SLAS476H March   2006  – June 2017 DAC8550

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Timing Characteristics
    7. 6.7 Typical Characteristics
      1. 6.7.1 VDD = 5 V
      2. 6.7.2 VDD = 2.7 V
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 DAC Section
        1. 7.3.1.1 Resistor String
        2. 7.3.1.2 Output Amplifier
      2. 7.3.2 Power-On Reset
    4. 7.4 Device Functional Modes
      1. 7.4.1 Power-Down Modes
    5. 7.5 Programming
      1. 7.5.1 Serial Interface
      2. 7.5.2 Input Shift Register
      3. 7.5.3 SYNC Interrupt
  8. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Bipolar Operation Using DAC8550
    2. 8.2 Typical Applications
      1. 8.2.1 Loop-Powered 2-Wire 4-mA to 20-mA Transmitter With XTR116
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Design Procedure
        3. 8.2.1.3 Application Curves
      2. 8.2.2 Using REF02 as a Power Supply for DAC8550
        1. 8.2.2.1 Design Requirements
        2. 8.2.2.2 Detailed Design Procedure
    3. 8.3 System Examples
      1. 8.3.1 Microprocessor Interfacing
        1. 8.3.1.1 DAC8550 to 8051 Interface
        2. 8.3.1.2 DAC8550 to Microwire Interface
        3. 8.3.1.3 DAC8550 to 68HC11 Interface
  9. 9 Power Supply Recommendations
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  11. 11Device and Documentation Support
    1. 11.1 Documentation Support
      1. 11.1.1 Related Documentation
    2. 11.2 Receiving Notification of Documentation Updates
    3. 11.3 Community Resources
    4. 11.4 Trademarks
    5. 11.5 Electrostatic Discharge Caution
    6. 11.6 Glossary
  12. 12Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

4 Revision History

Changes from G Revision (February 2017) to H Revision

  • Changed the VIL Test Conditions From: VDD = 5 V To: 3 V ≤ VDD ≤ 5.5 V and From: VDD = 3 V To: 2.7 V ≤ VDD < 3 V in the Electrical CharacteristicsGo
  • Changed the VIH Test Conditions From: VDD = 5 V To: 3 V ≤ VDD ≤ 5.5 V and From: VDD = 3 V To: 2.7 V ≤ VDD < 3 V in the Electrical CharacteristicsGo

Changes from F Revision (March 2016) to G Revision

  • Relative accuracy DAC8550, Deleted the TYP value of ± 3, Changed the MAX value From: ±8 To: ±16 in the Electrical Characteristics Go
  • Relative accuracy DAC8550B, Deleted the TYP value of ± 3, Changed the MAX value From: ±8 To: ±12 in the Electrical Characteristics Go

Changes from E Revision (March 2012) to F Revision

  • Added ESD Ratings table, Feature Description section, Device Functional Modes, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information sectionGo
  • Changed Differential nonlinearity Test Conditions From: 16-bit monotonic To: three separate entries in the Electrical Characteristics Go

Changes from D Revision (October 2006) to E Revision

  • Changed low-level input voltage values in Electrcial CharacteristicsGo
  • Changed high-level input voltage values in Electrcial CharacteristicsGo

Changes from C Revision (March 2006) to D Revision

  • Changed FeaturesGo
  • Changed relative accuracy feature from 8 LSB (Max) to 3 LSBGo
  • Changed micropower operation feature from 200 μA at 5 V to 140 μA at 2.7 VGo
  • Changed power consumption from 1 mW at 5 V to 0.38 mW at 2.7 VGo
  • Changed power-down consumption from 1 mW to less than 1 mW in DescriptionGo
  • Changed relative accuracy for DAC8550 typical value from ±5 to ±3Go
  • Changed reference current input range for VREF = 5 V from 50 to 40Go
  • Deleted reference current included from IDD (normal mode) test conditionsGo
  • Changed IDD (normal mode) typical values from 200 and 180 to 160 and 140Go
  • Changed Timing Diagram and Timing CharacteristicsGo