JAJSFE4B May   2015  – May 2018

PRODUCTION DATA.  

  1. 1 特長
  2. 2 アプリケーション
  3. 3 概要
    1.     Device Images
      1.      概略回路図
  4. 4 改訂履歴
  5. 5 Device Comparison Table
  6. 6 Pin Configuration and Functions
    1.     Pin Functions
  7. 7 Specifications
    1. 7.1  Absolute Maximum Ratings
    2. 7.2  ESD Ratings
    3. 7.3  Recommended Operating Conditions
    4. 7.4  Thermal Information
    5. 7.5  Supply Current
    6. 7.6  Digital Input and Output DC Characteristics
    7. 7.7  Power-On Reset
    8. 7.8  2.5-V LDO Regulator
    9. 7.9  Internal Clock Oscillators
    10. 7.10 Integrating ADC (Coulomb Counter) Characteristics
    11. 7.11 ADC (Temperature and Cell Voltage) Characteristics
    12. 7.12 Data Flash Memory Characteristics
    13. 7.13 HDQ Communication Timing Characteristics
    14. 7.14 I2C-Compatible Interface Timing Characteristics
    15. 7.15 Typical Characteristics
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Fuel Gauging
      2. 8.3.2 Impedance Track Variables
      3. 8.3.3 Power Control
        1. 8.3.3.1 Reset Functions
        2. 8.3.3.2 Wake-Up Comparator
        3. 8.3.3.3 Flash Updates
      4. 8.3.4 Autocalibration
      5. 8.3.5 Communications
        1. 8.3.5.1 Authentication
        2. 8.3.5.2 Key Programming (Data Flash Key)
        3. 8.3.5.3 Key Programming (Secure Memory Key)
        4. 8.3.5.4 Executing an Authentication Query
        5. 8.3.5.5 HDQ Single-Pin Serial Interface
        6. 8.3.5.6 HDQ Host Interruption Feature
          1. 8.3.5.6.1 Low Battery Capacity
          2. 8.3.5.6.2 Temperature
        7. 8.3.5.7 I2C Interface
          1. 8.3.5.7.1 I2C Time Out
          2. 8.3.5.7.2 I2C Command Waiting Time
          3. 8.3.5.7.3 I2C Clock Stretching
    4. 8.4 Device Functional Modes
      1. 8.4.1 Power Modes
        1. 8.4.1.1 NORMAL Mode
        2. 8.4.1.2 SLEEP Mode
        3. 8.4.1.3 FULLSLEEP Mode
        4. 8.4.1.4 HIBERNATE Mode
      2. 8.4.2 System Control Function
        1. 8.4.2.1 SHUTDOWN Mode
        2. 8.4.2.2 INTERRUPT Mode
      3. 8.4.3 Security Modes
        1. 8.4.3.1 Sealing and Unsealing Data Flash
    5. 8.5 Programming
      1. 8.5.1 Standard Data Commands
        1. 8.5.1.1 Control(): 0x00 and 0x01
    6. 8.6 Register Maps
      1. 8.6.1 Pack Configuration Register
      2. 8.6.2 Pack Configuration B Register
      3. 8.6.3 Pack Configuration C Register
  9. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Applications
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
        1. 9.2.2.1 BAT Voltage Sense Input
        2. 9.2.2.2 SRP and SRN Current Sense Inputs
        3. 9.2.2.3 Sense Resistor Selection
        4. 9.2.2.4 TS Temperature Sense Input
        5. 9.2.2.5 Thermistor Selection
        6. 9.2.2.6 REGIN Power Supply Input Filtering
        7. 9.2.2.7 VCC LDO Output Filtering
    3. 9.3 Application Curves
  10. 10Power Supply Recommendations
    1. 10.1 Power Supply Decoupling
  11. 11Layout
    1. 11.1 Layout Guidelines
      1. 11.1.1 Sense Resistor Connections
      2. 11.1.2 Thermistor Connections
      3. 11.1.3 High-Current and Low-Current Path Separation
    2. 11.2 Layout Example
  12. 12デバイスおよびドキュメントのサポート
    1. 12.1 ドキュメントのサポート
      1. 12.1.1 関連資料
    2. 12.2 コミュニティ・リソース
    3. 12.3 商標
    4. 12.4 静電気放電に関する注意事項
    5. 12.5 Glossary
  13. 13メカニカル、パッケージ、および注文情報

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

7.1 Absolute Maximum Ratings

Over-operating free-air temperature range (unless otherwise noted)(1)
MIN MAX UNIT
VI Regulator input, REGIN –0.3 5.5 V
VCC Supply voltage range –0.3 2.75 V
VIOD Open-drain I/O pins (SDA, SCL, HDQ) –0.3 5.5 V
VBAT BAT input (pin E2) –0.3 5.5 V
VI Input voltage range to all others (pins GPIO, SRP, SRN, TS) –0.3 VCC + 0.3 V
TA Operating free-air temperature range –40 85 °C
TF Functional temperature range –40 100 °C
Tstg Storage temperature range –65 150
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.