JAJSLA9E may   2015  – april 2023 DLP7000UV

PRODUCTION DATA  

  1. 特長
  2. アプリケーション
  3. 概要
  4. Revision History
  5. 概要 (続き)
  6. Pin Configuration and Functions
  7. Specifications
    1. 7.1  Absolute Maximum Ratings
    2. 7.2  Storage Conditions
    3. 7.3  ESD Ratings
    4. 7.4  Recommended Operating Conditions
    5. 7.5  Thermal Information
    6. 7.6  Electrical Characteristics
    7. 7.7  LVDS Timing Requirements
    8. 7.8  LVDS Waveform Requirements
    9. 7.9  Serial Control Bus Timing Requirements
    10. 7.10 Systems Mounting Interface Loads
    11. 7.11 Micromirror Array Physical Characteristics
    12. 7.12 Micromirror Array Optical Characteristics
    13. 7.13 Window Characteristics
    14. 7.14 Chipset Component Usage Specification
  8. Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 DLPC410 - Digital Controller for DLP Discovery 4100 Chipset
      2. 8.3.2 DLPA200 DMD Micromirror Driver
      3. 8.3.3 DLPR410 - PROM for DLP Discovery 4100 Chipset
      4. 8.3.4 DLP7000 - DLP 0.7 XGA 2xLVDS UV Type-A DMD
        1. 8.3.4.1 DLP7000UV Chipset Interfaces
          1. 8.3.4.1.1 DLPC410 Interface Description
            1. 8.3.4.1.1.1 DLPC410 IO
            2. 8.3.4.1.1.2 Initialization
            3. 8.3.4.1.1.3 DMD Device Detection
            4. 8.3.4.1.1.4 Power Down
        2. 8.3.4.2 DLPC410 to DMD Interface
          1. 8.3.4.2.1 DLPC410 to DMD IO Description
          2. 8.3.4.2.2 Data Flow
        3. 8.3.4.3 DLPC410 to DLPA200 Interface
          1. 8.3.4.3.1 DLPA200 Operation
          2. 8.3.4.3.2 DLPC410 to DLPA200 IO Description
        4. 8.3.4.4 DLPA200 to DLP7000UV Interface Overview
      5. 8.3.5 Measurement Conditions
    4. 8.4 Device Functional Modes
      1. 8.4.1 DMD Operation
        1. 8.4.1.1 Single Block Mode
        2. 8.4.1.2 Dual Block Mode
        3. 8.4.1.3 Quad Block Mode
        4. 8.4.1.4 Global Mode
    5. 8.5 Window Characteristics and Optics
      1. 8.5.1 Optical Interface and System Image Quality
      2. 8.5.2 Numerical Aperture and Stray Light Control
      3. 8.5.3 Pupil Match
      4. 8.5.4 Illumination Overfill
    6. 8.6 Micromirror Array Temperature Calculation
      1. 8.6.1 Package Thermal Resistance
      2. 8.6.2 Case Temperature
      3. 8.6.3 Micromirror Array Temperature Calculation
    7. 8.7 Micromirror Landed-On/Landed-Off Duty Cycle
      1. 8.7.1 Definition of Micromirror Landed-On/Landed-Off Duty Cycle
      2. 8.7.2 Landed Duty Cycle and Useful Life of the DMD
      3. 8.7.3 Landed Duty Cycle and Operational DMD Temperature
      4. 8.7.4 Estimating the Long-Term Average Landed Duty Cycle of a Product or Application
  9. Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 DMD Reflectivity Characteristics
      2. 9.1.2 Design Considerations Influencing DMD Reflectivity
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
      3. 9.2.3 Application Curve
  10. 10Power Supply Recommendations
    1. 10.1 Power-Up Sequence (Handled by the DLPC410)
  11. 11Layout
    1. 11.1 Layout Guidelines
      1. 11.1.1 Impedance Requirements
      2. 11.1.2 PCB Signal Routing
      3. 11.1.3 Fiducials
      4. 11.1.4 PCB Layout Guidelines
        1. 11.1.4.1 DMD Interface
          1. 11.1.4.1.1 Trace Length Matching
        2. 11.1.4.2 DLP7000UV Decoupling
          1. 11.1.4.2.1 Decoupling Capacitors
        3. 11.1.4.3 VCC and VCC2
        4. 11.1.4.4 DMD Layout
        5. 11.1.4.5 DLPA200
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Device Support
      1. 12.1.1 Device Nomenclature
        1. 12.1.1.1 Device Marking
    2. 12.2 Documentation Support
      1. 12.2.1 Related Documentation
    3. 12.3 Related Links
    4. 12.4 サポート・リソース
    5. 12.5 Trademarks
    6. 12.6 静電気放電に関する注意事項
    7. 12.7 用語集
  13. 13Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ(パッケージ|ピン)
サーマルパッド・メカニカル・データ
発注情報

Recommended Operating Conditions

over operating free-air temperature range (unless otherwise noted) (1)
MINNOMMAXUNIT
ELECTRICAL
VCCSupply voltage for LVCMOS core logic (2) (3)3.03.33.6V
VCCISupply voltage for LVDS receivers (2) (3)3.03.33.6V
VCC2Mirror electrode and HVCMOS supply voltage (2) (3)7.257.57.75V
VMBRSTClocking pulse waveform voltage applied to MBRST[15:0] input pins (supplied by DLPA200)–2726.5V
|VCC – VCCI|Supply voltage delta (absolute value) (3)0.3V
ENVIRONMENTAL
Illumination power density (4) (13)< 363 nm (12)2mW/cm2
363 to 400 nm (11)2.5W/cm2
3.7W
400 to 420 nm (11)11W/cm2
16.2W
363 to 420 nm total (10)(11)11W/cm2
16.2W
> 420 nmThermally limited (11)W/cm2
TCCase/array temperature (8)(9) 2030 (7)°C
TGRADIENTDevice temperature gradient – operational (6)10°C
RHRelative humidity (non-condensing)95%RH
Operating landed duty cycle (5)25%
The functional performance of the device specified in this datasheet is achieved when operating the device within the limits defined by the Recommended Operating Conditions. No level of performance is implied when operating the device above or below the Recommended Operating Conditions limits.
All voltages referenced to VSS (ground).
Voltages VCC, VCCI, and VCC2, are required for proper DMD operation.
Various application parameters can affect optimal, long-term performance of the DMD, including illumination spectrum, illumination power density, micromirror landed duty cycle, ambient temperature (both storage and operating), case temperature, and power-on or power-off duty cycle. TI recommends that application-specific effects be considered as early as possible in the design cycle.
Landed duty cycle refers to the percentage of time an individual micromirror spends landed in one state (12° or –12°) versus the other state (–12° or 12°).
As either measured, predicted, or both between any two points -- measured on the exterior of the package, or as predicted at any point inside the micromirror array cavity. Refer to Case Temperature and Section 8.6.
Refer to Section 8.6 for thermal test point locations, package thermal resistance, and device temperature calculation.
Temperature is the highest measured value of any test point shown in Figure 17 or the active array as calculated by the Section 8.6.
In some applications, the total DMD heat load can be dominated by the amount of incident light energy absorbed. Refer to Section 8.6 for further details.
The total integrated illumination power density from 363 to 420 nm shall not exceed 11 W/cm2 (or 16.2 W evenly distributed on the active array area). Therefore if 2.5 W/cm2 of illumination is used in the 363 to 400 nm range, then illumination in the 400 to 420 nm range must be limited to 8.5 W/cm2.
Also limited by the resulting micromirror array temperature. Refer to Section 8.6.2 and Section 8.6 for information related to calculating the micromirror array temperature.
The maximum operating conditions for operating temperature and illumination power density for wavelengths < 363 nm should not be implemented simultaneously.
Total integrated illumination power density, above or below the indicated wavelength threshold or in the indicated wavelength range.