SLOSEC6 August   2024 DRV8434A-Q1

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
    1. 4.1 Pin Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 STEP and DIR Timing Requirements
      1. 5.6.1 Typical Characteristics
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Stepper Motor Driver Current Ratings
        1. 6.3.1.1 Peak Current Rating
        2. 6.3.1.2 RMS Current Rating
        3. 6.3.1.3 Full-Scale Current Rating
      2. 6.3.2 PWM Motor Drivers
      3. 6.3.3 Microstepping Indexer
      4. 6.3.4 Controlling VREF with an MCU DAC
      5. 6.3.5 Current Regulation and Decay Mode
        1. 6.3.5.1 Smart tune Ripple Control
        2. 6.3.5.2 Blanking time
      6. 6.3.6 Charge Pump
      7. 6.3.7 Linear Voltage Regulators
      8. 6.3.8 Logic Level, Tri-Level and Quad-Level Pin Diagrams
        1. 6.3.8.1 nFAULT and STL_REP Pin
      9. 6.3.9 Protection Circuits
        1. 6.3.9.1 VM Undervoltage Lockout (UVLO)
        2. 6.3.9.2 VCP Undervoltage Lockout (CPUV)
        3. 6.3.9.3 Overcurrent Protection (OCP)
        4. 6.3.9.4 Stall Detection
        5. 6.3.9.5 Open-Load Detection (OL)
        6. 6.3.9.6 Thermal Shutdown (OTSD)
        7.       Fault Condition Summary
    4. 6.4 Device Functional Modes
      1. 6.4.1 Sleep Mode (nSLEEP = 0)
      2.      43
      3. 6.4.2 Disable Mode (nSLEEP = 1, ENABLE = 0)
      4. 6.4.3 Operating Mode (nSLEEP = 1, ENABLE = Hi-Z/1)
      5. 6.4.4 nSLEEP Reset Pulse
      6.      Functional Modes Summary
  8. 7 Application and Implementation
    1. 7.1 Application Information
    2. 7.2 Typical Application
      1. 7.2.1 Design Requirements
      2. 7.2.2 Detailed Design Procedure
        1. 7.2.2.1 Stepper Motor Speed
        2. 7.2.2.2 Current Regulation
        3. 7.2.2.3 Decay Mode
        4. 7.2.2.4 Application Curves
        5. 7.2.2.5 Thermal Application
          1. 7.2.2.5.1 Power Dissipation
          2. 7.2.2.5.2 Conduction Loss
          3. 7.2.2.5.3 Switching Loss
          4. 7.2.2.5.4 Power Dissipation Due to Quiescent Current
          5. 7.2.2.5.5 Total Power Dissipation
          6. 7.2.2.5.6 Device Junction Temperature Estimation
  9. 8 Power Supply Recommendations
    1. 8.1 Bulk Capacitance
  10. 9 Layout
    1. 9.1 Layout Guidelines
    2. 9.2 Layout Example
  11. 10Device and Documentation Support
    1. 10.1 Related Documentation
    2. 10.2 Receiving Notification of Documentation Updates
    3. 10.3 Support Resources
    4. 10.4 Trademarks
    5. 10.5 Electrostatic Discharge Caution
    6. 10.6 Glossary
  12. 11Revision History
  13. 12Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

5.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)
MIN MAX UNIT
Power supply voltage (VM) –0.3 50 V
Charge pump voltage (VCP, CPH) –0.3 VVM + 7 V
Charge pump negative switching pin (CPL) –0.3 VVM V
nSLEEP pin voltage (nSLEEP) –0.3 VVM V
Internal regulator voltage (DVDD) –0.3 5.75 V
Control pin voltage (STEP, DIR, ENABLE, nFAULT, STL_MODE, STL_REP, TRQ_CNT/STL_TH, M0, M1) –0.3 5.75 V
Open drain output current (nFAULT, STL_REP) 0 10 mA
Reference input pin voltage (VREF) –0.3 5.75 V
Continuous phase node pin voltage (AOUT1, AOUT2, BOUT1, BOUT2) –1 VVM + 1 V
Transient 100 ns phase node pin voltage (AOUT1, AOUT2, BOUT1, BOUT2) –3 VVM + 3 V
Peak drive current (AOUT1, AOUT2, BOUT1, BOUT2) Internally Limited A
Operating ambient temperature, TA –40 125 °C
Operating junction temperature, TJ –40 150 °C
Storage temperature, Tstg –65 150 °C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.