. 7.6 Register Maps
      1. 7.6.1 Detailed Register Description
  8. 8 Application Information Disclaimer
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Wideband RF Sampling Receiver
      2. 8.2.2 Design Requirements
        1. 8.2.2.1 Input Signal Path
        2. 8.2.2.2 Clocking
      3. 8.2.3 Detailed Design Procedure
        1. 8.2.3.1 Sampling Clock
      4. 8.2.4 Application Curves
    3. 8.3 Initialization Set Up
      1. 8.3.1 Initial Device Configuration After Power-Up
        1. 8.3.1.1  STEP 1: RESET
        2. 8.3.1.2  STEP 2: Device Configuration
        3. 8.3.1.3  STEP 3: JESD Interface Configuration (1)
        4. 8.3.1.4  STEP 4: SYSREF Synchronization
        5. 8.3.1.5  STEP 5: JESD Interface Configuration (2)
        6. 8.3.1.6  STEP 6: Analog Trim Settings
        7. 8.3.1.7  STEP 7: Calibration Configuration
        8. 8.3.1.8  STEP 8: SYSREF Synchronization
        9. 8.3.1.9  STEP 9: Run Power up Calibration
        10. 8.3.1.10 Step 10: JESD Interface Synchronization
    4. 8.4 Power Supply Recommendations
    5. 8.5 Layout
      1. 8.5.1 Layout Guidelines
      2. 8.5.2 Layout Example
  9. 9 Device and Documentation Support
    1. 9.1 ドキュメントの更新通知を受け取る方法
    2. 9.2 サポート・リソース
    3. 9.3 Trademarks
    4. 9.4 静電気放電に関する注意事項
    5. 9.5 用語集
  10. 10Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

7.3.7 Test Pattern

The ADC34RF52 provides several different options to output test patterns instead of the actual output data of the ADC to simplify the serial interface and system debug of the JESD204B digital interface link. The output data path is shown in Figure 7-41.

GUID-7320EDD0-778D-4A81-A3AA-A1FA87190E8A-low.gifFigure 7-41 Test Pattern Options

The available test patterns in each block are described in Table 7-41. Both test pattern blocks replace output data from the digital block (and not from the ADC); therefore, are available in decimation or decimation bypass mode.

Table 7-41 Test Pattern Overview
TEST PATTERN LOCATIONTYPE8b/10b encodedREGISTER PAGEREGISTER
TRANSPORT LAYERCUSTOM PATTERNYesJESD
0x05 0x04		0x2E, D0
TOGGLE 1010 PATTERNYes0x2E, D1
RAMP PATTERNYes0x2E, D2
PRBS PATTERN (27.. 231)Yes0x2F, D0
LINK LAYERJESD204B TEST PATTERNSDepends0x2D, D2-D0
PRBS PATTERN (27.. 231)No0x2F, D4

The RAMP pattern provides two different output options. Internally each ADC data bus consists of 4 parallel data streams (1 stream per serdes lane). The RAMP pattern is generated for each stream and a different starting value can be set for each stream. By default the starting values are 0. For example a LMFS mode using 2 lanes/ADC would show a slow ramp which increments once every 2 clock cycles with starting values set to 0 and ramp increment = 1. Also, a RAMP pattern which increments every clock cycle can be set using different starting values (that is, 0/1) for the 2 streams/lanes and setting the RAMP increment to 2. Table 7-42 shows how to enable the RAMP test pattern.

Table 7-42 Example Register Writes to Enable RAMP Test Pattern
ADDRDATADESCRIPTION
0x050x04Select JESD page
0x320x01Set lane DOUT1 starting value = 1
0x360x03Set lane DOUT3 starting value = 1
0x420x01Set lane DOUT5 starting value = 1
0x460x03Set lane DOUT7 starting value = 1
0x2E0x14Enable RAMP pattern, RAMP increment = 2