JAJSE20F August 2016 – November 2019 AM5706 , AM5708
PRODUCTION DATA.
デバイスごとのパッケージ図は、PDF版データシートをご参照ください。
Table 5-62 and Table 5-63 assume testing over the recommended operating conditions and electrical characteristic conditions below (see Figure 5-42, Figure 5-43 and Figure 5-44).
NO. | PARAMETER | DESCRIPTION | MIN | MAX | UNIT |
---|---|---|---|---|---|
10 | tPDH | Presence pulse delay high | 15 | 60 | µs |
11 | tPDL | Presence pulse delay low | 60 | 240 | µs |
12 | tRDV | Read data valid time | tLOWR | 15 | µs |
13 | tREL | Read data release time | 0 | 45 | µs |
NO. | PARAMETER | DESCRIPTION | MIN | MAX | UNIT |
---|---|---|---|---|---|
14 | tRSTL | Reset time low | 480 | 960 | µs |
15 | tRSTH | Reset time high | 480 | µs | |
16 | tSLOT | Bit cycle time | 60 | 120 | µs |
17 | tLOW1 | Write bit-one time | 1 | 15 | µs |
18 | tLOW0 | Write bit-zero time(2) | 60 | 120 | µs |
19 | tREC | Recovery time | 1 | µs | |
20 | tLOWR | Read bit strobe time(1) | 1 | 15 | µs |