JAJSKQ4B February   2020  – May 2021 ISO1640 , ISO1641

PRODUCTION DATA  

  1. 1 特長
  2. 2 アプリケーション
  3. 3 概要
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Power Ratings
    6. 6.6  Insulation Specifications
    7. 6.7  Safety-Related Certifications
    8. 6.8  Safety Limiting Values
    9. 6.9  Electrical Characteristics
    10. 6.10 Supply Current Characteristics
    11. 6.11 Timing Requirements
    12. 6.12 I2C Switching Characteristics
    13. 6.13 GPIO Switching Characteristics
    14. 6.14 Insulation Characteristics Curves
    15. 6.15 Typical Characteristics
  7. 7 Parameter Measurement Information
    1. 7.1 Parameter Measurement Information
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagrams
    3. 8.3 Feature Description
      1. 8.3.1 Hot Swap
      2. 8.3.2 Protection Features
      3. 8.3.3 GPIO Channels
    4. 8.4 Isolator Functional Principle
      1. 8.4.1 Receive Direction (Left Diagram of Figure 1-1 )
      2. 8.4.2 Transmit Direction (Right Diagram of Figure 1-1 )
    5. 8.5 Device Functional Modes
  9. 9 Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 I2C Bus Overview
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
      3. 9.2.3 Application Curve
    3. 9.3 Insulation Lifetime
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
      1. 11.1.1 PCB Material
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Documentation Support
      1. 12.1.1 Related Documentation
    2. 12.2 Receiving Notification of Documentation Updates
    3. 12.3 サポート・リソース
    4. 12.4 Trademarks
    5. 12.5 Electrostatic Discharge Caution
    6. 12.6 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

9.3 Insulation Lifetime

Insulation lifetime projection data is collected by using industry-standard Time Dependent Dielectric Breakdown (TDDB) test method. In this test, all pins on each side of the barrier are tied together creating a two-terminal device and high voltage is applied between the two sides; see Figure 9-8 for TDDB test setup. The insulation breakdown data is collected at various high voltages switching at 60 Hz over temperature. For basic insulation, VDE standard requires the use of a TDDB projection line with failure rate of less than 1000 part per million (ppm). For reinforced insulation, VDE standard requires the use of a TDDB projection line with failure rate of less than 1 part per million (ppm).

Even though the expected minimum insulation lifetime is 20 years, at the specified working isolation voltage, VDE basic and reinforced certifications require additional safety margin of 20% for working voltage. For basic certification, device lifetime requires a safety margin of 30% translating to a minimum required insulation lifetime of 26 years at a working voltage that is 20% higher than the specified value. For reinforced insulation, device lifetime requires a safety margin of 87.5% translating to a minimum required insulation lifetime of 37.5 years at a working voltage that is 20% higher than the specified value.

Insulation Lifetime Projection Data for ISO164x in 8-D Package and Insulation Lifetime Projection Data for ISO164x in 16-DW Package show the intrinsic capability of the isolation barrier to withstand high voltage stress over its lifetime. Based on the TDDB data, the intrinsic capability of the insulation is 450 VRMS with a lifetime in excess of 100 years in the 8-D package and 1500 VRMS with a lifetime in excess of 135 years in the 16-DW package. Other factors, such as package size, pollution degree, material group, etc. can further limit the working voltage of the component. At the lower working voltages, the corresponding insulation lifetime is much longer than 100 years in the 8-D package and 135 years in the 16-DW package.

GUID-F931646F-992A-434A-AB3B-317CD9560592-low.gifFigure 9-8 Test Setup for Insulation Lifetime Measurement
GUID-20201209-CA0I-RD0P-PNGP-M9TNHW0FKF5B-low.gifFigure 9-9 Insulation Lifetime Projection Data for ISO164x in 8-D Package
GUID-3CD43741-7DA5-485E-A01B-E37525BA73B6-low.pngFigure 9-10 Insulation Lifetime Projection Data for ISO164x in 16-DW Package