JAJSFJ5I March 2014 – August 2024 BQ2970 , BQ2971 , BQ2972 , BQ2973
PRODUCTION DATA
The BQ2970 family of devices measures voltage drops across several input pins for monitoring and detection of the following faults: OCC, OCD, OVP, and UVP. An internal oscillator initiates a timer to the fixed delays associated with each parameter once the fault is triggered. Once the timer expires due to a fault condition, the appropriate FET drive output (COUT or DOUT) is activated to turn OFF the external FET. The same method is applicable for the recovery feature once the system fault is removed and the recovery parameter is satisfied, then the recovery timer is initiated. If there are no reoccurrences of this fault during this period, the appropriate gate drive is activated to turn ON the appropriate external FET.