テキサス・インスツルメンツの BQ27Z746 Impedance Track™ バッテリ残量計ソリューションは、高集積、高精度の 1 シリーズ・セル残量計および保護ソリューションです。
BQ27Z746 は、フラッシュ・プログラマブル・カスタム RISC (Reduced Instruction Set CPU)、安全保護機能、差動バッテリ・センシング・アナログ出力、1 シリーズ・セル・リチウムイオンおよびリチウムポリマー・バッテリ・パック認証機能を備えた完全統合型パック・ベース・ソリューションです。
BQ27Z746 バッテリ残量計は、I2C 互換インターフェイス通信機能、超低消費電力 TI BQBMP プロセッサ、高精度アナログ測定機能、内蔵フラッシュ・メモリ、N-CH ハイサイド FET ドライバ、SHA-2 認証変換レスポンダを 1 つの完全な高性能バッテリ管理ソリューションに統合しています。
部品番号 | パッケージ 1 | 本体サイズ (公称) |
---|---|---|
BQ27Z746 | YAH (15) | 1.7mm × 2.6mm |
PIN | DESCRIPTION | ||
---|---|---|---|
NAME | NO. | TYPE(1) | |
CHG | A1 | AO | Charge FET (CHG) driver |
DSG | A2 | AO | Discharge FET (DSG) driver. Connect a series 10-MΩ typical resistor (RDSG) between DSG pin and PACK+ positive terminal. |
PACK | A3 | IA | Pack input voltage sensing pin. Connect a series 5-kΩ typical resistor (RPACK) between PACK pin and PACK+ positive terminal. |
VDD | B1 | P | LDO regulator input. Connect a 1-µF typical capacitor (CVDD) between VDD and VSS. Place the capacitor close to the gauge. |
BAT | B2 | IA | Battery voltage measurement sense input |
BAT_SP | B3 | OA | Cell sense output, positive |
BAT_SN | C3 | OA | Cell sense output, negative |
TS | C1 | IA | Thermistor input to ADC with internal 18-kΩ pullup resistor |
GPO/TS1 | C2 | I/O | General purpose
output. Optional TS1 ADC input channel with internal 18-kΩ pullup resistor |
VSS | D1 | P | Device ground |
ENAB | D2 | I | Active low digital input with weak internal pullup to VDD. If enabled for ultra-low power SHIP mode, driving this signal to the PACK– negative terminal will enable the device to wake up. |
SDA | D3 | I/O | Digital input, open drain output for I2C serial data. Use with a typical 10-kΩ pullup resistor. |
SCL | E3 | I/O | Digital input, open drain output for I2C serial clock. Use with a typical 10-kΩ pullup resistor. |
SRP | E1 | IA | This is the positive analog input pin connected to the internal coulomb-counter peripheral for integrating a small voltage between SRP (positive side) and SRN (negative side). |
SRN | E2 | IA | This is the negative analog input pin connected to the internal coulomb-counter peripheral for integrating a small voltage between SRP (positive side) and SRN (negative side). |
MIN | MAX | UNIT | ||
---|---|---|---|---|
Supply voltage range | VDD | –0.3 | 6 | V |
Input voltage range | PACK (limited to 4 mA max) | –0.3 | 8 | V |
PACK+ external battery pack input terminal with 5 kΩ resistor in series to device PACK input pin | –0.3 | 24 | ||
PACK+ external battery pack input terminal with a 5 kΩ resistor (RPACK) in series to device PACK pin and a 10 MΩ resistor (RDSG) to device DSG pin | –12 | 24 | ||
BAT | –0.3 | 6 | ||
SDA, SCL, ENAB | –0.3 | 6 | ||
TS | –0.3 | 2 | ||
SRP, SRN | –0.3 | VBAT + 0.3 | ||
Output voltage range | BAT_SP, BAT_SN | –0.3 | 6 | V |
CHG, DSG | –0.3 | 12 | ||
Operating junction temperature, TJ | –40 | 85 | °C | |
Storage temperature, Tstg | –65 | 150 | °C |