JAJSP59B January   2023  – May 2024 ADS9218 , ADS9219

PRODMIX  

  1.   1
  2. 1 特長
  3. 2 アプリケーション
  4. 3 概要
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  Thermal Information
    4. 5.4  Recommended Operating Conditions
    5. 5.5  Electrical Characteristics
    6. 5.6  Timing Requirements
    7. 5.7  Switching Characteristics
    8. 5.8  Timing Diagrams
    9. 5.9  Typical Characteristics: All Devices
    10. 5.10 Typical Characteristics: ADS9219
    11. 5.11 Typical Characteristics: ADS9218
    12. 5.12 Typical Characteristics: ADS9217
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Analog Inputs
      2. 6.3.2 Analog Input Bandwidth
      3. 6.3.3 ADC Transfer Function
      4. 6.3.4 Reference Voltage
      5. 6.3.5 Temperature Sensor
      6. 6.3.6 Data Averaging
      7. 6.3.7 Digital Down Converter
      8. 6.3.8 Data Interface
        1. 6.3.8.1 Data Frame Width
        2. 6.3.8.2 Synchronizing Multiple ADCs
        3. 6.3.8.3 Test Patterns for Data Interface
          1. 6.3.8.3.1 Fixed Pattern
          2. 6.3.8.3.2 Alternating Test Pattern
          3. 6.3.8.3.3 Digital Ramp
      9. 6.3.9 ADC Sampling Clock Input
    4. 6.4 Device Functional Modes
      1. 6.4.1 Reset
      2. 6.4.2 Power-Down Options
      3. 6.4.3 Normal Operation
      4. 6.4.4 Initialization Sequence
    5. 6.5 Programming
      1. 6.5.1 Register Write
      2. 6.5.2 Register Read
      3. 6.5.3 Multiple Devices: Daisy-Chain Topology for SPI Configuration
        1. 6.5.3.1 Register Write With Daisy-Chain
        2. 6.5.3.2 Register Read With Daisy-Chain
  8. 7 Register Map
    1. 7.1 Register Bank 0
    2. 7.2 Register Bank 1
    3. 7.3 Register Bank 2
  9. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Applications
      1. 8.2.1 Data Acquisition (DAQ) Circuit for ≤20kHz Input Signal Bandwidth
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Design Procedure
        3. 8.2.1.3 Application Curves
      2. 8.2.2 Data Acquisition (DAQ) Circuit for ≤100kHz Input Signal Bandwidth
        1. 8.2.2.1 Design Requirements
        2. 8.2.2.2 Application Curves
      3. 8.2.3 Data Acquisition (DAQ) Circuit for ≤1MHz Input Signal Bandwidth
        1. 8.2.3.1 Design Requirements
        2. 8.2.3.2 Application Curves
    3. 8.3 Power Supply Recommendations
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 ドキュメントの更新通知を受け取る方法
    3. 9.3 サポート・リソース
    4. 9.4 Trademarks
    5. 9.5 静電気放電に関する注意事項
    6. 9.6 用語集
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information
    1. 11.1 Mechanical Data

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報
6.3.8.3.2 Alternating Test Pattern

The ADC outputs alternating test patterns defined in the TP0_A, TP1_A and TP0_B, TP1_B registers in place of ADC A and ADC B data, respectively.

  • Configure the test patterns in TP0_A, TP1_A, TP0_B, and TP1_B
  • Set TP_EN_A = 1, TP_MODE_A = 3 (address = 0x13), TP_EN_B = 1, and TP_MODE_B = 3 (address = 0x18)