JAJSL91 april   2021 LM117QML-SP

PRODUCTION DATA  

  1.   1
  2. 1 特長
  3. 2 アプリケーション
  4. 3 概要
  5. 4 Revision History
  6. 5 Device Comparison Table
  7. 6 Pin Configurations and Functions
  8. 7 Specifications
    1. 7.1  Absolute Maximum Ratings
    2. 7.2  ESD Ratings
    3. 7.3  Recommended Operating Conditions
    4. 7.4  Thermal Information
    5. 7.5  Electrical Characteristics: 0.5–A IOUT Devices (LM117H, LM117GW)
    6. 7.6  Parameter Drift: 0.5–A IOUT Devices (LM117H, LM117GW)
    7. 7.7  Electrical Characteristics: 1.5–A IOUT Devices (LM117K)
    8. 7.8  Parameter Drift: 1.5–A IOUT Devices (LM117K)
    9. 7.9  Quality Conformance Inspection
    10. 7.10 Typical Characteristics
  9. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Setting Output Voltage
    4. 8.4 External Capacitors
    5. 8.5 Load Regulation
    6. 8.6 Protection Diodes
  10. 9 Application and Implementation
    1. 9.1 Typical Applications
  11. 10Power Supply Recommendations
  12. 11Layout
    1. 11.1 Layout Guidelines
  13. 12Device and Documentation Support
    1. 12.1 Device Support
      1. 12.1.1 サード・パーティ製品に関する免責事項
    2. 12.2 Documentation Support
      1. 12.2.1 Related Documentation
    3. 12.3 ドキュメントの更新通知を受け取る方法
    4. 12.4 サポート・リソース
    5. 12.5 Trademarks
    6. 12.6 静電気放電に関する注意事項
    7. 12.7 用語集

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

7.9 Quality Conformance Inspection

MIL-STD-883, Method 5005 - Group A
SUBGROUP DESCRIPTION TEMP (°C)
1 Static tests at +25
2 Static tests at +125
3 Static tests at –55
4 Dynamic tests at +25
5 Dynamic tests at +125
6 Dynamic tests at –55
7 Functional tests at +25
8A Functional tests at +125
8B Functional tests at –55
9 Switching tests at +25
10 Switching tests at +125
11 Switching tests at –55