JAJSUM3A December   1998  – May 2024 CD54AC574 , CD54ACT574 , CD74AC574 , CD74ACT574

PRODUCTION DATA  

  1.   1
  2. 1 特長
  3. 2 概要
  4. 3 Pin Configuration and Functions
  5. 4 Specifications
    1. 4.1  Absolute Maximum Ratings
    2. 4.2  ESD Ratings
    3. 4.3  Recommended Operating Conditions
    4. 4.4  Thermal Information
    5. 4.5  Static Electrical Characteristics: AC Series
    6. 4.6  Static Electrical Characteristics: ACT Series
    7. 4.7  Prerequisite for Switching: AC Series
    8. 4.8  Switching Characteristics: AC Series
    9. 4.9  Prerequisite for Switching: ACT Series
    10. 4.10 Switching Characteristics: ACT Series
  6. 5 Parameter Measurement Information
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Device Functional Modes
  8. 7 Application and Implementation
    1. 7.1 Power Supply Recommendations
    2. 7.2 Layout
      1. 7.2.1 Layout Guidelines
  9. 8 Device and Documentation Support
    1. 8.1 Documentation Support (Analog)
      1. 8.1.1 Related Documentation
    2. 8.2 ドキュメントの更新通知を受け取る方法
    3. 8.3 サポート・リソース
    4. 8.4 Trademarks
    5. 8.5 静電気放電に関する注意事項
    6. 8.6 用語集
  10. 9 Revision History
  11. 10Mechanical, Packaging, and Orderable Information

デバイスごとのパッケージ図は、PDF版データシートをご参照ください。

メカニカル・データ（パッケージ｜ピン）
  • J|20
サーマルパッド・メカニカル・データ

4.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)
MIN MAX UNIT
VCC Supply-voltage -0.5 6 V
IIK Input diode current (VI < -0.5 V or VI > VCC + 0.5 V) ±20 mA
IOk Output diode current (Vo < -0.5 V or Vo > VCC + 0.5 V) ±50 mA
IO Output source or sink current per output pin (VO > -0.5 V or VO < VCC ± 0.5 V) ±50 mA
VCC or ground current (ICC or IGND) ±100 mA(2)
Tstg Storage temperature -65 +150 °C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) For up to 4 outputs per device; add ± 25 mA for each additional output.