JAJSGK2 November   2018 DLP650LNIR

PRODUCTION DATA.  

  1. 1 特長
  2. 2 アプリケーション
  3. 3 概要
    1.     Device Images
      1.      アプリケーション概略図
  4. 4 改訂履歴
  5. 5 Pin Configuration and Functions
    1.     Pin Functions
  6. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  Storage Conditions
    3. 6.3  ESD Ratings
    4. 6.4  Recommended Operating Conditions
    5. 6.5  Thermal Information
    6. 6.6  Electrical Characteristics
    7. 6.7  Timing Requirements
    8. 6.8  System Mounting Interface Loads
    9. 6.9  Micromirror Array Physical Characteristics
    10. 6.10 Micromirror Array Optical Characteristics
    11. 6.11 Window Characteristics
    12. 6.12 Chipset Component Usage Specification
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 System Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 DLPC410: Digital Controller for DLP Discovery 4100 Chipset
      2. 7.3.2 DLPA200: DMD Micromirror Driver
      3. 7.3.3 DLPR410: PROM for DLP Discovery 4100 Chipset
      4. 7.3.4 DLP650LNIR: DLP 0.65 WXGA NIR 2xLVDS Series 450 DMD
        1. 7.3.4.1 DLP650LNIR Chipset Interfaces
          1. 7.3.4.1.1 DLPC410 Interface Description
            1. 7.3.4.1.1.1 DLPC410 IO
            2. 7.3.4.1.1.2 Initialization
            3. 7.3.4.1.1.3 DMD Device Detection
            4. 7.3.4.1.1.4 Power Down
          2. 7.3.4.1.2 DLPC410 to DMD Interface
            1. 7.3.4.1.2.1 DLPC410 to DMD IO Description
            2. 7.3.4.1.2.2 Data Flow
          3. 7.3.4.1.3 DLPC410 to DLPA200 Interface
            1. 7.3.4.1.3.1 DLPA200 Operation
            2. 7.3.4.1.3.2 DLPC410 to DLPA200 IO Description
          4. 7.3.4.1.4 DLPA200 to DLP650LNIR Interface
            1. 7.3.4.1.4.1 DLPA200 to DLP650LNIR Interface Overview
      5. 7.3.5 Measurement Conditions
    4. 7.4 Device Operational Modes
      1. 7.4.1 DMD Block Modes
        1. 7.4.1.1 Single Block Mode
        2. 7.4.1.2 Dual Block Mode
        3. 7.4.1.3 Quad Block Mode
        4. 7.4.1.4 Global Mode
      2. 7.4.2 DMD Load4 Mode
    5. 7.5 Feature Description
      1. 7.5.1 Power Interface
      2. 7.5.2 Timing
    6. 7.6 Optical Interface and System Image Quality Considerations
      1. 7.6.1 Optical Interface and System Image Quality
      2. 7.6.2 Numerical Aperture and Stray Light Control
      3. 7.6.3 Pupil Match
      4. 7.6.4 Illumination Overfill
    7. 7.7 Micromirror Temperature Calculations
      1. 7.7.1 Sample Calculation 1: Uniform Illumination of Entire DMD Active Array (1280 × 800 pixels)
      2. 7.7.2 Sample Calculation 2: Partial DMD Active Array Illumination with Non-uniform Illumination Peak
    8. 7.8 Micromirror Landed-On/Landed-Off Duty Cycle
      1. 7.8.1 Definition of Micromirror Landed-On/Landed-Off Duty Cycle
      2. 7.8.2 Landed Duty Cycle and Useful Life of the DMD
      3. 7.8.3 Landed Duty Cycle and Operational DMD Temperature
      4. 7.8.4 Estimating the Long-Term Average Landed Duty Cycle of a Product or Application
  8. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Device Description
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
  9. 9 Power Supply Recommendations
  10. 10Layout
    1. 10.1 Layout Guidelines
      1. 10.1.1 Impedance Requirements
      2. 10.1.2 PCB Signal Routing
      3. 10.1.3 Fiducials
      4. 10.1.4 DMD Interface
        1. 10.1.4.1 Trace Length Matching
      5. 10.1.5 DLP650LNIR Decoupling
        1. 10.1.5.1 Decoupling Capacitors
      6. 10.1.6 VCC and VCC2
      7. 10.1.7 DMD Layout
      8. 10.1.8 DLPA200
    2. 10.2 Layout Example
  11. 11デバイスおよびドキュメントのサポート
    1. 11.1 デバイス・サポート
      1. 11.1.1 デバイスの項目表記
      2. 11.1.2 デバイスのマーキング
    2. 11.2 ドキュメントのサポート
      1. 11.2.1 関連資料
    3. 11.3 関連リンク
    4. 11.4 ドキュメントの更新通知を受け取る方法
    5. 11.5 コミュニティ・リソース
    6. 11.6 商標
    7. 11.7 静電気放電に関する注意事項
    8. 11.8 Glossary
  12. 12メカニカル、パッケージ、および注文情報

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

7.6 Optical Interface and System Image Quality Considerations

NOTE

TI assumes no responsibility for image quality artifacts or DMD failures caused by optical system operating conditions exceeding limits described previously.