JAJSLC0 March 2024 ADC3683-SP
PRODMIX
To enable in-circuit testing of the digital interface, the following test patterns are supported and enabled via SPI register writes (0x14/0x15/0x16). The test pattern generator is located after the decimation filter as shown in Figure 7-44. In decimation mode (real and complex), the test patterns replace the output data of the DDC; however, channel A controls the test patterns for both channels.