SPRSP93 November 2024 F29H850TU , F29H859TU-Q1
ADVANCE INFORMATION
デバイスごとのパッケージ図は、PDF版データシートをご参照ください。
SIGNAL NAME | PIN TYPE | DESCRIPTION | 256 ZEX | 176 PTS | 144 RFS | 100 PZS |
---|---|---|---|---|---|---|
FLT3 | I/O | Flash test pin 3. Reserved for TI. Must be left unconnected. | M12 | |||
TCK | I | JTAG test clock with internal pullup. | R15 | 83 | 70 | 48 |
TMS | I/O | JTAG test-mode select (TMS) with internal pullup. This serial control input is clocked into the TAP controller on the rising edge of TCK. This device does not have a TRSTn pin. An external pullup resistor (recommended 2.2 kΩ) on the TMS pin to VDDIO should be placed on the board to keep JTAG in reset during normal operation. | T15 | 82 | 69 | 47 |
VREGENZ | I | Internal voltage regulator enable with internal pullup. Tie low to VSS to enable internal VREG. Tie high to VDDIO to use an external supply. | 65 | |||
XRSn | I/OD | Device Reset (in) and Watchdog Reset (out). During a power-on condition, this pin is driven low by the device. An external circuit may also drive this pin to assert a device reset. This pin is also driven low by the MCU when a watchdog reset occurs. During watchdog reset, the XRSn pin is driven low for the watchdog reset duration of 512 OSCCLK cycles. A resistor between 2.2 kΩ and 10 kΩ should be placed between XRSn and VDDIO. If a capacitor is placed between XRSn and VSS for noise filtering, it should be 100 nF or smaller. These values will allow the watchdog to properly drive the XRSn pin to VOL within 512 OSCCLK cycles when the watchdog reset is asserted. This pin is an open-drain output with an internal pullup. | F14 | 124 | 103 | 71 |