JAJSMW0G October 2013 – January 2022 CSD23381F4
PRODUCTION DATA
デバイスごとのパッケージ図は、PDF版データシートをご参照ください。
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
---|---|---|---|---|---|---|---|
STATIC CHARACTERISTICS | |||||||
BVDSS | Drain-to-Source Voltage | VGS = 0 V, IDS = –250 μA | –12 | V | |||
IDSS | Drain-to-Source Leakage Current | VGS = 0 V, VDS = –9.6 V | –100 | nA | |||
IGSS | Gate-to-Source Leakage Current | VDS = 0 V, VGS = –8 V | –50 | nA | |||
VGS(th) | Gate-to-Source Threshold Voltage | VDS = VGS, IDS = –250 μA | –0.7 | –0.95 | –1.20 | V | |
RDS(on) | Drain-to-Source On-Resistance | VGS = –1.8 V, IDS = –0.1 A | 480 | 970 | mΩ | ||
VGS = –2.5 V, IDS = –0.5 A | 250 | 300 | mΩ | ||||
VGS = –4.5 V, IDS = –0.5 A | 150 | 175 | mΩ | ||||
gfs | Transconductance | VDS = –6 V, IDS = –0.5 A | 2 | S | |||
DYNAMIC CHARACTERISTICS | |||||||
Ciss | Input Capacitance | VGS = 0 V, VDS = –6 V, ƒ = 1 MHz | 236 | pF | |||
Coss | Output Capacitance | 98 | pF | ||||
Crss | Reverse Transfer Capacitance | 6.9 | pF | ||||
RG | Series Gate Resistance | 20 | Ω | ||||
Qg | Gate Charge Total (4.5 V) | VDS = –6 V, IDS = –0.5 A | 1140 | pC | |||
Qgd | Gate Charge Gate-to-Drain | 190 | pC | ||||
Qgs | Gate Charge Gate-to-Source | 300 | pC | ||||
Qg(th) | Gate Charge at Vth | 145 | pC | ||||
Qoss | Output Charge | VDS = –6 V, VGS = 0 V | 1290 | pC | |||
td(on) | Turn On Delay Time | VDS = –6 V, VGS = –4.5 V, IDS = –0.5 A, RG = 2 Ω | 4.5 | ns | |||
tr | Rise Time | 3.9 | ns | ||||
td(off) | Turn Off Delay Time | 18 | ns | ||||
tf | Fall Time | 7 | ns | ||||
DIODE CHARACTERISTICS | |||||||
VSD | Diode Forward Voltage | ISD = –0.5 A, VGS = 0 V | –0.75 | V | |||
Qrr | Reverse Recovery Charge | VDS= –10 V, IF = –0.5 A, di/dt = 100 A/μs | 1260 | pC | |||
trr | Reverse Recovery Time | 7.9 | ns |