JAJSGE1B october   2018  – october 2020 ISO1042-Q1

PRODUCTION DATA  

  1.   1
  2. 1 特長
  3. 2 アプリケーション
  4. 3 概要
  5. 4 Revision History
  6. 5 Pin Configuration and Functions
  7. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Transient Immunity
    4. 6.4  Recommended Operating Conditions
    5. 6.5  Thermal Information
    6. 6.6  Power Ratings
    7. 6.7  Insulation Specifications
    8. 6.8  Safety-Related Certifications
    9. 6.9  Safety Limiting Values
    10. 6.10 Electrical Characteristics - DC Specification
    11. 6.11 Switching Characteristics
    12. 6.12 Insulation Characteristics Curves
    13. 6.13 Typical Characteristics
  8. 7 Parameter Measurement Information
    1. 7.1 Test Circuits
  9. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 CAN Bus States
      2. 8.3.2 Digital Inputs and Outputs: TXD (Input) and RXD (Output)
      3. 8.3.3 Protection Features
        1. 8.3.3.1 TXD Dominant Timeout (DTO)
        2. 8.3.3.2 Thermal Shutdown (TSD)
        3. 8.3.3.3 Undervoltage Lockout and Default State
        4. 8.3.3.4 Floating Pins
        5. 8.3.3.5 Unpowered Device
        6. 8.3.3.6 CAN Bus Short Circuit Current Limiting
    4. 8.4 Device Functional Modes
  10. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
        1. 9.2.2.1 Bus Loading, Length and Number of Nodes
        2. 9.2.2.2 CAN Termination
      3. 9.2.3 Application Curve
  11. 10Power Supply Recommendations
  12. 11Layout
    1. 11.1 Layout Guidelines
      1. 11.1.1 PCB Material
    2. 11.2 Layout Example
  13. 12Device and Documentation Support
    1. 12.1 Documentation Support
      1. 12.1.1 Related Documentation
    2. 12.2 Receiving Notification of Documentation Updates
    3. 12.3 サポート・リソース
    4. 12.4 Trademarks
    5. 12.5 静電気放電に関する注意事項
    6. 12.6 用語集
  14. 13Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

7.1 Test Circuits

GUID-ECDFC871-8FC1-4EB6-B296-CFACC55F0A98-low.gifFigure 7-1 Driver Voltage, Current and Test Definitions
GUID-69E3BC13-CE1C-401C-9427-530BB4C95676-low.gifFigure 7-2 Bus Logic State Voltage Definitions
GUID-73BBE1CE-4F1E-430D-ADD2-E3919714FA00-low.gif
A. The input pulse is supplied by a generator having the following characteristics: PRR ≤ 125 kHz, 50% duty cycle,
tr ≤ 6 ns, tf ≤ 6 ns, ZO = 50 Ω.
Figure 7-3 Driver Test Circuit and Voltage Waveforms
GUID-24FE2DD3-B913-49E8-BF7C-22144F688BB8-low.gifFigure 7-4 Receiver Voltage and Current Definitions
GUID-34B3148E-8976-41C5-B116-9ACFE863673E-low.gif
A. The input pulse is supplied by a generator having the following characteristics: PRR ≤ 125 kHz, 50% duty cycle,
tr ≤ 6 ns, tf ≤ 6 ns, ZO = 50 Ω.
Figure 7-5 Receiver Test Circuit and Voltage Waveforms
Table 7-1 Receiver Differential Input Voltage Threshold Test
INPUTOUTPUT
VCANHVCANL|VID|RXD
-29.5 V-30.5 V1000 mVLVOL
30.5 V29.5 V1000 mVL
-19.55 V-20.45 V900 mVL
20.45 V19.55 V900 mVL
-19.75 V-20.25 V500 mVHVOH
20.25 V19.75 V500 mVH
-29.8 V-30.2 V400 mVH
30.2 V29.8 V400 mVH
OpenOpenXH
GUID-E0DD8903-2765-4645-85D6-5CF2B6689A87-low.gifFigure 7-6 tLOOP Test Circuit and Voltage Waveforms
GUID-6BCAAF1C-472C-44A3-B6A6-1A0F1B6B6E3D-low.gifFigure 7-7 CAN FD Timing Parameter Measurement
GUID-97C7BC20-0297-49C3-951E-5A4C52795C93-low.gif
A. The input pulse is supplied by a generator having the following characteristics: tr ≤ 6 ns, tf ≤ 6 ns, ZO = 50 Ω.
Figure 7-8 Dominant Time-out Test Circuit and Voltage Waveforms
GUID-986CAACF-0DB4-4E55-85E0-877C34D16CEA-low.gifFigure 7-9 Driver Short-Circuit Current Test Circuit and Waveforms
GUID-FCF6652D-AA1C-49F6-828A-67B68FADD315-low.gifFigure 7-10 Common-Mode Transient Immunity Test Circuit