JAJSSA8 November 2023 BQ76905
PRODUCTION DATA
The BQ76905 device integrates the capability to measure its internal die temperature by digitizing the difference in internal transistor base-emitter voltages. This voltage is measured periodically as part of the measurement loop and is processed to provide a reported temperature value available through the digital communications interface.
The internal temperature is also compared to a programmable protection threshold to implement a die overtemperature protection. In response to this protection, the device can be configured to disable FETs and optionally enter SHUTDOWN mode. For more information on this, refer to the Internal Overtemperature Protection section in the BQ76905 Technical Reference Manual.