4 Revision History
Changes from Revision C (January 2018) to Revision D (December 2021)
- 文書全体にわたって表、図、相互参照の採番方法を更新Go
- Changed Loop compliance voltage to Reference input
voltage, and Reference input voltage to External reference
current in Recommended Operating Conditions
Go
- Changed Digital input low voltage test condition upper limit
from 2.6 V to 3.6 V in Recommended Operating Conditions
Go
- Deleted Timing Requirements: Daisy-Chain Mode section and
Daisy-Chain Mode Timing figureGo
- Deleted Power-Supply Sequence section; content moved to
Power Supply Recommendations sectionGo
- Deleted daisy-chain operation content from Watchdog Timer
sectionGo
- Deleted The DACx750 Shares the SPI Bus With Other Devices
subsection from Watchdog Timer sectionGo
- Deleted daisy-chain operation from Frame Error Checking
sectionGo
- Added CRC fault reset command of 0x96 to Frame Error Checking
sectionGo
- Deleted The DACx750 Shares the SPI Bus With Other Devices
subsectionGo
- Changed duplicated 010 step-size from 0.125 to 0.25 in Table 8-3, Slew
Rate Step-Size Options
Go
- Added CRC fault reset command to Table 8-8, Write Address
Functions
Go
- Deleted Daisy-Chain Operation sectionGo
- Added Multiple Devices on the Bus sectionGo
- Changed Table 8-11 to delete daisy-chain operation and add CRC fault
resetGo
- Changed DCEN to Reserved for DB3 in Control Register
tableGo
- Deleted text stating CAP2 pin is only available for the 40-pin VQFN
packageGo
- Added series resistance for supply and corrected HART-IN capacitance
for Figure 9-3Go
- Added content from deleted Power-Supply Sequence section to
Power Supply Recommendations sectionGo
- Added fast supply ramp and series resistance content to
Power-Supply Recommendations
Go
- Added power supply series resistance to Figure 11-1, Layout
Example
Go
Changes from Revision B (June 2016) to Revision C (January 2018)
- Added last paragraph to User Calibration
sectionGo
- Added last paragraph to Programmable Slew Rate
sectionGo