SBAS686 July   2015 ADS8694 , ADS8698

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Device Comparison Table
  6. 6 Pin Configuration and Functions
  7. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Timing Requirements: Serial Interface
    7. 7.7 Typical Characteristics
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1  Analog Inputs
      2. 8.3.2  Analog Input Impedance
      3. 8.3.3  Input Overvoltage Protection Circuit
      4. 8.3.4  Programmable Gain Amplifier (PGA)
      5. 8.3.5  Second-Order, Low-Pass Filter (LPF)
      6. 8.3.6  ADC Driver
      7. 8.3.7  Multiplexer (MUX)
      8. 8.3.8  Reference
        1. 8.3.8.1 Internal Reference
        2. 8.3.8.2 External Reference
      9. 8.3.9  Auxiliary Channel
        1. 8.3.9.1 Input Driver for the AUX Channel
      10. 8.3.10 ADC Transfer Function
      11. 8.3.11 Alarm Feature
    4. 8.4 Device Functional Modes
      1. 8.4.1 Device Interface
        1. 8.4.1.1 Digital Pin Description
          1. 8.4.1.1.1 CS (Input)
          2. 8.4.1.1.2 SCLK (Input)
          3. 8.4.1.1.3 SDI (Input)
          4. 8.4.1.1.4 SDO (Output)
          5. 8.4.1.1.5 DAISY (Input)
          6. 8.4.1.1.6 RST/PD (Input)
        2. 8.4.1.2 Data Acquisition Example
        3. 8.4.1.3 Host-to-Device Connection Topologies
          1. 8.4.1.3.1 Daisy-Chain Topology
          2. 8.4.1.3.2 Star Topology
      2. 8.4.2 Device Modes
        1. 8.4.2.1 Continued Operation in the Selected Mode (NO_OP)
        2. 8.4.2.2 Frame Abort Condition (FRAME_ABORT)
        3. 8.4.2.3 STANDBY Mode (STDBY)
        4. 8.4.2.4 Power-Down Mode (PWR_DN)
        5. 8.4.2.5 Auto Channel Enable with Reset (AUTO_RST)
        6. 8.4.2.6 Manual Channel n Select (MAN_Ch_n)
        7. 8.4.2.7 Channel Sequencing Modes
        8. 8.4.2.8 Reset Program Registers (RST)
    5. 8.5 Register Maps
      1. 8.5.1 Command Register Description
      2. 8.5.2 Program Register Description
        1. 8.5.2.1 Program Register Read/Write Operation
        2. 8.5.2.2 Program Register Map
        3. 8.5.2.3 Program Register Descriptions
          1. 8.5.2.3.1 Auto-Scan Sequencing Control Registers
            1. 8.5.2.3.1.1 Auto-Scan Sequence Enable Register (address = 01h)
            2. 8.5.2.3.1.2 Channel Power Down Register (address = 02h)
          2. 8.5.2.3.2 Device Features Selection Control Register (address = 03h)
          3. 8.5.2.3.3 Range Select Registers (addresses 05h-0Ch)
          4. 8.5.2.3.4 Alarm Flag Registers (Read-Only)
            1. 8.5.2.3.4.1 ALARM Overview Tripped-Flag Register (address = 10h)
            2. 8.5.2.3.4.2 Alarm Flag Registers: Tripped and Active (address = 11h to 14h)
          5. 8.5.2.3.5 Alarm Threshold Setting Registers
          6. 8.5.2.3.6 Command Read-Back Register (address = 3Fh)
  9. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Applications
      1. 9.2.1 Phase-Compensated, 8-Channel, Multiplexed Data Acquisition System for Power Automation
        1. 9.2.1.1 Design Requirements
        2. 9.2.1.2 Detailed Design Procedure
      2. 9.2.2 18-Bit, 8-Channel, Integrated Analog Input Module for Programmable Logic Controllers (PLCs)
        1. 9.2.2.1 Design Requirements
        2. 9.2.2.2 Detailed Design Procedure
  10. 10Power-Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Documentation Support
      1. 12.1.1 Related Documentation
    2. 12.2 Related Links
    3. 12.3 Community Resources
    4. 12.4 Trademarks
    5. 12.5 Electrostatic Discharge Caution
    6. 12.6 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

12 Device and Documentation Support

12.1 Documentation Support

12.1.1 Related Documentation

For related documentation see the following:

  • LM5017 Data Sheet, SNVS783
  • OPA320 Data Sheet, SBOS513
  • REF5040 Data Sheet, SBOS410F
  • AN-2029 - Handling & Process Recommendations, SNOA550B
  • TIDA-00164 Verified Design Reference Guide: 16-Bit, 8-Channel, Integrated Analog Input Module for Programmable Logic Controllers (PLCs), TIDU365
  • TIPD167 Verified Design Reference Guide: Phase Compensated 8-Channel, Multiplexed Data Acquisition System for Power Automation, TIDU427

12.2 Related Links

The table below lists quick access links. Categories include technical documents, support and community resources, tools and software, and quick access to sample or buy.

Table 27. Related Links

PARTS PRODUCT FOLDER SAMPLE & BUY TECHNICAL DOCUMENTS TOOLS & SOFTWARE SUPPORT & COMMUNITY
ADS8694 Click here Click here Click here Click here Click here
ADS8698 Click here Click here Click here Click here Click here

12.3 Community Resources

The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use.

    TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve problems with fellow engineers.
    Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and contact information for technical support.

12.4 Trademarks

E2E is a trademark of Texas Instruments.

SPI is a trademark of Motorola.

Fly-Buck is a trademark of Texas Instruments, Inc.

All other trademarks are the property of their respective owners.

12.5 Electrostatic Discharge Caution

esds-image

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

12.6 Glossary

SLYZ022 — TI Glossary.

This glossary lists and explains terms, acronyms, and definitions.