SBAS520C February   2011  – June 2017 ADS4122 , ADS4125 , ADS4142 , ADS4145

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Device Family Comparison
  6. 6 Pin Configuration and Functions
  7. 7 Specifications
    1. 7.1  Absolute Maximum Ratings
    2. 7.2  ESD Ratings
    3. 7.3  Recommended Operating Conditions
    4. 7.4  Thermal Information
    5. 7.5  Electrical Characteristics: ADS412x
    6. 7.6  Electrical Characteristics: ADS414x
    7. 7.7  Electrical Characteristics: General
    8. 7.8  Digital Characteristics
    9. 7.9  Timing Requirements: LVDS and CMOS Modes
    10. 7.10 Serial Interface Timing Characteristics
    11. 7.11 Reset Timing Requirements
    12. 7.12 Timing Characteristics at Lower Sampling Frequencies
    13. 7.13 Typical Characteristics: ADS4122
    14. 7.14 Typical Characteristics: ADS4125
    15. 7.15 Typical Characteristics: ADS4142
    16. 7.16 Typical Characteristics: ADS4145
    17. 7.17 Typical Characteristics: Common
    18. 7.18 Typical Characteristics: Contour
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagrams
    3. 8.3 Feature Description
      1. 8.3.1 Digital Functions and Low-Latency Mode
      2. 8.3.2 Gain for SFDR, SNR Trade-Off
      3. 8.3.3 Offset Correction
      4. 8.3.4 Power-Down
        1. 8.3.4.1 Power-Down Global
        2. 8.3.4.2 Standby
        3. 8.3.4.3 Output Buffer Disable
        4. 8.3.4.4 Input Clock Stop
      5. 8.3.5 Output Data Format
    4. 8.4 Device Functional Modes
      1. 8.4.1 Digital Output Information
        1. 8.4.1.1 Output Interface
        2. 8.4.1.2 DDR LVDS Outputs
        3. 8.4.1.3 LVDS Output Data and Clock Buffers
        4. 8.4.1.4 Parallel CMOS Interface
        5. 8.4.1.5 CMOS Interface Power Dissipation
    5. 8.5 Programming
      1. 8.5.1 Device Configuration
      2. 8.5.2 Serial Interface
        1. 8.5.2.1 Register Initialization
      3. 8.5.3 Serial Register Readout
    6. 8.6 Register Maps
      1. 8.6.1 Serial Register Map
      2. 8.6.2 Description of Serial Registers
  9. 9 Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 Analog Input
        1. 9.1.1.1 Drive Circuit Requirements
        2. 9.1.1.2 Driving Circuit
        3. 9.1.1.3 Input Common-Mode
      2. 9.1.2 Clock Input
      3. 9.1.3 Input Overvoltage Indication (OVR Pin)
      4. 9.1.4 Using the ADS41xx at Low Sampling Rates
        1. 9.1.4.1 ADS412x (12-Bit Device)
        2. 9.1.4.2 ADS414x (14-Bit Device)
        3. 9.1.4.3 Power Consumption at Low Sampling Rates
        4. 9.1.4.4 Output Timing at Low Sampling Rates
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
        1. 9.2.2.1 Analog Input
        2. 9.2.2.2 Clock Driver
        3. 9.2.2.3 Digital Interface
      3. 9.2.3 Application Curve
  10. 10Power Supply Recommendations
    1. 10.1 Sharing DRVDD and AVDD Supplies
    2. 10.2 Using DC-DC Power Supplies
    3. 10.3 Power Supply Bypassing
  11. 11Layout
    1. 11.1 Layout Guidelines
      1. 11.1.1 Grounding
      2. 11.1.2 Supply Decoupling
      3. 11.1.3 Exposed Pad
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Device Support
      1. 12.1.1 Device Nomenclature
    2. 12.2 Documentation Support
      1. 12.2.1 Related Documentation
    3. 12.3 Related Links
    4. 12.4 Receiving Notification of Documentation Updates
    5. 12.5 Community Resources
    6. 12.6 Trademarks
    7. 12.7 Electrostatic Discharge Caution
    8. 12.8 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

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メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

12 Device and Documentation Support

12.1 Device Support

12.1.1 Device Nomenclature

    Analog Bandwidth The analog input frequency at which the power of the fundamental is reduced by 3 dB with respect to the low-frequency value.
    Aperture Delay The delay in time between the rising edge of the input sampling clock and the actual time at which the sampling occurs.

    This delay is different across channels. The maximum variation is specified as aperture delay variation (channel-to-channel).

    Aperture Uncertainty (Jitter) The sample-to-sample variation in aperture delay.
    Clock Pulse Width/Duty Cycle The duty cycle of a clock signal is the ratio of the time the clock signal remains at a logic high (clock pulse width) to the period of the clock signal.

    Duty cycle is typically expressed as a percentage. A perfect differential sine-wave clock results in a 50% duty cycle.

    Maximum Conversion Rate The maximum sampling rate at which specified operation is given.

    All parametric testing is performed at this sampling rate unless otherwise noted.

    Minimum Conversion Rate The minimum sampling rate at which the ADC functions.
    Differential Nonlinearity (DNL) The DNL is the deviation of any single step from this ideal value, measured in units of LSBs.

    An ideal ADC exhibits code transitions at analog input values spaced exactly 1 LSB apart.

    Integral Nonlinearity (INL) The INL is the deviation of the ADC transfer function from a best fit line determined by a least squares curve fit of that transfer function, measured in units of LSBs.
    Gain Error Gain error is the deviation of the ADC actual input full-scale range from its ideal value.

    The gain error is given as a percentage of the ideal input full-scale range. Gain error has two components: error as a result of reference inaccuracy and error as a result of the channel. Both errors are specified independently as EGREF and EGCHAN.

    To a first-order approximation, the total gain error is ETOTAL ~ EGREF + EGCHAN.

    For example, if ETOTAL = ±0.5%, the full-scale input varies from (1 – 0.5/100) × FSideal to (1 + 0.5/100) × FSideal.

    Offset Error The offset error is the difference, given in number of LSBs, between the ADC actual average idle channel output code and the ideal average idle channel output code.

    This quantity is often mapped into millivolts.

    Temperature Drift The temperature drift coefficient (with respect to gain error and offset error) specifies the change per degree Celsius of the parameter from TMIN to TMAX.

    It is calculated by dividing the maximum deviation of the parameter across the TMIN to TMAX range by the difference TMAX – TMIN.

    Signal-to-Noise Ratio SNR is the ratio of the power of the fundamental (PS) to the noise floor power (PN), excluding the power at DC and the first nine harmonics.
    Equation 2. ADS4122 ADS4125 ADS4142 ADS4145 q_snr_las635.gif

    SNR is either given in units of dBc (dB to carrier) when the absolute power of the fundamental is used as the reference, or dBFS (dB to full-scale) when the power of the fundamental is extrapolated to the converter full-scale range.

    Signal-to-Noise and Distortion (SINAD) SINAD is the ratio of the power of the fundamental (PS) to the power of all the other spectral components including noise (PN) and distortion (PD), but excluding DC.
    Equation 3. ADS4122 ADS4125 ADS4142 ADS4145 q_sinad_las635.gif

    SINAD is either given in units of dBc (dB to carrier) when the absolute power of the fundamental is used as the reference, or dBFS (dB to full-scale) when the power of the fundamental is extrapolated to the converter full-scale range.

    Effective Number of Bits (ENOB) ENOB is a measure of the converter performance as compared to the theoretical limit based on quantization noise.
    Equation 4. ADS4122 ADS4125 ADS4142 ADS4145 q_enob_las635.gif
    Total Harmonic Distortion (THD) THD is the ratio of the power of the fundamental (PS) to the power of the first nine harmonics (PD).
    Equation 5. ADS4122 ADS4125 ADS4142 ADS4145 q_thd_las635.gif

    THD is typically given in units of dBc (dB to carrier).

    Spurious-Free Dynamic Range (SFDR) The ratio of the power of the fundamental to the highest other spectral component (either spur or harmonic).

    SFDR is typically given in units of dBc (dB to carrier).

    Two-Tone Intermodulation Distortion IMD3 is the ratio of the power of the fundamental (at frequencies f1 and f2) to the power of the worst spectral component at either frequency 2f1 – f2 or 2f2 – f1.

    IMD3 is either given in units of dBc (dB to carrier) when the absolute power of the fundamental is used as the reference, or dBFS (dB to full-scale) when the power of the fundamental is extrapolated to the converter full-scale range.

    DC Power-Supply Rejection Ratio (DC PSRR) DC PSSR is the ratio of the change in offset error to a change in analog supply voltage.

    The dc PSRR is typically given in units of mV/V.

    AC Power-Supply Rejection Ratio (AC PSRR) AC PSRR is the measure of rejection of variations in the supply voltage by the ADC.

    If ΔVSUP is the change in supply voltage and ΔVOUT is the resultant change of the ADC output code (referred to the input), then:

    Equation 6. ADS4122 ADS4125 ADS4142 ADS4145 q_psrr_las635.gif
    Voltage Overload Recovery The number of clock cycles taken to recover to less than 1% error after an overload on the analog inputs.

    This is tested by separately applying a sine wave signal with 6-dB positive and negative overload. The deviation of the first few samples after the overload (from the expected values) is noted.

    Common-Mode Rejection Ratio (CMRR) CMRR is the measure of rejection of variation in the analog input common-mode by the ADC.

    If ΔVCM_IN is the change in the common-mode voltage of the input pins and ΔVOUT is the resulting change of the ADC output code (referred to the input), then:

    Equation 7. ADS4122 ADS4125 ADS4142 ADS4145 q_cmrr_las635.gif
    Crosstalk (only for multi-channel ADCs) This is a measure of the internal coupling of a signal from an adjacent channel into the channel of interest. It is specified separately for coupling from the immediate neighboring channel (near-channel) and for coupling from channel across the package (far-channel).

    It is usually measured by applying a full-scale signal in the adjacent channel. Crosstalk is the ratio of the power of the coupling signal (as measured at the output of the channel of interest) to the power of the signal applied at the adjacent channel input. It is typically expressed in dBc.

12.2 Documentation Support

12.2.1 Related Documentation

For Related documentation, see the following:

12.3 Related Links

The table below lists quick access links. Categories include technical documents, support and community resources, tools and software, and quick access to order now.

Table 11. Related Links

PARTS PRODUCT FOLDER ORDER NOW TECHNICAL DOCUMENTS TOOLS & SOFTWARE SUPPORT & COMMUNITY
ADS4122 Click here Click here Click here Click here Click here
ADS4125 Click here Click here Click here Click here Click here
ADS4142 Click here Click here Click here Click here Click here
ADS4145 Click here Click here Click here Click here Click here

12.4 Receiving Notification of Documentation Updates

To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper right corner, click on Alert me to register and receive a weekly digest of any product information that has changed. For change details, review the revision history included in any revised document.

12.5 Community Resources

The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use.

    TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve problems with fellow engineers.
    Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and contact information for technical support.

12.6 Trademarks

E2E is a trademark of Texas Instruments.

All other trademarks are the property of their respective owners.

12.7 Electrostatic Discharge Caution

esds-image

These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates.

12.8 Glossary

SLYZ022 — TI Glossary.

This glossary lists and explains terms, acronyms, and definitions.