over operating free-air temperature range (unless otherwise noted) (1) | MIN | NOM | MAX | UNIT |
---|
ELECTRICAL |
VCC | Supply voltage for LVCMOS core logic (2) (3) | 3.0 | 3.3 | 3.6 | V |
VCCI | Supply voltage for LVDS receivers (2) (3) | 3.0 | 3.3 | 3.6 | V |
VCC2 | Mirror electrode and HVCMOS supply voltage (2) (3) | 7.25 | 7.5 | 7.75 | V |
VMBRST | Clocking pulse waveform voltage applied to MBRST[15:0] input pins (supplied by DLPA200) | –27 | | 26.5 | V |
|VCC – VCCI| | Supply voltage delta (absolute value) (3) | | | 0.3 | V |
ENVIRONMENTAL
|
| Illumination power density (4) (13) | < 363 nm (12) | | | 2 | mW/cm2 |
363 to 400 nm (11) | | | 2.5 | W/cm2 |
| | 3.7 | W |
400 to 420 nm (11) | | | 11 | W/cm2 |
| | 16.2 | W |
363 to 420 nm total (10)(11) | | | 11 | W/cm2 |
| | 16.2 | W |
> 420 nm | Thermally limited (11) | W/cm2 |
TC | Case/array temperature (8)(9)
| 20 | | 30 (7) | °C |
TGRADIENT | Device temperature gradient – operational (6) | | | 10 | °C |
RH | Relative humidity (non-condensing) | | | 95 | %RH |
| Operating landed duty cycle (5) | | 25% | | |
(1) The functional performance of the device specified in this datasheet is achieved when operating the device within the limits defined by the Recommended Operating Conditions. No level of performance is implied when operating the device above or below the Recommended Operating Conditions limits.
(2) All voltages referenced to VSS (ground).
(3) Voltages VCC, VCCI, and VCC2, are required for proper DMD operation.
(4) Various application parameters can affect optimal, long-term
performance of the DMD, including illumination spectrum, illumination power
density, micromirror landed duty cycle, ambient temperature (both storage and
operating), case temperature, and power-on or power-off duty cycle. TI
recommends that application-specific effects be considered as early as possible
in the design cycle.
(5) Landed duty cycle refers to the percentage of time an
individual micromirror spends landed in one state (12° or –12°) versus the other
state (–12° or 12°).
(6) As either measured, predicted, or both between any two points
-- measured on the exterior of the package, or as predicted at any point inside
the micromirror array cavity. Refer to Case Temperature and
Section 8.6.
(7) Refer to
Section 8.6 for thermal test point locations, package thermal resistance, and
device temperature calculation.
(8) Temperature is the highest measured value of any test point
shown in Figure 17 or the active array as calculated by the
Section 8.6.
(9) In some applications, the total DMD heat load can be dominated
by the amount of incident light energy absorbed. Refer to
Section 8.6 for further details.
(10) The total integrated illumination power density from 363 to 420
nm shall not exceed 11 W/cm2 (or 16.2 W evenly distributed on the
active array area). Therefore if 2.5 W/cm2 of illumination is used in
the 363 to 400 nm range, then illumination in the 400 to 420 nm range must be
limited to 8.5 W/cm2.
(11) Also limited by the resulting micromirror array temperature.
Refer to
Section 8.6.2 and
Section 8.6 for information related to calculating the micromirror array
temperature.
(12) The maximum operating conditions for operating temperature and
illumination power density for wavelengths < 363 nm should not be implemented
simultaneously.
(13) Total integrated illumination power density, above or below the
indicated wavelength threshold or in the indicated wavelength range.