DAC38RF86/96は高性能、デュアル・チャネル、14ビット、9GSPS、RFサンプリングのデジタル/アナログ・コンバータ(DAC)のファミリで、0~4.5GHzの広帯域の信号を合成できます。また、DAC38RF87/97は、高性能、デュアル・チャネル、14ビット、6GSPS、RFサンプリングのデジタル/アナログ・コンバータ(DAC)のファミリであり、0~3GHzの広帯域の信号を合成できます。DAC38RFxxファミリはダイナミック・レンジが広いため、ワイヤレス基地局やレーダー用の3G/4G信号など、広範なアプリケーション用の信号を生成できます。
このデバイスには低消費電力のJESD204Bインターフェイスが搭載され、8つまでのレーンで最大12.5Gbpsのビット速度をサポートするため、チャネルごとに1.25GSPSの複素数データを入力できます。DAC38RFxxにはチャネルごとに2つのデジタル・アップ・コンバータが搭載されており、複数の補間レート・オプションを選択できます。独立した、柔軟な周波数を選択できるNCOを持つ、デジタル直交変調器が利用可能で、マルチ・バンドの動作に対応できます。GSM準拠の低位相ノイズPLL/VCOが内蔵されているため、低い周波数の基準クロックを使用でき、DACサンプリング・クロックの生成が簡単になります。
型番 | 出力 種類 | チャネル数 |
---|---|---|
DAC38RF86 | シングル・エンド | 2 |
DAC38RF96 | ||
DAC38RF87 | ||
DAC38RF97 |
Changes from A Revision (April 2017) to B Revision
Changes from * Revision (February 2017) to A Revision
Device | No. of Channels | Output | Interpolation | VCO Center Frequency |
---|---|---|---|---|
DAC38RF86 | 2 | Single ended | 6-24 | 8.85 GHz |
DAC38RF96 | 12-24 | 8.85 GHz | ||
DAC38RF87 | 6-24 | 5.9 GHz | ||
DAC38RF97 | 12-24 | 5.9 GHz |
PIN | I/O | DESCRIPTION | |
---|---|---|---|
NAME | NO. | ||
AGND | C11, C12, D11, E11, F12, J12, K11, L11, M11, M12, D12, L12 | - | Analog ground. |
ALARM | K8 | O | CMOS output for ALARM condition. Default polarity is active low, but can be changed to active high via RESET_CONFIG alm_out_pol control bit. |
AMUX0 | G3 | O | Analog test pin for SerDes, Lane 0 to Lane 3. Can be left floating. |
AMUX1 | F3 | O | Analog test pin for SerDes, Lane 4 to Lane 7. Can be left floating. |
ATEST | C8 | O | Analog test pin for DAC, references and PLL. Can be left floating. |
CLKTX+ | A7 | O | Divided output clock, internal 100 Ω differential termination, self-biased, positive terminal. |
CLKTX- | A6 | O | Divided output clock, internal 100 Ω differential termination, self-biased, negative terminal. |
DACCLK+ | A10 | I | Device clock, internal 100 Ω differential termination, self-biased, positive terminal. |
DACCLK- | A9 | I | Device clock, internal 100 Ω differential termination, self-biased, negative terminal. |
DACCLKSE | A12 | I | Single ended device clock optional input. Can be left floating if not used. internal 50 Ω termination. |
DGND | A2, B2, C2, D2, D6, E2, E7, F2, F6, G2, G7, H6, J7, K2, L2, L3, L4, L5, M6 | - | Digital ground. |
EXTIO | C10 | Requires a 0.1 μF decoupling capacitor to AGND. | |
GPI0 | L6 | Factory use only. User should GND. | |
GPI1 | M7 | Factory use only. User should GND. | |
GPO0 | L7 | Used for CMOS SYNC0\ signal. | |
GPIO1 | K7 | Used for CMOS SYNC1\ signal. | |
IFORCE | D3 | Test pin for on chip parametrics. Can be left floating. | |
RBIAS | C9 | I/O | Full-scale output current bias. Change the full-scale output current through DACFS in register DACFS (8.5.72). Expected to be 3.6 kΩ to GND for 40 mA full scale output. |
RESET | K9 | I | Active low input for chip RESET, which resets all the programming registers to their default state. Internal pull-up. |
RX0+ | J1 | I | CML SerDes interface lane 0 input, positive |
RX0- | K1 | I | CML SerDes interface lane 0 input, negative |
RX1+ | M1 | I | CML SerDes interface lane 1 input, positive |
RX1- | L1 | I | CML SerDes interface lane 1 input, negative |
RX2+ | M2 | I | CML SerDes interface lane 2 input, positive |
RX2- | M3 | I | CML SerDes interface lane 2 input, negative |
RX3+ | M5 | I | CML SerDes interface lane 3 input, positive |
RX3- | M4 | I | CML SerDes interface lane 3 input, negative |
RX4+ | H1 | I | CML SerDes interface lane 4 input, positive |
RX4- | G1 | I | CML SerDes interface lane 4 input, negative |
RX5+ | E1 | I | CML SerDes interface lane 5 input, positive |
RX5- | F1 | I | CML SerDes interface lane 5 input, negative |
RX6+ | D1 | I | CML SerDes interface lane 6 input, positive |
RX6- | C1 | I | CML SerDes interface lane 6 input, negative |
RX7+ | A1 | I | CML SerDes interface lane 7 input, positive |
RX7- | B1 | I | CML SerDes interface lane 7 input, negative |
SCLK | L9 | I | Serial interface clock. Internal pull-down. |
SDEN | M8 | I | Active low serial data enable, always an input to the DAC38RFxx. Internal pull-up. |
SDIO | M10 | I/O | Serial interface data. Bi-directional in 3-pin mode (default) and uni-directional input 4-pin mode. Internal pull-down. |
SDO | M9 | O | Uni-directional serial interface data output in 4-pin mode. The SDO pin is tri-stated in 3-pin interface mode (default). |
SLEEP | L8 | I | Active high asynchronous hardware power-down input. Internal pull-down. |
SYNC0+ | C4 | O | Synchronization request to transmitter for JESD204B link 0, LVDS positive output. |
SYNC0- | C3 | O | Synchronization request to transmitter for JESD204B link 0, LVDS negative output. |
SYNC1+ | C7 | O | Synchronization request to transmitter for JESD204B link 1, LVDS positive output. |
SYNC1- | C6 | O | Synchronization request to transmitter for JESD204B link 1, LVDS negative output. |
SYSREF+ | A3 | I | LVPECL SYSREF positive input, internal 100 Ω differential termination, self biased. This positive/negative pair is captured with the rising edge of DACCLKP/N. It is used for multiple DAC synchronization. |
SYSREF- | A4 | I | LVPECL SYSREF negative input, internal 100 Ω differential termination, self biased. (See the SYSREF+ description) |
TCLK | K4 | I | JTAG test clock. Internal pull-down |
TDI | H4 | I | JTAG test data in. Internal pull-up |
TDO | J4 | O | JTAG test data out. Internal pull-up |
TESTMODE | K3 | I | This pin is used for factory testing. Recommended to connect to ground. |
TMS | K5 | I | JTAG test mode select. Internal pull-up |
TRST | J5 | I | JTAG test reset. Must be connected to ground if not used. Internal pull-up |
TXENABLE | K6 | I | Transmit enable active high input. Internal pull-down. This pin is ORed with spi_txenable bit in JESD_FIFO register to enable analog output data transmission. To enable analog output data transmission, pull the CMOS TXENABLE pin to high. To disable analog output, pull CMOS TXENABLE pin to low. The DAC output is forced to midscale. |
VDDA1 | F11, J11 | I | Analog 1V supply voltage. Must be separated from VDDDIG1 for best performance. |
VDDA18 | G11, H11 | I | Analog 1.8V supply voltage. (1.8 V) |
VDDPLL1 | D8, E8 | I | Analog 1V supply for PLL. |
VDDAPLL18 | B9, B10 | I | PLL analog supply voltage. (1.8 V) |
VDDAVCO18 | D9, E9 | I | Analog supply voltage for VCO (1.8 V) |
VDDCLK1 | G9, H9 | I | Internal clock buffer supply voltage (1 V) It is recommended to isolate this supply from VDDDIG1 and VDDA1. |
VDDL1_1 | G8, H8 | I | DAC core supply voltage. (1 V) |
VDDL2_1 | G10, H10 | I | DAC core supply voltage. (1 V) |
VDDDIG1 | A5, B5, C5, D5, D7, E3, E4, E5, E6, F4, F5, G4, G5 | I | Digital supply voltage. (1 V) It is recommended to isolate this supply from VDDCLK1 and VDDA1. |
VDDE1 | F7, H7, G6, J6 | I | Digital Encoder supply voltage (1 V). Must be separated from VDDDIG1 for best performance. |
VDDIO18 | H5 | I | Supply voltage for all digital I/O and CMOS I/O. (1.8 V) |
VDDOUT18 | G12, H12 | I | DAC supply voltage (1.8 V) |
VDDR18 | H2, J2 | I | Supply voltage for SerDes. (1.8 V) |
VDDS18 | B3, B4 | I | Supply voltage for LVDS SYNC0+/- and SYNC1+/- (1.8V) |
VDDT1 | H3, J3 | I | Supply voltage for SerDes termination. (1 V) |
VDDTX1 | B6 | I | Supply voltage for divided clock output. (1 V) |
VDDTX18 | B7 | I | Supply voltage for divided clock output. (1.8 V) |
VEE18N | D10, E10, K10, L10 | I | Analog supply voltage. (-1.8 V) |
VOUT1 | K12 | O | DAC channel 1 single ended output. |
VOUT2 | E12 | O | DAC channel 2 single ended output. |
VSENSE | D4 | I | Test pin for on chip parametrics. Can be left floating. |
VSSCLK | A8, A11, B8, B11, B12, F8, F9, F10, J8, J9, J10 | - | Clock ground. |
MIN | MAX | UNIT | ||
---|---|---|---|---|
Supply Voltage Range(2) | VDDDAC1, VDDDIG1, VDDL1_1, VDDL2_1, VDDCLK1, VDDT1, VDDCLK1, VDDTX1, VDDE1 | –0.3 | 1.3 | V |
VDDR18, VDDIO18, VDDS18, VDDAPLL18, VDDOUT18, VDDA18, VDDAVCO18, VDDTX18 | –0.3 | 2.45 | V | |
VEE18N | –2 | 0.3 | V | |
Voltage between AGND and DGND | –0.3 | 0.3 | V | |
Pin Voltage Range(2) | RX[0..7]+/- | –0.5 | VDDDIG1 + 0.5 V | V |
SDEN, SCLK, SDIO, SDO, TXENABLE, ALARM, RESET, SLEEP, TMS, TCLK, TDI, TDO, TRST, TESTMODE, GPI0, GPI1, GPO0, GPO1 | –0.5 | VDDIO + 0.5 V | V | |
CLKOUT+/- | –0.5 | VDDTX18 + 0.5 V | V | |
DACCLK+/-, SYSREF+/-, DACCLKSE | –0.5 | VDDCLK1 + 0.5 V | V | |
SYNC0+/-, SYNC1+/- | –0.5 | VDDS18 + 0.5 V | V | |
VOUT1+/-, VOUT2+/- | –0.5 | VDDAOUT18 + 0.5 V | V | |
RBIAS, EXTIO, ATEST | –0.5 | VDDAOUT18 + 0.5 V | V | |
IFORCE, VSENSE | –0.5 | VDDDIG1 + 0.5 V | V | |
AMUX1, AMUX0 | –0.5 | VDDT1 + 0.5 V | V | |
Peak input current (any input) | 20 | mA | ||
Peak total input current (all inputs) | –30 | mA | ||
Junction temperature TJ | 150 | °C | ||
Operating free-air temperature, TA | –40 | 85 | °C | |
Storage temperature, Tstg | –65 | 150 | °C |
VALUE | UNIT | |||
---|---|---|---|---|
V(ESD) | Electrostatic discharge | Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) | ±1000 | V |
Charged-device model (CDM), per JEDEC specification JESD22-C101(2) | ±250 |
MIN | NOM | MAX | UNIT | |||
---|---|---|---|---|---|---|
TJ | Recommended operating temperature | 105 | °C | |||
Maximum rated operating junction temperature(1) | 125 | °C | ||||
TA | Recommended free-air temperature | –40 | 85 | °C | ||
Supply Voltage Range | VDDA18, VDDAPLL18, VDDS18, VDDIO18, VDDR18, VDDAPLL18, VDDOUT18, VDDAVCO18 | 1.71 | 1.8 | 1.89 | V | |
VDDDIG1 VDDA1, VDDT1, VDDAPLL1, VDDCLK1, VDDL1_1, VDDL2_1, VDDTX1, VDDE1 | 0.95 | 1 | 1.05 | V | ||
VEE18N | -1.89 | -1.8 | -1.71 | V |
THERMAL METRIC(1) | AAV (FCBGA) | UNIT | |
---|---|---|---|
144 PINS | |||
RθJA | Junction-to-ambient thermal resistance | 25 | °C/W |
RθJC(top) | Junction-to-case (top) thermal resistance | 1.0 | °C/W |
RθJB | Junction-to-board thermal resistance | 7.7 | °C/W |
ψJT | Junction-to-top characterization parameter | 0.1 | °C/W |
ψJB | Junction-to-board characterization parameter | 7.7 | °C/W |
RθJC(bot) | Junction-to-case (bottom) thermal resistance | N/A | °C/W |
PARAMETER | TEST CONDITIONS | DAC38RF87/97 | DAC38RF86/96 | UNIT | |||||
---|---|---|---|---|---|---|---|---|---|
MIN | TYP | MAX | MIN | TYP | MAX | ||||
PLL/VCO | |||||||||
fref | Reference clock frequency | 100 | fVCO /4 | 100 | fVCO /4 | MHz | |||
fPFD | Frequency of phase & frequency detector | 100 | 500 | 100 | 500 | MHz | |||
fvcoL | Low VCO operating frequency | 5240 | 6720 | MHz | |||||
fvcoH | High VCO operating frequency | 7970 | 9000 | MHz | |||||
fBW | Loop filter bandwidth | 500 | 500 | KHz | |||||
Low VCO Phase Noise | |||||||||
Frequency Offset | 600 KHz | fvco = 6 GHz,CP = 5, fPFD = 500 MHz, measured at output frequency = 1.8 GHz | -125 | dBc/Hz | |||||
1.2 MHz | -132 | ||||||||
1.8 MHz | -137 | ||||||||
6.0 MHz | -148 | ||||||||
High VCO Phase Noise | |||||||||
Frequency Offset | 600 kHz | fvco = 9 GHz, CP=5, fPFD= 500 MHz, measured at output frequency = 1.8 GHz | -124 | dBc/Hz | |||||
1.2 MHz | -133 | ||||||||
1.8 MHz | -138 | ||||||||
6.0 MHz | -149 |
MIN | NOM | MAX | UNIT | |||
---|---|---|---|---|---|---|
DIGITAL INPUT TIMING SPECIFICATIONS | ||||||
TIMING: SYSREF+/- | ||||||
ts(SYSREF) | Setup time, SYSREF+/- valid to rising edge of DACCLK+/- | SYSREF Capture assist disabled | 50 | ps | ||
th(SYSREF) | Hold time, SYSREF+/- valid after rising edge of DACCLK+/- | SYSREF Capture assist disabled | 50 | ps | ||
TIMING: SERIAL PORT | ||||||
ts(/SDEN) | Setup time, SDEN to rising edge of SCLK | 20 | ns | |||
ts(SDIO) | Setup time, SDIO valid to rising edge of SCLK | 10 | ns | |||
th(SDIO) | Hold time, SDIO valid after rising edge of SCLK | 5 | ns | |||
t(SCLK) | Period of SCLK | temperature sensor read | 1 | µs | ||
All other registers | 100 | ns | ||||
td(Data) | Data output delay after falling edge of SCLK | 25 | ns | |||
tRESET | Minimum RESET pulse width | 25 | ns | |||
ANALOG OUTPUT | ||||||
ts(DAC) | Output settling time to 0.1% | 1 | ns | |||
tr | Output rise time 10% to 90% | 50 | ns | |||
tf | Output fall time 90% to 10% | 50 | ns | |||
LATENCY | ||||||
RX SerDes AnalogDelay | 250 | ps | ||||
DAC wake-up time | IOUT current settling to 1% of IOUTFS from deep sleep | 90 | µs | |||
DAC sleep time | IOUT current settling to less than 1% of IOUTFS in deep sleep | 90 | µs |
Unless otherwise noted, all plots are at TA = 25°C, nominal supply voltages, fDAC = 9 GSPS, 12x interpolation, 0 dBFS digital input, 40 mA full scale output current , LMFSHd = 84111 and on-chip PLL mode is enabled.
Measured 50 MHz from carrier |
Excludes HD2, HD3 and CMP2 |
±250 MHz Span |
VCO frequency = 8.85 GHz | Measured at 1.8 GHz |
Measured 50 MHz from carrier |
Excludes HD2, HD3 and CMP2 |
± 250 MHz Span |
VCO frequency = 8.85 GHz |
Unless otherwise noted, all plots are at TA = 25°C, nominal supply voltages, fDAC = 6.2 GSPS, 12x interpolation, 0dBFS digital input, 40 mA full scale output current , LMFSHd = 84111 and on-chip PLL mode is enabled.
Measured 50 MHz from carrier |
Excludes HD2, HD3 and CMP2 |
± 250 MHz Span |
VCO frequency = 5.9 GHz | measured at 1.8 GHz |
Measured 50 MHz from carrier |
Excludes HD2, HD3 and CMP2 |
± 250 MHz Span |
VCO frequency = 5.9 GHz |