JAJSQF9 August   2024 DLP472TP

PRODUCTION DATA  

  1.   1
  2. 1 特長
  3. 2 アプリケーション
  4. 3 概要
  5. 4 Pin Configuration and Functions
    1. 4.1 Pin Functions
  6. 5 Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  Storage Conditions
    3. 5.3  ESD Ratings
    4. 5.4  Recommended Operating Conditions
    5.     12
    6. 5.5  Thermal Information
    7. 5.6  Electrical Characteristics
    8. 5.7  Switching Characteristics
    9. 5.8  Timing Requirements
    10.     17
    11. 5.9  System Mounting Interface Loads
    12.     19
    13. 5.10 Micromirror Array Physical Characteristics
    14.     21
    15. 5.11 Micromirror Array Optical Characteristics
    16.     23
    17. 5.12 Window Characteristics
    18. 5.13 Chipset Component Usage Specification
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Power Interface
      2. 6.3.2 LPSDR Low-Speed Interface
      3. 6.3.3 High-Speed Interface
      4. 6.3.4 Timing
    4. 6.4 Device Functional Modes
    5. 6.5 Optical Interface and System Image Quality Considerations
      1. 6.5.1 Numerical Aperture and Stray Light Control
      2. 6.5.2 Pupil Match
      3. 6.5.3 Illumination Overfill
    6. 6.6 Micromirror Array Temperature Calculation
    7. 6.7 Micromirror Power Density Calculation
    8. 6.8 Micromirror Landed-On/Landed-Off Duty Cycle
      1. 6.8.1 Definition of Micromirror Landed-On/Landed-Off Duty Cycle
      2. 6.8.2 Landed Duty Cycle and Useful Life of the DMD
      3. 6.8.3 Landed Duty Cycle and Operational DMD Temperature
      4. 6.8.4 Estimating the Long-Term Average Landed Duty Cycle of a Product or Application
  8. 7 Application and Implementation
    1. 7.1 Application Information
    2. 7.2 Typical Application
      1. 7.2.1 Design Requirements
      2. 7.2.2 Detailed Design Procedure
      3. 7.2.3 Application Curve
    3. 7.3 Temperature Sensor Diode
  9. 8 Power Supply Recommendations
    1. 8.1 DMD Power Supply Power-Up Procedure
    2. 8.2 DMD Power Supply Power-Down Procedure
  10. 9 Layout
    1. 9.1 Layout Guidelines
    2. 9.2 Layout Example
  11. 10Device and Documentation Support
    1. 10.1 サード・パーティ製品に関する免責事項
    2. 10.2 Device Support
      1. 10.2.1 Device Nomenclature
      2. 10.2.2 Device Markings
    3. 10.3 Documentation Support
      1. 10.3.1 Related Documentation
    4. 10.4 ドキュメントの更新通知を受け取る方法
    5. 10.5 Trademarks
    6. 10.6 静電気放電に関する注意事項
    7. 10.7 用語集
  12. 11Revision History
  13. 12Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

DLP472TP LPSDR Switching Parameters
The low-speed interface is LPSDR and adheres to the Electrical Characteristics and AC/DC Operating Conditions table in JEDEC Standard No. 209B, Low Power Double Data Rate (LPDDR) JESD209B.
Figure 5-2 LPSDR Switching Parameters
DLP472TP LPSDR Input Rise and Fall Slew RateFigure 5-3 LPSDR Input Rise and Fall Slew Rate
DLP472TP SubLVDS Input Rise and Fall Slew RateFigure 5-4 SubLVDS Input Rise and Fall Slew Rate
DLP472TP Window Time Derating ConceptFigure 5-5 Window Time Derating Concept
DLP472TP SubLVDS Switching ParametersFigure 5-6 SubLVDS Switching Parameters
DLP472TP High-Speed Training Scan Window
Note: Refer to Section 5.8 for details.
Figure 5-7 High-Speed Training Scan Window
DLP472TP SubLVDS Voltage ParametersFigure 5-8 SubLVDS Voltage Parameters
DLP472TP SubLVDS Waveform ParametersFigure 5-9 SubLVDS Waveform Parameters
DLP472TP SubLVDS Equivalent Input CircuitFigure 5-10 SubLVDS Equivalent Input Circuit
DLP472TP LPSDR Input HysteresisFigure 5-11 LPSDR Input Hysteresis
DLP472TP LPSDR Read OutFigure 5-12 LPSDR Read Out
DLP472TP Test Load Circuit for Output Propagation Measurement
See Section 5.6 for more information.
Figure 5-13 Test Load Circuit for Output Propagation Measurement