JAJSS45 August 2024 AMC3306M05-Q1
PRODUCTION DATA
デバイスごとのパッケージ図は、PDF版データシートをご参照ください。
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
ANALOG INPUT | ||||||
RIN | Single-ended input resistance | INN = HGND | 4.75 | kΩ | ||
RIND | Differential input resistance | 4.9 | kΩ | |||
IIB | Input bias current | INP = INN = HGND; IIB = (IIBP + IIBN) / 2 |
–48 | –36 | –28 | μA |
IIO | Input offset current(1) | IIO = IIBP – IIBN; INP = INN = HGND | ±10 | nA | ||
CIN | Single-ended input capacitance | INN = HGND, fIN = 310kHz | 4 | pF | ||
CIND | Differential input capacitance | fIN = 310kHz | 2 | pF | ||
ACCURACY | ||||||
EO | Offset error(1) | INN = INP = HGND, TA = 25°C | –50 | ±10 | 50 | µV |
TCEO | Offset error thermal drift(4) | INN = INP = HGND | –0.4 | 0.4 | µV/°C | |
EG | Gain error | TA = 25°C | –0.2% | ±0.005% | 0.2% | |
TCEG | Gain error drift(5) | –35 | 35 | ppm/°C | ||
DNL | Differential nonlinearity | Resolution: 16 bits | –0.99 | 0.99 | LSB | |
INL | Integral nonlinearity | Resolution: 16 bits | –4 | ±1 | 4 | LSB |
SNR | Signal-to-noise ratio | fIN = 1kHz | 77 | 81 | dB | |
SINAD | Signal-to-noise + distortion | fIN = 1kHz | 77 | 81 | dB | |
THD | Total harmonic distortion(3) | 5MHz ≤ fCLKIN ≤ 21MHz, fIN = 1kHz | –93 | –86 | dB | |
SFDR | Spurious-free dynamic range | fIN = 1kHz | 87 | 94 | dB | |
CMRR | Common-mode rejection ratio | fIN = 0Hz, VCM min ≤ VIN ≤ VCM max | –100 | dB | ||
fIN = 10kHz, VCM min ≤ VIN ≤ VCM max, VINP = VINN = 100mVPP | –100 | |||||
PSRR | Power-supply rejection ratio | VDD from 3.0V to 5.5V, at DC | –120 | dB | ||
INP = INN = HGND, VDD from 3.0V to 5.5V, 10kHz, 100mV ripple | –120 | |||||
DIGITAL I/O | ||||||
IIN | Input leakage current | GND ≤ VIN ≤ VDD | 0 | 7 | μA | |
CIN | Input capacitance | 4 | pF | |||
VIH | High-level input voltage | 0.7 × VDD | VDD + 0.3 | V | ||
VIL | Low-level input voltage | –0.3 | 0.3 × VDD | V | ||
CLOAD | Output load capacitance | 15 | 30 | pF | ||
VOH | High-level output voltage | IOH = –20µA | VDD – 0.1 | V | ||
IOH = –4mA | VDD – 0.4 | |||||
VOL | Low-level output voltage | IOL = 20µA | 0.1 | V | ||
IOL = 4mA | 0.4 | |||||
CMTI | Common-mode transient immunity | 75 | 135 | kV/μs | ||
POWER SUPPLY | ||||||
IDD | Low-side supply current | No external load on HLDO | 26 | 40 | mA | |
1mA external load on HLDO | 28 | 42 | ||||
VDCDC_OUT | DC/DC output voltage | DCDC_OUT to HGND | 3.1 | 3.5 | 4.65 | V |
VDCDCUV | DC/DC output undervoltage detection threshold voltage | VDCDC_OUT falling | 2.1 | 2.25 | V | |
VHLDO_OUT | High-side LDO output voltage | HLDO_OUT to HGND, up to 1mA external load(2) | 3 | 3.2 | 3.4 | V |
VHLDOUV | High-side LDO output undervoltage detection threshold voltage | VHLDO_OUT falling | 2.4 | 2.6 | V | |
IH | High-side supply current for auxiliary circuitry | Load connected from HLDO_OUT to HGND; non-switching; -40℃ ≤ TA ≤ 85℃(2) | 1 | mA | ||
tSTART | Device startup time | VDD step to 3.0V to bitstream valid | 0.9 | 1.4 | ms |