4 Revision History
Changes from D Revision (April 2014) to E Revision
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Changed "Terminal" terminology back to "Pin" Go
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Added statement about checkerboard pattern from deserializer data output when in BIST mode Go
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Added note that BISTEN pin must be high and REG = 0 to use BIST mode. Go
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Changed deserializer Reg 0x02[6] definition to match correct OSS_SEL behaviorGo
Changes from C Revision (April 2013) to D Revision
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Added Handling Ratings and Thermal Characteristics and updated datasheet to new layout. Go
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Changed Serializer Supply current power down test condition from VDDIO from 13.6V to 3.6V Go
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Added DC to "Deserializer Electrical Characteristics"Go
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Changed typical value to 36mA instead of 37mA Go
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Changed Test condition of VOUT for determining IOZGo
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Added max value for VIL when using 1.8V I/O LVCMOS Go
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Changed IOL from 3mA to 1.25mA Go
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Changed parentheses location of UI equation for clarification Go
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Added characteristic graphics for serializer CML driver output and deserializer LVCMOS clock output Go
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Added applications graphics of the serializer output with and without de-emphasis Go
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Added layout example and stencil diagram graphicsGo
Changes from B Revision (April 2013) to C Revision
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Changed layout of National Data Sheet to TI formatGo