3 Description
The bq24250, bq24251, and bq24253 are highly integrated single-cell Li-Ion battery chargers and system power-path management devices targeted for space-limited, portable applications with high-capacity batteries. The single-cell charger has a single input that operates from either a USB port or an AC wall adapter for a versatile solution.
Device Information(1)
PART NUMBER |
PACKAGE |
BODY SIZE (NOM) |
bq24250 bq24251 bq24253 |
VQFN (24) |
4.00 mm x 4.00 mm |
DSBGA (30) |
2.40 mm x 2.00 mm |
- For all available packages, see the orderable addendum at the end of the datasheet.
4 Revision History
Changes from G Revision (January 2015) to H Revision
-
Changed 20 V Maximum Input Voltage Rating Feature bullet to 22 V to match Absolute Maximum Ratings tableGo
-
Changed Figure 11 and Figure 12 image X-axis labels from "Temperature (fC)" to "Temperature (°C)" Go
Changes from F Revision (December 2014) to G Revision
-
Deleted Lead temperature (soldering) spec from Absolute Maximum Ratings table. See Package Option Addendum. Go
-
Changed table heading from Handling Ratings to ESD Ratings. Moved Tstg spec to the Absolute Maximum Ratings tableGo
-
Changed the test condition of IBAT- Battery discharge current in SYSOFF mode: Removed “(BAT, SW, SYS)”Go
-
Added spec for IIN/IILIM ratio Go
Changes from E Revision (December 2013) to F Revision
-
Added Handling Rating table, Feature Description section, Device Functional Modes, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information section Go
-
Deleted the minimum spec for RILIM-SHORT and changed the typical value to 55 ohm and maximum spec to 75 ohm.Go
-
Changed VLDO values to (4.65, 4.85, 5.04) and added description in the second column “bq24250”. Added one row below for “bq24251 and bq24253” and added values (4.65, 4.95, 5.25).Go
Changes from D Revision (July 2013) to E Revision
-
Changed VDPM pin desctiption from "......sets a default of 4.36V" to ".......sets a default of 4.68V" Go
-
Changed text string in the VIN_DLM settings description from: "The ISET resistor must be floated in order to avoid an internal fault." to: "The ISET resistor must be connected in order to avoid an unstable charging state."Go
-
Changed text string in the Sleep Mode description from: "...sends a single 256μs pulse is sent on the STAT and INT outputs..." to: "...sends a single 256µs pulse on the STAT and INT outputs..."Go
-
Changed text string in the Input Over-Voltage Protection description from: "...turns the battery FET, sends a single 256μs pulse is sent on the STAT and INT outputs..." to "...turns the battery FET, sends a single 256μs pulse on the STAT and INT outputs...."Go
-
Added Serial Interface DescriptionGo
-
Changed Register #3 description, B1(4)(5) Name from: "USB_DET_1/EN1" to: "USB_DET_1/EN2"Go
-
Changed Register #3 description, B0(LSB) Name from: "USB_DET_0/EN0" to: "USB_DET_0/EN1"Go
-
Changed Register #3 description, B1(4)(5) and B0(LSB) FUNCTION entries from: "Return USB detection result or pin EN1/EN0 status –" to "Return USB detection result or pin EN2/EN1 status –" ; changed 00 - DCP detected / from: "EN1=0, EN0=0" to: "EN2=0, EN1=0"; changed 01 - CDP detected / from: "EN1=0, EN0=1" to: "EN2=0, EN1=1"; changed 10 - SDP detected / from: "EN1=1, EN0=0" to: "EN2=1, EN1=0"; and changed 11 - Apple/TT or non-standard adaptor detected / from: "EN1=1, EN0=1" to: "EN2=1, EN1=1", respectively.Go
Changes from C Revision (June 2013) to D Revision
-
Changed VDPM Pin Description regulator reference from "1.23V" to "1.2" Go
-
Changed text string in D+/D- pin description from "....will remain low..." to "...will remain high impedance..."Go
-
Added SCL and SDA to Pin Voltage Range spec in the Absolute Maximum Ratings tableGo
-
Changed spec conditions for Output Current (Continuous), from "IN, SW, SYS, BAT" to "IN, SYS, BAT " in ABS Max Ratings table Go
-
Changed Figure 20Go
-
Added text to NTC Monitor description for clarification.Go
-
Added text to Safety Timer description for clarification.Go
-
Changed Fault Condition from "Input Good" to "Input Fault & LDO Low" in Fault Conditions table.Go
-
Changed Register #2 Reset state from "1010 1100" to "xxxx 1100"Go
-
Changed Register #4 Reset state from "0000 0000" to "1111 1000"Go
-
Changed Bit B7, B6, B5, B4, B3 FUNCTION description from "(default 0)" to "(default 1)"Go
-
Changed Register #4 Footnote (1) text from "...current is 500ma...." to " .....current is external.."Go
-
Changed TS_EN description from "When set to a ‘1' the TS function is disabled ....." to "When set to a ‘0’, the TS function is disabled..."Go
-
Added text to TS_STAT description for clarification.Go
-
Changed Register #7, Bit B3 FUNCTION description from "...if TERM is true or EN_PTM is true..." to "if TERM is true or Force PTM s true..."Go
Changes from B Revision (May 2013) to C Revision
-
Deleted PREVIEW status note from devices bq24250YFF, bq24251YFF, bq24251RGE, and bq24253RGE Go
Changes from A Revision (March 2013) to B Revision
-
Added PREVIEW status to devices in the Ordering Information table, except the bq24250RGER and bq24250RGETGo
Changes from * Revision (October 2012) to A Revision
-
Changed From: Product Brief To: Full data sheetGo
-
Added Typical Characteristics graphsGo
-
Changed Equation (3)Go
-
Changed text in the F/S Mode Protocol section from "...to either transmit data to the slave (R/W bit 1) or receive data from the slave (R/W bit 0" to "...to either transmit data to the slave (R/W bit 0) or receive data from the slave (R/W bit 1)" for clarification.Go