JAJSC85G March 2016 – May 2018 AM5716 , AM5718
PRODUCTION DATA.
Table 7-36 and Table 7-37 assume testing over the recommended operating conditions and electrical characteristic conditions below (see Figure 7-25, Figure 7-26, Figure 7-27 and Figure 7-28).
NO. | PARAMETER | DESCRIPTION | MIN | MAX | UNIT |
---|---|---|---|---|---|
1 | tCYCH | Read bit window timing | 190 | 250 | µs |
2 | tHW1 | Read one data valid after HDQ low | 32(2) | 66(2) | µs |
3 | tHW0 | Read zero data hold after HDQ low | 70(2) | 145(2) | µs |
4 | tRSPS | Response time from HDQ slave device(1) | 190 | 320 | µs |
NO. | PARAMETER | DESCRIPTION | MIN | MAX | UNIT |
---|---|---|---|---|---|
5 | tB | Break timing | 190 | µs | |
6 | tBR | Break recovery time | 40 | µs | |
7 | tCYCD | Write bit windows timing | 190 | µs | |
8 | tDW1 | Write one data valid after HDQ low | 0.5 | 50 | µs |
9 | tDW0 | Write zero data hold after HDQ low | 86 | 145 | µs |