SBFS042 June   2020 AFE3010

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
    1.     Device Images
      1.      GFCI Application
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
    1.     Pin Functions
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Typical Characteristics
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Powering The AFE3010
      2. 7.3.2 Sensing Amplifier
      3. 7.3.3 Noise Filter
      4. 7.3.4 ALARM (LED) Driver
      5. 7.3.5 Phase Detection
      6. 7.3.6 SCR Control
      7. 7.3.7 Self-Test Function
        1. 7.3.7.1 Periodic Self-Test
        2. 7.3.7.2 Continuous Self-Test
    4. 7.4 Device Functional Modes
      1. 7.4.1 Pin Configuration
      2. 7.4.2 ALARM Modes to Drive LED
  8. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Manual Self-Test Using PTT Pin
        1. 8.1.1.1 Successful Self-Test
        2. 8.1.1.2 Unsuccessful Self-Test
      2. 8.1.2 ALARM and RESET Function With SW_OPEN
        1. 8.1.2.1 No Self-Test Fail Event
        2. 8.1.2.2 Self-Test Fail Event
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curves
    3. 8.3 What to Do and What Not to Do
  9. 9 Power Supply Recommendations
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  11. 11Device and Documentation Support
    1. 11.1 Receiving Notification of Documentation Updates
    2. 11.2 Support Resources
    3. 11.3 Trademarks
    4. 11.4 Electrostatic Discharge Caution
    5. 11.5 Glossary
  12. 12Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

8.3 What to Do and What Not to Do

Do:

  • Check that the system can pass its own periodic self-test before performing system testing and characterization.
  • Make R8 small enough so the AFE3010 can pass a self-test even when there is some small leakage current and the line is connected with reverse polarity.
  • Make R5 large enough so that the NG_OUT driver current does not burn or break the 200-turn coil.
  • Make R5 large enough so that the NG_OUT pin voltage does not drop below –0.3 V or does not sink more 5 mA of current during inductive kickback.
  • Always re-test the trip point and N-G detection whenever making changes to the system component values.
  • Place filter capacitors as close a possible to the device pins, especially for the amplifier, VDD, PH, PTT, and SW_OPEN pins.