at TA = 25°C (unless otherwise noted)(1) | MIN | MAX | UNIT |
---|
AVDD to AGND | –0.3 | 7.0 | V |
DVDD to AGND | –0.3 | 7.0 | V |
Analog input voltage to AGND(2) | –15 | 15 | V |
Digital input to AGND | –0.3 | DVDD + 0.3 | V |
REFIN to AGND | –0.3 | AVDD + 0.3 | V |
Input current to any pin except supplies(2) | –10 | 10 | mA |
Temperature | Operating | –40 | 125 | °C |
Junction, TJ | | 150 |
Storage, Tstg | –65 | 150 |
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) Transient currents of up to 100 mA do not cause SCR latch-up.