JAJSQL1C July 2014 – March 2024 CSD18536KCS
PRODUCTION DATA
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PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
---|---|---|---|---|---|---|---|
STATIC CHARACTERISTICS | |||||||
BVDSS | Drain-to-Source Voltage | VGS = 0V, ID = 250μA | 60 | V | |||
IDSS | Drain-to-Source Leakage Current | VGS = 0V, VDS = 48V | 1 | μA | |||
IGSS | Gate-to-Source Leakage Current | VDS = 0V, VGS = 20V | 100 | nA | |||
VGS(th) | Gate-to-Source Threshold Voltage | VDS = VGS, ID = 250μA | 1.4 | 1.8 | 2.2 | V | |
RDS(on) | Drain-to-Source On-Resistance | VGS = 4.5V, ID = 100A | 1.7 | 2.2 | mΩ | ||
VGS = 10V, ID = 100A | 1.3 | 1.6 | mΩ | ||||
gfs | Transconductance | VDS = 6V, ID = 100A | 312 | S | |||
DYNAMIC CHARACTERISTICS | |||||||
Ciss | Input Capacitance | VGS = 0V, VDS = 30V, ƒ = 1MHz | 8790 | 11430 | pF | ||
Coss | Output Capacitance | 1410 | 1840 | pF | |||
Crss | Reverse Transfer Capacitance | 39 | 51 | pF | |||
RG | Series Gate Resistance | 0.7 | 1.4 | Ω | |||
Qg | Gate Charge Total (10V) | VDS = 30V, ID = 100A | 108 | 140 | nC | ||
Qgd | Gate Charge Gate-to-Drain | 14 | nC | ||||
Qgs | Gate Charge Gate-to-Source | 18 | nC | ||||
Qg(th) | Gate Charge at Vth | 17 | nC | ||||
Qoss | Output Charge | VDS = 30V, VGS = 0V | 230 | nC | |||
td(on) | Turn On Delay Time | VDS =
30V, VGS = 10 V, IDS = 100A, RG = 0Ω | 11 | ns | |||
tr | Rise Time | 5 | ns | ||||
td(off) | Turn Off Delay Time | 24 | ns | ||||
tf | Fall Time | 4 | ns | ||||
DIODE CHARACTERISTICS | |||||||
VSD | Diode Forward Voltage | ISD = 100A, VGS = 0V | 0.9 | 1.0 | V | ||
Qrr | Reverse Recovery Charge | VDS=
30V, IF = 100A, di/dt = 300A/μs | 323 | nC | |||
trr | Reverse Recovery Time | 86 | ns |