JAJSSA8 November   2023 BQ76905

PRODUCTION DATA  

  1.   1
  2. 特長
  3. アプリケーション
  4. 概要
  5. Device Comparison Table
  6. Pin Configuration and Functions
  7. Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Supply Current
    6. 6.6  Digital I/O
    7. 6.7  REGOUT LDO
    8. 6.8  Voltage References
    9. 6.9  Coulomb Counter
    10. 6.10 Coulomb Counter Digital Filter
    11. 6.11 Current Wake Detector
    12. 6.12 Analog-to-Digital Converter
    13. 6.13 Cell Balancing
    14. 6.14 Internal Temperature Sensor
    15. 6.15 Thermistor Measurement
    16. 6.16 Hardware Overtemperature Detector
    17. 6.17 Internal Oscillator
    18. 6.18 Charge and Discharge FET Drivers
    19. 6.19 Comparator-Based Protection Subsystem
    20. 6.20 Timing Requirements—I2C Interface, 100-kHz Mode
    21. 6.21 Timing Requirements—I2C Interface, 400-kHz Mode
    22. 6.22 Timing Diagram
    23. 6.23 Typical Characteristics
  8. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Device Configuration
      1. 7.3.1 Commands and Subcommands
      2. 7.3.2 Configuration Using OTP or Registers
      3. 7.3.3 Device Security
    4. 7.4 Device Hardware Features
      1. 7.4.1  Voltage ADC
      2. 7.4.2  Coulomb Counter and Digital Filters
      3. 7.4.3  Protection FET Drivers
      4. 7.4.4  Voltage References
      5. 7.4.5  Multiplexer
      6. 7.4.6  LDOs
      7. 7.4.7  Standalone Versus Host Interface
      8. 7.4.8  ALERT Pin Operation
      9. 7.4.9  Low Frequency Oscillator
      10. 7.4.10 I2C Serial Communications Interface
    5. 7.5 Measurement Subsystem
      1. 7.5.1 Voltage Measurement
        1. 7.5.1.1 Voltage ADC Scheduling
        2. 7.5.1.2 Unused VC Pins
        3. 7.5.1.3 General Purpose ADCIN Functionality
      2. 7.5.2 Current Measurement and Charge Integration
      3. 7.5.3 Internal Temperature Measurement
      4. 7.5.4 Thermistor Temperature Measurement
      5. 7.5.5 Factory Trim and Calibration
    6. 7.6 Protection Subsystem
      1. 7.6.1 Protections Overview
      2. 7.6.2 Primary Protections
      3. 7.6.3 CHG Detector
      4. 7.6.4 Cell Open-Wire Protection
      5. 7.6.5 Diagnostic Checks
    7. 7.7 Cell Balancing
    8. 7.8 Device Operational Modes
      1. 7.8.1 Overview of Operational Modes
      2. 7.8.2 NORMAL Mode
      3. 7.8.3 SLEEP Mode
      4. 7.8.4 DEEPSLEEP Mode
      5. 7.8.5 SHUTDOWN Mode
      6. 7.8.6 CONFIG_UPDATE Mode
  9. Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Performance Plot
      4. 8.2.4 Random Cell Connection Support
      5. 8.2.5 Startup Timing
      6. 8.2.6 FET Driver Turn-Off
      7. 8.2.7 Usage of Unused Pins
    3. 8.3 Power Supply Recommendations
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
  10. Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 ドキュメントの更新通知を受け取る方法
    3. 9.3 サポート・リソース
    4. 9.4 Trademarks
    5. 9.5 静電気放電に関する注意事項
    6. 9.6 用語集
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ(パッケージ|ピン)
サーマルパッド・メカニカル・データ
発注情報

Typical Characteristics

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Figure 6-2 Cell Voltage Measurement Error at 25°C Across Input Range
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Figure 6-4 Cell Voltage Measurement Error vs. Temperature with Cell Voltage = 1.0 V
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Figure 6-6 Cell Voltage Measurement Error vs. Temperature with Cell Voltage = 2.0 V
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Figure 6-8 Cell Voltage Measurement Error vs. Temperature with Cell Voltage = 3.0 V
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Figure 6-10 Cell Voltage Measurement Error vs. Temperature with Cell Voltage = 4.0 V
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Figure 6-12 Cell Voltage Measurement Error vs. Temperature with Cell Voltage = 5.0 V
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Figure 6-14 Current Linearity Error vs. Sense Resistor Voltage
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Figure 6-16 Internal Temperature Measurement Raw Codes vs. Temperature
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Figure 6-18 Thermistor Pullup Resistance vs Temperature
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Figure 6-20 Overcurrent in Discharge Protection 1 (OCD1) Threshold vs. Temperature
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Figure 6-22 Short Circuit in Discharge Protection (SCD) Threshold vs. Temperature
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Figure 6-24 REGOUT Voltage vs. Temperature and Load
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When REGSRC = 3 V, REGSRC current increases as the device attempts to raise the REGOUT voltage to its target 3.3 V.
Figure 6-26 Supply Current in NORMAL Mode vs. Temperature
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Figure 6-28 Supply Current in DEEPSLEEP Mode vs. Temperature
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Figure 6-3 Cell Voltage Measurement Error vs. Temperature with Cell Voltage = 0.5 V
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Figure 6-5 Cell Voltage Measurement Error vs. Temperature with Cell Voltage = 1.5 V
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Figure 6-7 Cell Voltage Measurement Error vs. Temperature with Cell Voltage = 2.5 V
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Figure 6-9 Cell Voltage Measurement Error vs. Temperature with Cell Voltage = 3.5 V
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Figure 6-11 Cell Voltage Measurement Error vs. Temperature with Cell Voltage = 4.5 V
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Figure 6-13 Cell Voltage Measurement Error vs. Temperature with Cell Voltage = 5.5 V
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Figure 6-15 Internal Voltage References vs. Temperature (VREF1 and VREF2)
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Figure 6-17 Internal Temperature Measurement Error vs. Temperature
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LFO measured in full speed mode (262 kHz) and low speed mode (32.77 kHz)
Figure 6-19 Low Frequency Oscillator (LFO) Accuracy vs. Temperature
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Figure 6-21 Overcurrent in Charge Protection (OCC) Threshold vs. Temperature
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Data collected with 1.5-V differential input on cell.
Figure 6-23 Cell Balancing Resistance vs. Temperature
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Figure 6-25 TS and VC0 Wake Voltage vs. Temperature
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No communications, REGOUT disabled
Figure 6-27 Supply Current in SLEEP Mode vs. Temperature
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Figure 6-29 Supply Current in SHUTDOWN Mode vs. Temperature