over operating junction temperature range (unless otherwise noted)(1)(2)
PARAMETER |
MIN |
MAX |
UNIT |
VDD_CORE |
Core supply |
–0.3 |
1.05 |
V |
VDDR_CORE |
RAM core Supply |
–0.3 |
1.05 |
V |
VDD_CANUART |
CANUART core supply |
–0.3 |
1.05 |
V |
VDDR_CANUART |
CANUART RAM core supply |
–0.3 |
1.05 |
V |
VDDA_CORE_USB |
USB0 core supply |
–0.3 |
1.05 |
V |
VDDS_OSC0 |
MCU_OSC0, OSC1, and WKUP_LFOSC0 supply |
–0.3 |
1.98 |
V |
VDDA_MCU |
MCU PLL, RC Oscillator, Suplly Detectors analog supply |
–0.3 |
1.98 |
V |
VDDA_PLL0 |
Main PLL analog supply |
–0.3 |
1.98 |
V |
VDDA_PLL1 |
Audio PLL analog supply |
–0.3 |
1.98 |
V |
VDDA_PLL2 |
C7x PLL analog supply |
–0.3 |
1.98 |
V |
VDDA_ADC0 |
ADC analog supply |
–0.3 |
1.98 |
V |
VDDA_1P8_USB |
USB0 1.8 V analog supply |
–0.3 |
1.98 |
V |
VDDA_TEMP0 |
Analog supply for temperature sensor 0 |
–0.3 |
1.98 |
V |
VDDA_TEMP1 |
Analog supply for temperature sensor 1 |
–0.3 |
1.98 |
V |
VPP |
eFuse ROM programming supply |
–0.3 |
1.98 |
V |
VDDSHV_MCU |
IO supply for IO group MCU |
–0.3 |
3.63 |
V |
VDDSHV_CANUART |
IO supply for IO group CANUART |
–0.3 |
3.63 |
V |
VDDSHV0 |
IO supply for IO group 0 |
–0.3 |
3.63 |
V |
VDDSHV1 |
IO supply for IO group 1 |
–0.3 |
3.63 |
V |
VDDSHV2 |
IO supply for IO group 2 |
–0.3 |
3.63 |
V |
VDDSHV3 |
IO supply for IO group 3 |
–0.3 |
3.63 |
V |
VDDSHV5 |
IO supply for IO group 5 |
–0.3 |
3.63 |
V |
VDDA_3P3_USB |
USB0 3.3 V analog supply |
–0.3 |
3.63 |
V |
Steady-state max voltage at all fail-safe IO pins |
MCU_PORz |
–0.3 |
3.63 |
V |
WKUP_I2C0_SDA and WKUP_I2C0_SCL, EXTINTn When operating at 1.8 V |
–0.3 |
1.98(3) |
V |
WKUP_I2C0_SDA and WKUP_I2C0_SCL, EXTINTn When operating at 3.3 V |
–0.3 |
3.63(3) |
v |
VMON_1P8_SOC |
–0.3 |
1.98 |
V |
VMON_3P3_SOC |
–0.3 |
3.63 |
V |
VMON_ER_VSYS |
–0.3(4) |
1.98 |
V |
Steady-state max voltage at all other IO pins(5) |
USB0_VBUS(6) |
–0.3 |
3.6 |
V |
All other IO pins |
–0.3 |
IO supply voltage + 0.3 |
V |
Transient overshoot and undershoot at IO pin |
20% of IO supply voltage for up to 20% of the signal period |
|
0.2 × VDD(7) |
V |
Latch-up performance(8) |
I-Test |
–100 |
100 |
mA |
Over-Voltage (OV) Test |
|
1.5 × VDD(7) |
V |
Storage temperature |
Tstg |
–55 |
150 |
°C |
(1) Operation outside the Absolute Maximum Ratings may cause permanent device damage. Absolute Maximum Ratings do not imply functional operation of the device at these or any other conditions beyond those listed under Recommended Operating Conditions. If used outside the Recommended Operating Conditions but within the Absolute Maximum Ratings, the device may not be fully functional, and this may affect device reliability, functionality, performance, and shorten the device lifetime.
(2) All voltage values are with respect to VSS, unless otherwise noted.
(3) The absolute maximum ratings for these fail-safe pins depends on their IO supply operating voltage. Therefore, this value is also defined by the maximum VIH value found in the I2C Open-Drain, and Fail-Safe (I2C OD FS) Electrical Characteristics section, where the electrical characteristics table has separate parameter values for 1.8 V mode and 3.3 V mode.
(4) The VMON_ER_VSYS pin provides a way to monitor the system power supply. For more information, see TBD System Power Supply Monitor Design Guidelines.
(5) This parameter applies to all IO pins which are not fail-safe and the requirement applies to all values of IO supply voltage. For example, if the voltage applied to a specific IO supply is 0 volts the valid input voltage range for any IO powered by that supply will be –0.3 to +0.3 volts. Special attention should be applied anytime peripheral devices are not powered from the same power sources used to power the respective IO supply. It is important the attached peripheral never sources a voltage outside the valid input voltage range, including power supply ramp-up and ramp-down sequences.
(6) An external resistor divider is required to limit the voltage applied to this device pin. For more information, see TBD USB Design Guidelines.
(7) VDD is the voltage on the corresponding power-supply pin(s) for the IO.
(8) For current pulse injection (I-Test):
• Pins stressed per JEDEC JESD78 (Class II) and passed with specified I/O pin injection current and clamp voltage of 1.5 times maximum recommended I/O voltage and negative 0.5 times maximum recommended I/O voltage.
For over-voltage performance (Over-Voltage (OV) Test):
• Supplies stressed per JEDEC JESD78 (Class II) and passed specified voltage injection.