10 Revision History
Changes from Revision E (August 2023) to Revision F (October 2024)
- ドキュメント全体にわたって表、図、相互参照の採番方法を更新Go
- Updated Thermal Characteristics, Safety Limiting Values, and Thermal
Derating Curves to provide more accurate system-level thermal
calculationsGo
- Updated electrical and switching characteristics to match device
performanceGo
- Updated maximum power dissipation in the power ratings sectionGo
- Updated distance through isolation, while maintaining all other insulation specifications.Go
- Updated table entriesGo
- Updated the input leakage current for ENx pins throughout the electrical characteristic sectionsGo
- Updated maximum total current consumption values throughout the supply current characteristics sectionsGo
- Updated maximum propagation delay specifications throughout the switching characteristics sectionsGo
- Updated the TDDB plot and the projected lifetimeGo
Changes from Revision D (October 2020) to Revision E (August 2023)
- ドキュメント全体を通して標準名を以下のように変更:「DIN V VDE V 0884-11:2017-01」から「DIN EN IEC 60747-17 (VDE 0884-17)」Go
- ドキュメント全体を通して、すべての標準名から標準リビジョンおよび年への参照を削除Go
- Added VTEST conditions for VIOTM, updated DBQ package throughout the document, and updated method b1 conditionGo
- Changed working voltage lifetime margin from: 87.5% to: 50%, minimum
required insulation lifetime from: 37.5 years to: 30 years and insulation
lifetime per TDDB from: 135 years to: 169 years per DIN EN IEC 60747-17 (VDE
0884-17)Go
- Changed Figure 8-8 per DIN EN
IEC 60747-17 (VDE 0884-17Go