SLPS471D February   2014  – May 2017 CSD17570Q5B

PRODUCTION DATA.  

  1. 1Features
  2. 2Applications
  3. 3Description
  4. 4Revision History
  5. 5Specifications
    1. 5.1 Electrical Characteristics
    2. 5.2 Thermal Information
    3. 5.3 Typical MOSFET Characteristics
  6. 6Device and Documentation Support
    1. 6.1 Receiving Notification of Documentation Updates
    2. 6.2 Community Resources
    3. 6.3 Trademarks
    4. 6.4 Electrostatic Discharge Caution
    5. 6.5 Glossary
  7. 7Mechanical, Packaging, and Orderable Information
    1. 7.1 Q5B Package Dimensions
    2. 7.2 Recommended PCB Pattern
    3. 7.3 Recommended Stencil Pattern
    4. 7.4 Q5B Tape and Reel Information

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発注情報

5 Specifications

5.1 Electrical Characteristics

(TA = 25°C unless otherwise stated)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
STATIC CHARACTERISTICS
BVDSS Drain-to-Source Voltage VGS = 0 V, ID = 250 μA 30 V
IDSS Drain-to-Source Leakage Current VGS = 0 V, VDS = 24 V 1 μA
IGSS Gate-to-Source Leakage Current VDS = 0 V, VGS = 20 V 100 nA
VGS(th) Gate-to-Source Threshold Voltage VDS = VGS, ID = 250 μA 1.1 1.5 1.9 V
RDS(on) Drain-to-Source On-Resistance VGS = 4.5 V, ID = 50 A 0.74 0.92 mΩ
VGS = 10 V, ID = 50 A 0.56 0.69 mΩ
gfs Transconductance VDS = 15 V, ID = 50 A 271 S
DYNAMIC CHARACTERISTICS
Ciss Input Capacitance VGS = 0 V, VDS = 15 V, ƒ = 1 MHz 10400 13600 pF
Coss Output Capacitance 1450 1890 pF
Crss Reverse Transfer Capacitance 877 1140 pF
RG Series Gate Resistance 1.8 3.6 Ω
Qg Gate Charge Total (4.5 V) VDS = 15 V, ID = 50 A 93 121 nC
Qgd Gate Charge Gate-to-Drain 34 nC
Qgs Gate Charge Gate-to-Source 27 nC
Qg(th) Gate Charge at Vth 17 nC
Qoss Output Charge VDS = 15 V, VGS = 0 V 40 nC
td(on) Turn On Delay Time VDS = 15 V, VGS = 10 V,
IDS = 50 A, RG = 0 Ω		 5 ns
tr Rise Time 36 ns
td(off) Turn Off Delay Time 144 ns
tf Fall Time 74 ns
DIODE CHARACTERISTICS
VSD Diode Forward Voltage ISD = 50 A, VGS = 0 V 0.8 1 V
Qrr Reverse Recovery Charge VDS= 15 V, IF = 50 A,
di/dt = 300 A/μs		 34 nC
trr Reverse Recovery Time 51 ns

5.2 Thermal Information

(TA = 25°C unless otherwise stated)
THERMAL METRIC MIN TYP MAX UNIT
RθJC Junction-to-Case Thermal Resistance(1) 0.8 °C/W
RθJA Junction-to-Ambient Thermal Resistance(1)(2) 50
(1) RθJC is determined with the device mounted on a 1 inch2 (6.45 cm2), 2 oz. (0.071 mm thick) Cu pad on a 1.5 inches × 1.5 inches
(3.81 cm × 3.81 cm), 0.06 inch (1.52 mm) thick FR4 PCB. RθJC is specified by design, whereas RθJA is determined by the user’s board design.
(2) Device mounted on FR4 material with 1 inch2 (6.45 cm2), 2 oz. (0.071 mm thick) Cu.

CSD17570Q5B M0137-01_LPS198.gif
Max RθJA = 50°C/W when mounted on 1 inch2 (6.45 cm2) of
2 oz. (0.071 mm thick) Cu.
CSD17570Q5B M0137-02_LPS198.gif
Max RθJA = 125°C/W when mounted on a minimum pad area of
2 oz. (0.071 mm thick) Cu.

5.3 Typical MOSFET Characteristics

(TA = 25°C unless otherwise stated)
CSD17570Q5B graph01_SLPS471B.png
Figure 1. Transient Thermal Impedance
CSD17570Q5B graph02_SLPS471.png
Figure 2. Saturation Characteristics
CSD17570Q5B graph04_SLPS471.png
Figure 4. Gate Charge
CSD17570Q5B graph06_SLPS471.png
Figure 6. Threshold Voltage vs Temperature
CSD17570Q5B graph08_SLPS471.png
Figure 8. Normalized On-State Resistance vs Temperature
CSD17570Q5B graph10_SLPS471B.png
Figure 10. Maximum Safe Operating Area
CSD17570Q5B graph12_SLPS471.png
Figure 12. Maximum Drain Current vs Temperature
CSD17570Q5B graph03_SLPS471.png
Figure 3. Transfer Characteristics
CSD17570Q5B graph05_SLPS471.png
Figure 5. Capacitance
CSD17570Q5B graph07_SLPS471.png
Figure 7. On-State Resistance vs Gate-to-Source Voltage
CSD17570Q5B graph09_SLPS471.png
Figure 9. Typical Diode Forward Voltage
CSD17570Q5B graph11_SLPS471.png
Figure 11. Single Pulse Unclamped Inductive Switching