SNLS338F January   2011  – November 2014 DS100BR111

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Simplified Schematic
  5. 5 Revision History
  6. 6 Pin Configuration and Functions
  7. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 Handling Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Electrical Characteristics
    5. 7.5 Electrical Characteristics — Serial Management Bus Interface
    6. 7.6 Timing Requirements — LOS and ENABLE / DISABLE Timing
    7. 7.7 Typical Characteristics
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 4-Level Control Pin Settings
    4. 8.4 Device Functional Modes
      1. 8.4.1 Pin Control Mode
      2. 8.4.2 SMBus Slave Mode
      3. 8.4.3 SMBus Master Mode
      4. 8.4.4 Signal Conditioning Settings
    5. 8.5 Programming
      1. 8.5.1 System Management Bus (SMBus) and Configuration Registers
      2. 8.5.2 Transfer Of Data Via the SMBus
      3. 8.5.3 SMBus Transactions
      4. 8.5.4 Writing a Register
      5. 8.5.5 Reading a Register
      6. 8.5.6 EEPROM Programming
        1. 8.5.6.1 Master EEPROM Programming
        2. 8.5.6.2 EEPROM Address Mapping
    6. 8.6 Register Maps
  9. 9 Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 Signal Integrity in 10G-KR Applications
      2. 9.1.2 OOB (Out-of-Band) Functionality in SAS/SATA Applications
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
      3. 9.2.3 Application Performance Plots
        1. 9.2.3.1 Equalization Results (Pre-Channel Only)
        2. 9.2.3.2 Equalization and De-Emphasis Results (Pre-channel and Post-channel, No Tx Source De-emphasis)
        3. 9.2.3.3 Equalization and De-Emphasis Results (Pre-channel and Post-channel, -6 dB Tx Source De-emphasis)
  10. 10Power Supply Recommendations
    1. 10.1 Power Supply Bypass
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Documentation Support
      1. 12.1.1 Related Documentation
    2. 12.2 Trademarks
    3. 12.3 Electrostatic Discharge Caution
    4. 12.4 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

7 Specifications

7.1 Absolute Maximum Ratings(1)(2)

MIN MAX UNIT
Supply Voltage (VDD) -0.5 +2.75 V
Supply Voltage (VIN) -0.5 +4.0 V
LVCMOS Input/Output Voltage -0.5 +4.0 V
CML Input Voltage -0.5 (VDD+0.5) V
CML Input Current -30 +30 mA
Junction Temperature 125 °C
(1) “Absolute Maximum Ratings” indicate limits beyond which damage to the device may occur, including inoperability and degradation of device reliability and/or performance. Functional operation of the device and/or non-degradation at the Absolute Maximum Ratings or other conditions beyond those indicated in the Recommended Operating Conditions is not implied.
(2) For soldering specifications, see SNOA549.

7.2 Handling Ratings

MIN MAX UNIT
Tstg Storage Temperature Range -40 +125 °C
V(ESD) Electrostatic Discharge Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins(1) -5 5 kV
Machine model (MM), STD - JESD22-A115-A 100 V
Charged device model (CDM), per JEDEC specification JESD22-C101, all pins(2) 1250 V
(1) JEDEC document JEP155 states that 500 V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250 V CDM allows safe manufacturing with a standard ESD control process.

7.3 Recommended Operating Conditions(1)

MIN TYP MAX UNIT
Supply Voltage (2.5 V mode) 2.375 2.5 2.625 V
Supply Voltage (3.3 V mode) 3.0 3.3 3.6 V
Ambient Temperature -40 25 +85 °C
SMBus (SDA, SCL) 3.6 V
(1) The Recommended Operating Conditions indicate conditions at which the device is functional and the device should not be operated beyond such conditions. Absolute Maximum Numbers are ensured for a junction temperature range of -40°C to +125°C. Models are validated to Maximum Operating Voltages only.

7.4 Electrical Characteristics

PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
POWER SUPPLY CURRENT
IDD Supply Current TX_DIS = Low, EQ = ON
VOD_SEL = Float (1000 mVpp)		 50 63 mA
Auto Low Power Mode
TX_DIS = Low, MODE = 20 kΩ
VID CHA and CHB = 0.0 V
VOD_SEL = Float (1000 mVpp)		 12 15
TX_DIS = High 25 35
LVCMOS DC SPECIFICATIONS
VIH25 High Level Input Voltage,
2-Level LVCMOS		 2.5 V Supply Mode 2.0 VDD V
VIH33 High Level Input Voltage,
2-Level LVCMOS		 3.3 V Supply Mode 2.0 VIN V
VIL Low Level Input Voltage,
2-Level LVCMOS		 GND 0.7 V
VOH High Level Output Voltage IOH = -4.0 mA (3) 2.0 V
VOL Low Level Output Voltage IOL = 4.0 mA 0.4 V
IIN Input Leakage Current Vinput = 0 V or VDD
VDD_SEL = Float		 -15 +15 µA
Vinput = 0 V or VIN
VDD_SEL = Low		 -15 +15
IIN-P Input Leakage Current
4-Level Input (1)		 Vinput = 0 V or VDD - 0.05 V
VDD_SEL = Float
Vinput = 0 V or VIN - 0.05 V
VDD_SEL = Low		 -160 +80 µA
CML RECEIVER INPUTS
VTX Source Transmit Launch Differential Signal Level Default power-up conditions
ENSMB = 0 or 1		 190 800 1600 mVp-p
RLRX-IN RX return loss SDD11 @ 4.1 GHz -12 dB
SDD11 @ 11.1 GHz -8
SCD11 @ 11.1 GHz -10
HIGH SPEED TRANSMITTER OUTPUTS
VOD1 Output Voltage Differential Swing OUT+ and OUT- AC coupled and terminated by 50 Ω to GND
VOD_SEL = Low (700 mVpp setting)
DE = Low		 500 650 800 mVp-p
VOD2 Output Voltage Differential Swing OUT+ and OUT- AC coupled and terminated by 50 Ω to GND
VOD_SEL = Float (1000 mVpp setting)
DE = Low		 800 1000 1100
VOD3 Output Voltage Differential Swing OUT+ and OUT- AC coupled and terminated by 50 Ω to GND
VOD_SEL = 20 kΩ to GND (1200 mVpp)
DE = Low		 950 1150 1350
VOD_DE1 De-Emphasis Levels OUT+ and OUT- AC coupled and terminated by 50 Ω to GND
VOD_SEL = Float (1000 mVpp)
DE = Float		 -3 dB
VOD_DE2 De-Emphasis Levels OUT+ and OUT- AC coupled and terminated by 50 Ω to GND
VOD_SEL = Float (1000 mVpp)
DE = 20 kΩ to GND		 -6 dB
VOD_DE3 De-Emphasis Levels OUT+ and OUT- AC coupled and terminated by 50 Ω to GND
VOD_SEL = Float (1000 mVpp)
DE = High		 -9 dB
VCM-AC Output Common-Mode Voltage AC Common Mode Voltage
DE = 0 dB, VOD ≤ 1000 mVpp		 4.5 mV (rms)
VCM-DC Output DC Common-Mode Voltage DC Common Mode Voltage 0 1.1 1.9 V
VIDLE TX IDLE Output Voltage VID = 0 mVp-p 30 mV
RLTX-DIFF TX return loss SDD22 @ 4.1 GHz -13 dB
SDD22 @ 11.1 GHz -9
SCC22 @ 2.5 GHz -22
SCC22 @ 11.1 GHz -10
Delta_ZM Transmitter Termination Mismatch DC, IFORCE = ± 100 µA (4) 2.5%
TR/F Transmitter Rise and Fall Time Measurement points at 20% - 80% (7) 38 ps
TPD Propagation Delay Measured at 50% crossing
EQ = 0x00		 230 ps
TCCSK Channel to Channel Skew T = 25°C, VDD = 2.5 V 7 ps
TPPSK Part to Part Skew T = 25°C, VDD = 2.5 V 20 ps
TTX-IDLE-SET-TO-IDLE Max time to transition to idle after differential signal VIN = 1 Vpp, 10 Gbps
EQ = 0x00, DE = 0 dB		 6.5 ns
TTX-IDLE-TO-DIFF-DATA Max time to transition to valid differential signal after idle VIN = 1 Vpp, 10 Gbps
EQ = 0x00, DE = 0 dB		 3.2 ns
TENV_DISTORT Active OOB timing distortion, input active time vs. output active time 3.3 ns
OUTPUT JITTER SPECIFICATIONS(2)
RJ Random Jitter No Media
Source Amplitude = 700 mVpp, PRBS15 pattern,
10.3125 Gbps
VOD = Default, EQ = minimum,
DE = 0 dB		 0.3 ps (rms)
DJ1 Deterministic Jitter 0.09 UI
EQUALIZATION
DJE1 Residual Deterministic Jitter 10.3125 Gbps
8 meter 30AWG Cable on Input
Source = 700 mVpp, PRBS15 pattern
EQ = 0x0F		 0.27 UI
DJE2 Residual Deterministic Jitter 10.3125 Gbps
30" 4-mil FR4 on Inputs
Source = 700 mVpp, PRBS15 pattern
EQ = 0x16		 0.17 UI
DE-EMPHASIS
DJD1 Residual Deterministic Jitter 10.3125 Gbps
10” 4 mil stripline FR4 on Outputs
Source = 700 mVpp, PRBS15 pattern
EQ = Min, VOD = 1200 mVpp,
DE = -3.5 dB		 0.13 UI
(1) Input is held to a maximum of 50 mV below VDD or VIN to simulate the use of a 1 kΩ resistor on the input.
(2) Typical jitter reported is determined by jitter decomposition software on the DSA8200 Oscilloscope.
(3) VOH only applies to the DONE pin; LOS, SCL, and SDA are open-drain outputs that have no internal pull-up capability. DONE is a full LVCMOS output with pull-up and pull-down capability.
(4) Force ±100 µA on output, measure ΔV on the Output and calculate impedance. Mismatch is the percentage difference of OUTn+ and OUTn- impedance driving the same logic state.
(5) Parameter not tested in production.

7.5 Electrical Characteristics — Serial Management Bus Interface

Over recommended operating supply and temperature ranges unless other specified.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
SERIAL BUS INTERFACE DC SPECIFICATIONS(1)
VIL Data, Clock Input Low Voltage 0.8 V
VIH Data, Clock Input High Voltage 2.1 3.6 V
IPULLUP Current Through Pull-Up Resistor or Current Source High Power Specification 4 mA
VDD Nominal Bus Voltage 2.375 3.6 V
ILEAK-Bus Input Leakage Per Bus Segment See (2) -200 +200 µA
CI Capacitance for SDA and SCL See (2)(3)(6) 10 pF
RTERM External Termination Resistance pull to VDD = 2.5V ± 5% OR 3.3V ± 10% Pullup VDD = 3.3 V, See (2)(3)(4) 2000 Ω
Pullup VDD = 2.5 V, See (2)(3)(4) 1000 Ω
SERIAL BUS INTERFACE TIMING SPECIFICATIONS
FSMB Bus Operating Frequency ENSMB = VDD (Slave Mode) 400 kHz
ENSMB = Float (Master Mode) (1) 280 400 520 kHz
TBUF Bus Free Time Between Stop and Start Condition 1.3 µs
THD:STA Hold time after (Repeated) Start Condition. After this period, the first clock is generated. At IPULLUP, Max 0.6 µs
TSU:STA Repeated Start Condition Setup Time 0.6 µs
TSU:STO Stop Condition Setup Time 0.6 µs
THD:DAT Data Hold Time 0 ns
TSU:DAT Data Setup Time 100 ns
TLOW Clock Low Period 1.3 µs
THIGH Clock High Period See (5) 0.6 50 µs
tF Clock/Data Fall Time See (5) 300 ns
tR Clock/Data Rise Time See (5) 300 ns
tPOR Time in which a device must be operational after power-on reset See (6)(5) 500 ms
(1) EEPROM interface requires 1 MHz capable EEPROM device.
(2) Recommended value.
(3) Recommended maximum capacitance load per bus segment is 400 pF.
(4) Maximum termination voltage should be identical to the device supply voltage.
(5) Compliant to SMBus 2.0 physical layer specification. See System Management Bus (SMBus) Specification Version 2.0, section 3.1.1 SMBus common AC specifications for details.
(6) Ensured by design and characterization. Parameter not tested in production.
(7) Default VOD used for testing. DE = -1.5 dB level used to compensate for fixture attenuation.

7.6 Timing Requirements — LOS and ENABLE / DISABLE Timing

PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
TLOS_OFF Input IDLE to Active
RX_LOS response time		 See (5) 0.035 µs
TLOS_ON Input Active to IDLE
RX_LOS response time		 See (5) 0.4 µs
TOFF TX Disable assert Time
TX_DIS = High to Output OFF		 See (5) 0.005 µs
TON TX Disable negateTime
TX_DIS = Low to Output ON		 See (5) 0.150 µs
TLP_EXIT Auto Low Power Exit
ALP to Normal Operation		 See (5) 150 ns
TLP_ENTER Auto Low Power Enter
Normal Operation to Auto Low Power		 See (5) 100 µs
edge.gifFigure 1. Output Rise and Fall Transition Times
30198703.gifFigure 2. Propagation Delay Timing Diagram
30198704.gifFigure 3. Transmit Idle-Data and Data-Idle Response Time
30198794.gifFigure 4. SMBus Timing Parameters

7.7 Typical Characteristics

The following data was collected at 25°C.
30138893.gif
Figure 5. Supply Current vs. Output Voltage Setting
30138895.gif
Figure 7. Output Voltage vs. Output Voltage Setting
30138894.gif
VOD = 700 mVpp
Figure 6. Supply Current vs. Supply Voltage