JAJSF42C April   2018  – December 2020 DLPC3478

PRODUCTION DATA  

  1. 1 特長
  2. 2 アプリケーション
  3. 3 概要
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Power Electrical Characteristics
    6. 6.6  Pin Electrical Characteristics
    7. 6.7  Internal Pullup and Pulldown Electrical Characteristics
    8. 6.8  DMD Sub-LVDS Interface Electrical Characteristics
    9. 6.9  DMD Low-Speed Interface Electrical Characteristics
    10. 6.10 System Oscillator Timing Requirements
    11. 6.11 Power Supply and Reset Timing Requirements
    12. 6.12 Parallel Interface Frame Timing Requirements
    13. 6.13 Parallel Interface General Timing Requirements
    14. 6.14 BT656 Interface General Timing Requirements
    15. 6.15 Flash Interface Timing Requirements
    16. 6.16 Other Timing Requirements
    17. 6.17 DMD Sub-LVDS Interface Switching Characteristics
    18. 6.18 DMD Parking Switching Characteristics
    19. 6.19 Chipset Component Usage Specification
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1  Input Source
        1. 7.3.1.1 Supported Resolution and Frame Rates
        2. 7.3.1.2 3D Display
        3. 7.3.1.3 Parallel Interface
          1. 7.3.1.3.1 PDATA Bus – Parallel Interface Bit Mapping Modes
      2. 7.3.2  Pattern Display
        1. 7.3.2.1 External Pattern Mode
          1. 7.3.2.1.1 8-bit Monochrome Patterns
          2. 7.3.2.1.2 1-Bit Monochrome Patterns
        2. 7.3.2.2 Internal Pattern Mode
          1. 7.3.2.2.1 Free Running Mode
          2. 7.3.2.2.2 Trigger In Mode
      3. 7.3.3  Device Startup
      4. 7.3.4  SPI Flash
        1. 7.3.4.1 SPI Flash Interface
        2. 7.3.4.2 SPI Flash Programming
      5. 7.3.5  I2C Interface
      6. 7.3.6  Content Adaptive Illumination Control (CAIC)
      7. 7.3.7  Local Area Brightness Boost (LABB)
      8. 7.3.8  3D Glasses Operation
      9. 7.3.9  Test Point Support
      10. 7.3.10 DMD Interface
        1. 7.3.10.1 Sub-LVDS (HS) Interface
    4. 7.4 Device Functional Modes
    5. 7.5 Programming
  8. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Pattern projector for 3D depth scanning
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Design Procedure
        3. 8.2.1.3 Application Curve
      2. 8.2.2 3D Depth Scanner Using Internal Pattern Streaming Mode
        1. 8.2.2.1 Design Requirements
        2. 8.2.2.2 Detailed Design Procedure
        3. 8.2.2.3 Application Curve
  9. 9 Power Supply Recommendations
    1. 9.1 PLL Design Considerations
    2. 9.2 System Power-Up and Power-Down Sequence
    3. 9.3 Power-Up Initialization Sequence
    4. 9.4 DMD Fast Park Control (PARKZ)
    5. 9.5 Hot Plug I/O Usage
  10. 10Layout
    1. 10.1 Layout Guidelines
      1. 10.1.1 PLL Power Layout
      2. 10.1.2 Reference Clock Layout
        1. 10.1.2.1 Recommended Crystal Oscillator Configuration
      3. 10.1.3 Unused Pins
      4. 10.1.4 DMD Control and Sub-LVDS Signals
      5. 10.1.5 Layer Changes
      6. 10.1.6 Stubs
      7. 10.1.7 Terminations
      8. 10.1.8 Routing Vias
      9. 10.1.9 Thermal Considerations
    2. 10.2 Layout Example
  11. 11Device and Documentation Support
    1. 11.1 Device Support
      1. 11.1.1 Third-Party Products Disclaimer
      2. 11.1.2 Device Nomenclature
        1. 11.1.2.1 Device Markings
      3. 11.1.3 Video Timing Parameter Definitions
    2. 11.2 Documentation Support
      1. 11.2.1 Related Documentation
    3. 11.3 ドキュメントの更新通知を受け取る方法
    4. 11.4 サポート・リソース
    5. 11.5 Trademarks
    6. 11.6 静電気放電に関する注意事項
    7. 11.7 用語集
  12. 12Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

7.3.9 Test Point Support

The DLPC34xx test point output port, TSTPT_(7:0), provides selected system calibration and controller debug support. These test points are inputs when reset is applied. These test points are outputs when reset is released. The controller samples the signal state upon the release of system reset and then uses the captured value to configure the test mode until the next time reset is applied. Because each test point includes an internal pulldown resistor, external pullups must be used to modify the default test configuration.

The default configuration (b000) corresponds to the TSTPT_(2:0) outputs remaining tri-stated to reduce switching activity during normal operation. For maximum flexibility, a jumper to external pullup resistors is recommended for TSTPT_(2:0). The pullup resistors on TSTPT_(2:0) can be used to configure the controller for a specific mode or option. TI does not recommend adding pullup resistors to TSTPT_(7:3) due to potentially adverse effects on normal operation. For normal use TSTPT_(7:3) should be left unconnected. The test points are sampled only during a 0-to-1 transition on the RESETZ input, so changing the configuration after reset is released does not have any effect until the next time reset asserts and releases. Table 7-9 describes the test mode selections for one programmable scenario defined by TSTPT_(2:0).

Table 7-9 Test Mode Selection Scenario Defined by TSTPT_(2:0)
TSTPT OUTPUT VALUE(1)NO SWITCHING ACTIVITYCLOCK DEBUG OUTPUT
TSTPT_(2:0) = 0b000TSTPT_(2:0) = 0b010
TSTPT_0HI-Z60 MHz
TSTPT_1HI-Z30 MHz
TSTPT_2HI-Z0.7 to 22.5 MHz
TSTPT_3HI-ZHIGH
TSTPT_4

HI-Z

LOW
TSTPT_5HI-ZHIGH
TSTPT_6HI-ZHIGH
TSTPT_7HI-Z7.5 MHz
(1) These are default output selections. Software can reprogram the selection at any time.