JAJSRA2A December   2022  – September 2023 AFE11612-SEP

PRODUCTION DATA  

  1.   1
  2. 1 特長
  3. 2 アプリケーション
  4. 3 概要
  5. 4 Revision History
  6. 5 Pin Configuration and Functions
  7. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Electrical Characteristics
    6. 6.6  Timing Characteristics
    7. 6.7  Timing Diagrams
    8. 6.8  Typical Characteristics: DAC
    9. 6.9  Typical Characteristics: ADC
    10. 6.10 Typical Characteristics: Internal Reference
    11. 6.11 Typical Characteristics: Temperature Sensor
    12. 6.12 Typical Characteristics: Digital Inputs
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Primary ADC Operation
        1. 7.3.1.1 Analog Inputs
          1. 7.3.1.1.1 Single-Ended Analog Input
          2. 7.3.1.1.2 Fully Differential Input
        2. 7.3.1.2 ADC Trigger Signals (See AFE configuration register 0 )
        3. 7.3.1.3 Double-Buffered ADC Data Registers
          1. 7.3.1.3.1 ADC Data Format
        4. 7.3.1.4 SCLK Clock Noise Reduction
        5. 7.3.1.5 Data Available Pin (DAV)
        6. 7.3.1.6 Convert Pin (CNVT)
        7. 7.3.1.7 Analog Input Out-of-Range Detection (See The Analog Input Out-of-Range Alarm Section)
        8. 7.3.1.8 Full-Scale Range of the Analog Input
      2. 7.3.2 Secondary ADC and Temperature Sensor Operation
        1. 7.3.2.1 Remote Sensing Diode
        2. 7.3.2.2 Ideality Factor
        3. 7.3.2.3 Filtering
        4. 7.3.2.4 Series Resistance Cancellation
        5. 7.3.2.5 Reading Temperature Data
        6. 7.3.2.6 Conversion Time
      3. 7.3.3 Reference Operation
        1. 7.3.3.1 Internal Reference
        2. 7.3.3.2 External Reference
      4. 7.3.4 DAC Operation
        1. 7.3.4.1 Resistor String
        2. 7.3.4.2 DAC Output
          1. 7.3.4.2.1 Full-Scale Output Range
          2. 7.3.4.2.2 DAC Output After Power-On Reset
        3. 7.3.4.3 Double-Buffered DAC Data Registers
        4. 7.3.4.4 Load DAC Latch
        5. 7.3.4.5 Synchronous Output Updating
        6. 7.3.4.6 Clear DACs
        7. 7.3.4.7 DAC Output Thermal Protection
      5. 7.3.5 Alarm Operation
        1. 7.3.5.1 Analog Input Out-of-Range Alarm
        2. 7.3.5.2 ALARM Pin
        3. 7.3.5.3 Hysteresis
        4. 7.3.5.4 False-Alarm Protection
      6. 7.3.6 General-Purpose Input and Output Pins (GPIO-0 To GPIO-7)
      7. 7.3.7 Device Reset Options
        1. 7.3.7.1 Hardware Reset
        2. 7.3.7.2 Software Reset
        3. 7.3.7.3 Power-On Reset (POR)
    4. 7.4 Device Functional Modes
      1. 7.4.1 DAC Output Mode
      2. 7.4.2 ADC Conversion Modes
        1. 7.4.2.1 Programmable Conversion Rate
        2. 7.4.2.2 Handshaking with the Host (See AFE configuration register 0 )
    5. 7.5 Programming
      1. 7.5.1 I2C-Compatible Interface
        1. 7.5.1.1 F/S-Mode Protocol
        2. 7.5.1.2 Hs-Mode Protocol
        3. 7.5.1.3 Address Pointer
        4. 7.5.1.4 Timeout Function
        5. 7.5.1.5 Device Communication Protocol For I2C
          1. 7.5.1.5.1 Writing A Single Register ( )
          2. 7.5.1.5.2 Writing Multiple Registers ( )
          3. 7.5.1.5.3 Reading a Single Register ( )
          4. 7.5.1.5.4 Reading Multiple Registers ( and )
      2. 7.5.2 Serial Peripheral Interface (SPI)
        1. 7.5.2.1 SPI Shift Register
        2. 7.5.2.2 SPI Communications Command
        3. 7.5.2.3 Standalone Operation
        4. 7.5.2.4 Daisy-Chain Operation
    6. 7.6 Register Maps
      1. 7.6.1  Temperature Data Registers (Read-Only)
        1. 7.6.1.1 LT-Temperature-Data (LT_TEMP) Register (address = 00h) [reset = 0000h, 0°C]
        2. 7.6.1.2 D1-Temperature-Data (D1_TEMP) Register (address = 01h) [reset = 0000h, 0°C]
        3. 7.6.1.3 D2-Temperature-Data (D2_TEMP) Register (address = 02h) [reset = 0000h, 0°C]
      2. 7.6.2  Temperature Configuration (TEMP_CONFIG) Register (address = 0Ah) [reset = 003Ch or 3CFFh]
      3. 7.6.3  Temperature Conversion Rate (TEMP_CONV_RATE) Register (address = 0Bh) [reset = 0007h or 07FFh]
      4. 7.6.4  η-Factor Correction Registers: D1_N_ADJUST and D2_N_ADJUST (address = 21h and 22h) [reset = 0000h or 00FFh]
      5. 7.6.5  ADC-n-Data (ADC_n) Registers (addresses = 23h to 32h) [reset = 0000h]
      6. 7.6.6  DAC-n-Data (DAC_n) Registers (addresses = 33h to 3Eh) [reset = 0000h)
      7. 7.6.7  DAC-n-CLR-Setting (DAC_n_CLR) Registers (addresses = 3Fh to 4Ah) [reset = 0000h]
      8. 7.6.8  GPIO Register (address = 4Bh) [reset = 00FFh]
      9. 7.6.9  AFE Configuration Register 0 (AFE_CONFIG_0) (address = 4Ch) [reset = 2000h]
      10. 7.6.10 AFE Configuration Register 1 (AFE_CONFIG_1) (Address = 4Dh) [reset = 0070h]
      11. 7.6.11 Alarm Control Register (ALR_CTRL) (address = 4Eh) [reset = 0000h]
      12. 7.6.12 STATUS Register (Address = 4Fh) [reset = 0000h]
      13. 7.6.13 ADC Channel Register 0 (ADC_CH0) (address = 50h) [reset = 0000h]
      14. 7.6.14 ADC Channel Register 1 (ADC_CH1) (address = 51h) [reset = 0000h]
      15. 7.6.15 ADC Gain Register (ADC_GAIN) (address = 52h) [reset = FFFFh]
      16. 7.6.16 AUTO_DAC_CLR_SOURCE Register (address = 53h) [reset = 0004h]
      17. 7.6.17 AUTO_DAC_CLR_EN Register (address = 54h) [reset = 0000h]
      18. 7.6.18 SW_DAC_CLR Register (address = 55h) [reset = 0000h]
      19. 7.6.19 HW_DAC_CLR_EN_0 Register (address = 56h) [reset = 0000h]
      20. 7.6.20 HW_DAC_CLR_EN_1 Register (address = 57h) [reset = 0000h]
      21. 7.6.21 DAC Configuration (DAC_CONFIG) Register (address = 58h) [reset = 0000h]
      22. 7.6.22 DAC Gain (DAC_GAIN) Register (address = 59h) [reset = 0000h]
      23. 7.6.23 Analog Input Channel Threshold Registers (addresses = 5Ah To 61h)
        1. 7.6.23.1 Input-n-High-Threshold Register (where n = 0, 1, 2, 3; addresses: 0 = 5Ah, 1 = 5Ch, 2 = 5Eh, 3 = 60h) [reset = 0FFFh]
        2. 7.6.23.2 Input-n-Low-Threshold Register (where n = 0, 1, 2, 3; addresses: 0 = 5Bh, 1 = 5Dh, 2 = 5Fh, 3 = 61h) (reset = 0000h)
      24. 7.6.24 Temperature Threshold Registers
        1. 7.6.24.1 LT_HIGH_THRESHOLD Register (address = 62h) [reset = 07FFh, +255.875°C]
        2. 7.6.24.2 LT_LOW_THRESHOLD Register (address = 63h) [reset = 0800h, –256°C]
        3. 7.6.24.3 D1_HIGH_THRESHOLD Register (address = 64h) [reset = 07FFh, +255.875°C]
        4. 7.6.24.4 D1_LOW_THRESHOLD Register (address = 65h) [reset = 0800h, –256°C]
        5. 7.6.24.5 D2_HIGH_THRESHOLD Register (address = 66h) [reset = 07FFh, +255.875°C]
        6. 7.6.24.6 D2_LOW_THRESHOLD Register (address = 67h) [reset = 0800h, –256°C]
      25. 7.6.25 Hysteresis Registers
        1. 7.6.25.1 Hysteresis Register 0 (HYST_0) (address = 68h) [reset = 0810h, 8 LSB]
        2. 7.6.25.2 Hysteresis Register 1 (HYST_1) (address = 69h) [reset = 0810h, 8 LSB]
        3. 7.6.25.3 Hysteresis Register 2 (HYST_2) (address = 6Ah) [reset = 2108h, 8°C]
      26. 7.6.26 Power-Down Register (PWR_DOWN) (address = 6Bh) [reset = 0000h)
      27. 7.6.27 Device ID Register (DEVICE_ID) (read only address = 6Ch) [reset = 1220h]
      28. 7.6.28 Software Reset (SW_RST) Register (read or write address = 7Ch) [reset = N/A)
        1. 7.6.28.1 SPI Mode
        2. 7.6.28.2 I2C Mode
  9. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
        1. 8.2.2.1 Sequencing
        2. 8.2.2.2 Negative GaN Biasing
        3. 8.2.2.3 VDRAIN Monitoring
      3. 8.2.3 Application Curves
    3. 8.3 Power Supply Recommendations
      1. 8.3.1 Power-Supply Sequence
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Diagram
  10. 9 Device and Documentation Support
    1. 9.1 Documentation Support
    2. 9.2 ドキュメントの更新通知を受け取る方法
    3. 9.3 サポート・リソース
    4. 9.4 Trademarks
    5. 9.5 静電気放電に関する注意事項
    6. 9.6 用語集
  11. 10Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

8.2.2.2 Negative GaN Biasing

The AFE11612-SEP features twelve 12-bit DACs. The device has an internal 2.5‑V reference that scales the DAC output range from 0 V to 5 V. GaN PAs require negative gate voltage to be properly biased, with pinch-off voltages being more negative than the on voltages. The DAC output can be converted to a negative voltage through the use of a differential op-amp circuit that is powered by a negative power supply (VSS). The following circuit uses the op-amp OPA4H199-SEP to offset and scale the 5-V output range to –7.5 V to 0 V. A differential op-amp circuit is used to protect the PA in case of an alarm shutdown. In an alarm state, the DAC drives the voltage to 0 V. The differential circuit outputs –7.5 V to the GaN gate, making sure that the GaN PA turns off.

CAUTION: The use of an inverting amplifier configuration is not recommended as the off state drives the output to 0 V, which can damage the PA in an alarm state.

The AFE11612-SEP 2.5‑V reference output provides the offset voltage for the differential circuit. The resistors in the circuit were selected with the purpose of providing a –7.5 V to 0 V output range, while not significantly loading VREF. The OPA4H199-SEP has a 40-V supply range, and the circuit can be modified to support greater negative-voltage applications if needed.

GUID-20230805-SS0I-BFGS-NFS8-B6ZTHLGQT8SH-low.svg Figure 8-3 Differential Operational Amplifier Circuit