JAJSKU9B December   2022  – February 2024 BQ25628 , BQ25629

PRODUCTION DATA  

  1.   1
  2. 特長
  3. アプリケーション
  4. 概要
  5. 概要 (続き)
  6. Device Comparison
  7. Pin Configuration and Functions
  8. Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Timing Requirements
    7. 7.7 Typical Characteristics
  9. Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1  Power-On-Reset (POR)
      2. 8.3.2  Device Power Up from Battery
      3. 8.3.3  Device Power Up from Input Source
        1. 8.3.3.1 REGN LDO Power Up
        2. 8.3.3.2 Poor Source Qualification
        3. 8.3.3.3 D+/D– Detection Sets Input Current Limit (BQ25629)
        4. 8.3.3.4 ILIM Pin (BQ25628 Only)
        5. 8.3.3.5 Input Voltage Limit Threshold Setting (VINDPM Threshold)
        6. 8.3.3.6 Converter Power-Up
      4. 8.3.4  Power Path Management
        1. 8.3.4.1 Narrow VDC Architecture
        2. 8.3.4.2 Dynamic Power Management
        3. 8.3.4.3 High Impedance Mode
      5. 8.3.5  Battery Charging Management
        1. 8.3.5.1 Autonomous Charging Cycle
        2. 8.3.5.2 Battery Charging Profile
        3. 8.3.5.3 Charging Termination
        4. 8.3.5.4 Thermistor Qualification
          1. 8.3.5.4.1 Advanced Temperature Profile in Charge Mode
          2. 8.3.5.4.2 TS Pin Thermistor Configuration
          3. 8.3.5.4.3 Cold/Hot Temperature Window in OTG Mode
          4. 8.3.5.4.4 JEITA Charge Rate Scaling
          5. 8.3.5.4.5 TS_BIAS Pin
        5. 8.3.5.5 Charging Safety Timers
      6. 8.3.6  USB On-The-Go (OTG)
        1. 8.3.6.1 Boost OTG Mode
        2. 8.3.6.2 Bypass OTG Mode
        3. 8.3.6.3 PMID Voltage Indicator (PMID_GD)
      7. 8.3.7  Integrated 12-Bit ADC for Monitoring
      8. 8.3.8  Status Outputs ( STAT, INT)
        1. 8.3.8.1 Interrupts and Status, Flag and Mask Bits
        2. 8.3.8.2 Charging Status Indicator (STAT)
        3. 8.3.8.3 Interrupt to Host ( INT)
      9. 8.3.9  BATFET Control
        1. 8.3.9.1 Shutdown Mode
        2. 8.3.9.2 Ship Mode
        3. 8.3.9.3 System Power Reset
      10. 8.3.10 Protections
        1. 8.3.10.1 Voltage and Current Monitoring in Battery Only and HIZ Modes
          1. 8.3.10.1.1 Battery Undervoltage Lockout
          2. 8.3.10.1.2 Battery Overcurrent Protection
        2. 8.3.10.2 Voltage and Current Monitoring in Buck Mode
          1. 8.3.10.2.1 Input Overvoltage
          2. 8.3.10.2.2 System Overvoltage Protection (SYSOVP)
          3. 8.3.10.2.3 Forward Converter Cycle-by-Cycle Current Limit
          4. 8.3.10.2.4 System Short
          5. 8.3.10.2.5 Battery Overvoltage Protection (BATOVP)
          6. 8.3.10.2.6 Sleep and Poor Source Comparators
          7. 8.3.10.2.7 PMID OVP and VBUS Overcurrent
        3. 8.3.10.3 Voltage and Current Monitoring in Boost Mode
          1. 8.3.10.3.1 Boost Mode Overvoltage Protection
          2. 8.3.10.3.2 Boost Mode Duty Cycle Protection
          3. 8.3.10.3.3 Boost Mode PMID Undervoltage Protection
          4. 8.3.10.3.4 Boost Mode Battery Undervoltage
          5. 8.3.10.3.5 Boost Converter Cycle-by-Cycle Current Limit
          6. 8.3.10.3.6 Boost Mode SYS Short
        4. 8.3.10.4 Voltage and Current Monitoring in Bypass Mode
          1. 8.3.10.4.1 Bypass Mode Overvoltage Protection
          2. 8.3.10.4.2 Bypass Mode Battery OCP
          3. 8.3.10.4.3 Bypass Mode Reverse-Current Protection
          4. 8.3.10.4.4 Bypass Mode Battery Undervoltage
          5. 8.3.10.4.5 Bypass Mode SYS Short
          6. 8.3.10.4.6 Bypass Mode REGN Fault
        5. 8.3.10.5 Thermal Regulation and Thermal Shutdown
          1. 8.3.10.5.1 Thermal Protection in Buck Mode
          2. 8.3.10.5.2 Thermal Protection in Boost Mode
          3. 8.3.10.5.3 Thermal Protection in Battery-Only Mode
    4. 8.4 Device Functional Modes
      1. 8.4.1 Host Mode and Default Mode
      2. 8.4.2 Register Bit Reset
    5. 8.5 Programming
      1. 8.5.1 Serial Interface
        1. 8.5.1.1 Data Validity
        2. 8.5.1.2 START and STOP Conditions
        3. 8.5.1.3 Byte Format
        4. 8.5.1.4 Acknowledge (ACK) and Not Acknowledge (NACK)
        5. 8.5.1.5 Target Address and Data Direction Bit
        6. 8.5.1.6 Single Write and Read
        7. 8.5.1.7 Multi-Write and Multi-Read
    6. 8.6 Register Maps
      1. 8.6.1 Register Programming
      2. 8.6.2 BQ25628 Registers
  10. Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
        1. 9.2.2.1 Inductor Selection
        2. 9.2.2.2 Input Capacitor
        3. 9.2.2.3 Output Capacitor
      3. 9.2.3 Application Curves
  11. 10Power Supply Recommendations
  12. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  13. 12Device and Documentation Support
    1. 12.1 Device Support
      1. 12.1.1 サード・パーティ製品に関する免責事項
    2. 12.2 Documentation Support
      1. 12.2.1 Related Documentation
    3. 12.3 ドキュメントの更新通知を受け取る方法
    4. 12.4 サポート・リソース
    5. 12.5 Trademarks
    6. 12.6 静電気放電に関する注意事項
    7. 12.7 用語集
  14. 13Revision History
  15. 14Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ(パッケージ|ピン)
サーマルパッド・メカニカル・データ
発注情報

Revision History

Changes from Revision A (January 2024) to Revision B (February 2024)

  • Changed TTOP_OFF Typical and Maximum Limit.Go
  • Changed TSAFETY_TRKCHG Typical and Maximum Limit.Go
  • Changed TSAFETY_PRECHG Typical and Maximum Limit.Go
  • Changed TSAFETY Typical and Maximum Limit.Go
  • Changed TBATFET_DLY Typical Value.Go
  • Changed TSM_EXIT Typical and Maximum Limit.Go
  • Changed TQON_RST Typical and Maximum Limit.Go
  • Changed TBATFET_RST Typical Value.Go
  • Changed TLP_WDT Typical Value.Go
  • Changed TWDT Typical Value.Go
  • Changed recommended values of RT1 and RT2 in Section 8.3.5.4.2 Go
  • Added I2C timing requirements for fast mode and fast mode plus in Section 8.5.1.Go
  • Changed TOPOFF_TMR values in Charge_Control_0 Register Description, PRECHG_TMR and CHG_TMR values in Charge_Timer_Control Register Description, and WATCHDOG values in Charger_Control_1 Register Description.Go
  • Updated behavior of IBAT_ADC in IBAT_ADC Register Description.Go

Changes from Revision * (December 2022) to Revision A (January 2024)

  • 充電終了機能に「5mA~310mA、5mA ステップ」を追加Go
  • IEC 62368-1 CB 認証を追加Go
  • BQ25628/629 のアプリケーション概略図を変更Go
  • 「概要 (続き)」のテキストを変更Go
  • Changed D+/D- USB Detection from Yes to No for BQ25618 in Section 5 Go
  • Changed tRST to tQON_RST in QON pin descriptionGo
  • Added Maximum limit to VPOORSRC Go
  • Updated VTS_COLD, VTS_COLDZ, VTS_COOL, VTS_COOLZ, VTS_WARM, VTS_WARMZ, VTS_HOT, and VTS_HOTZ. Updated VBUS_ADC, VPMID_ADC, and TDIE_ADC. Removed tPMID_OVP_PROP and tPMID_OVP_FALL.Go
  • Changed IBAT_ADC LSB from 2mA to 4mAGo
  • Removed typical specs for tVBUS_OVP_PROP, TPOORSRC_RETRY, tPOORSRC_RESTART, tVBUS_PD, tTERM_DGL, tRECHG_DGL Go
  • Clarified register conditions for TTOP_OFF specifications.Go
  • Clarified behavior of JEITA Charge Rate ScalingGo
  • Deleted When the charger enters HIZ mode, the ADC is disabled. from Section 8.3.7 Go
  • Added Section 8.3.8.1 Go
  • Added Section 8.3.10 Go
  • Changed VBUS_ADC from 19850mV and 1388h to 18000mV and 11B6h in REG0x2C_VBUS_ADC Register Field DescriptionsGo
  • Changed VPMID_ADC from 19850mV and 1388h to 18000mV and 11B6h in REG0x2E_VPMID_ADC Register Field DescriptionsGo
  • Changed TDIE_ADC from 150°C and 12Ch to 140°C and 118h in REG0x36_TDIE_ADC Register Field DescriptionsGo
  • Changed Q1_FULLON, BATFET_CTRL_WVBUS bit access type from R to RW and TDIE_ADC bit access type from RW to RGo
  • Changed bit 11 to Reserved, ICHG Reset from X to 8h in Register Fields and Descriptions for REG0x02_Charge_Current_Limit registerGo
  • Changed bit 8 to Reserved in Register Fields and Descriptions for REG0x10_Pre-charge_Control registerGo
  • Changed bit 8 to Reserved in Register Fields and Descriptions for REG0x12_Termination_Control register Go
  • Changed Figure 9-3 Go
  • Changed Figure 9-4 Go
  • Changed Figure 9-11 Go