JAJSLC0 March 2024 ADC3683-SP
PRODMIX
PARAMETER | TEST CONDITIONS | MIN | NOM | MAX | UNIT | |
---|---|---|---|---|---|---|
ADC Timing Specifications | ||||||
tAD | Aperture Delay | 0.85 | ns | |||
tA | Aperture Jitter | Square wave clock with fast edges | 180 | fs | ||
tJ | Jitter on DCLKIN | ± 50 (1) | ps | |||
tACQ | Signal acquisition period, referenced to sampling clock falling edge | FS = 10 Msps | -TS/2 | Sampling Clock Period | ||
FS = 25 Msps | -TS/2 | |||||
FS = 65 Msps | -TS/4 | |||||
tCONV | Signal conversion period, referenced to sampling clock falling edge | FS = 10 Msps | +TS × 1/5 | Sampling Clock Period | ||
FS = 25 Msps | +TS × 3/8 | |||||
FS = 65 Msps | +TS × 5/8 | |||||
Wake up time | Time to valid data after coming out of power down. Internal reference. | Bandgap reference enabled, single ended clock | us | |||
Bandgap reference enabled, differential clock | ||||||
Bandgap reference disabled, single ended clock | ms | |||||
Bandgap reference disabled, differential clock | ||||||
Time to valid data after coming out of power down. External 1.6V reference. |
Bandgap reference enabled, single ended clock | us | ||||
Bandgap reference enabled, differential clock | 100 | |||||
Bandgap reference disabled, single ended clock | ms | |||||
Bandgap reference disabled, differential clock | ||||||
tS,SYNC | Setup time for SYNC input signal | Referenced to sampling clock rising edge | 500 | ps | ||
tH,SYNC | Hold time for SYNC input signal | 600 | ||||
ADC Latency | Signal input to data output | SLVDS 2-wire | 2 | ADC clock cycles | ||
SLVDS 1-wire | 1 | |||||
SLVDS 1/2-wire | 1 | |||||
Add Latency | Real decimation by 2 | 21 | Output clock cycles | |||
Complex decimation by 2 | 22 | |||||
Real or complex decimation by 4, 8, 16, 32 | 23 | |||||
Interface Timing: Serial LVDS Interface | ||||||
tPD | Propagation delay: sampling clock falling edge to DCLK rising edge | Delay between sampling clock falling edge to DCLKIN falling edge < 2.5ns. TDCLK = DCLK period tCDCLK = Sampling clock falling edge to DCLKIN falling edge |
2 + TDCLK + tCDCLK | 3 + TDCLK + tCDCLK | 4 + TDCLK + tCDCLK | ns |
Delay between sampling clock falling edge to DCLKIN falling edge >= 2.5ns. TDCLK = DCLK period tCDCLK = Sampling clock falling edge to DCLKIN falling edge |
2 + tCDCLK | 3 + tCDCLK | 4 + tCDCLK | ns | ||
tCD | DCLK rising edge to output data delay, 2-wire SLVDS |
Fout = 10 MSPS, DA/B0,1 = 90 MBPS | 0 | 0.1 | ns | |
Fout = 65 MSPS, DA/B0,1 = 585 MBPS | 0 | 0.1 | ||||
DCLK rising edge to output data delay, 1-wire SLVDS |
Fout = 10 MSPS, DA/B0 = 180 MBPS | 0.1 | 0.2 | |||
Fout = 55 MSPS, DA/B0 = 990 MBPS | -0.4 | 0.1 | ||||
DCLK rising edge to output data delay, 1/2-wire SLVDS |
Fout = 5 MSPS, DA0 = 180 MBPS | 0 | 0.1 | |||
Fout = 25 MSPS, DA0 = 720 MBPS | 0 | 0.1 | ||||
tDV | Data valid, 2-wire SLVDS | Fout = 10 MSPS, DA/B0,1 = 90 MBPS | 10.5 | 10.7 | ns | |
Fout = 65 MSPS, DA/B0,1 = 585 MBPS | 1.3 | 1.4 | ||||
Data valid, 1-wire SLVDS | Fout = 10 MSPS, DA/B0 = 180 MBPS | 4.7 | 4.8 | |||
Fout = 55 MSPS, DA/B0 = 990 MBPS | 0.5 | 0.6 | ||||
Data valid, 1/2-wire SLVDS | Fout = 5 MSPS, DA0 = 180 MBPS | 4.7 | 4.8 | |||
Fout = 25 MSPS, DA0 = 900 MBPS | 0.6 | 0.7 | ||||
SERIAL PROGRAMMING INTERFACE (SCLK, SEN, SDIO) - Input | ||||||
fCLK(SCLK) | Serial clock frequency | 20 | MHz | |||
tSU(SEN) | SEN to rising edge of SCLK | 10 | ns | |||
tH(SEN) | SEN from rising edge of SCLK | 17 | ns | |||
tSU(SDIO) | SDIO to rising edge of SCLK | 17 | ns | |||
tH(SDIO) | SDIO from rising edge of SCLK | 10 | ns | |||
SERIAL PROGRAMMING INTERFACE (SDIO) - Output | ||||||
t(OZD) | SDIO output to driven | 19 | ns | |||
t(ODZ) | SDIO data to output | 17 | ns | |||
t(OD) | SDIO valid from falling edge of SCLK | 19 | ns |