It is recommended to perform thermal simulations at the system level with the worst-case device power consumption.
NO. |
PARAMETER |
DESCRIPTION |
℃/W(1)(2) |
AIR FLOW (m/s)(3) |
T1 |
RΘJC |
Junction-to-case |
1.2 |
N/A |
T2 |
RΘJB |
Junction-to-board |
3.8 |
N/A |
T3 |
RΘJA |
Junction-to-free air |
14.4 |
0 |
T4 |
Junction-to-moving air |
10.0 |
1 |
T5 |
8.9 |
2 |
T6 |
8.3 |
3 |
T7 |
ΨJT |
Junction-to-package top |
0.46 |
0 |
T8 |
0.47 |
1 |
T9 |
0.48 |
2 |
T10 |
0.49 |
3 |
T11 |
ΨJB |
Junction-to-board |
3.7 |
0 |
T12 |
3.3 |
1 |
T13 |
3.2 |
2 |
T14 |
3.2 |
3 |
(1) These values are based on a JEDEC defined 2S2P system (with the exception of the Theta JC [RΘJC] value, which is based on a JEDEC defined 1S0P system) and will change based on environment as well as application. For more information, see these EIA/JEDEC standards:
• JESD51-2, Integrated Circuits Thermal Test Method Environment Conditions - Natural Convection (Still Air)
• JESD51-3, Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-6, Integrated Circuit Thermal Test Method Environmental Conditions - Forced Convection (Moving Air)
• JESD51-7, High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-9, Test Boards for Area Array Surface Mount Packages
(2) ℃/W = degrees Celsius per watt
(3) m/s = meters per second