SNIS144G July   2007  – September 2016 LM26LV , LM26LV-Q1

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings: LM26LV
    3. 6.3 ESD Ratings: LM26LV-Q1
    4. 6.4 Recommended Operating Conditions
    5. 6.5 Thermal Information
    6. 6.6 Electrical Characteristics
    7. 6.7 Switching Characteristics
    8. 6.8 Accuracy Characteristics
    9. 6.9 Typical Characteristics
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 LM26LV and LM26LV-Q1 VTEMP vs Die Temperature Conversion Table
      2. 7.3.2 VTEMP vs Die Temperature Approximations
        1. 7.3.2.1 The Second-Order Equation (Parabolic)
        2. 7.3.2.2 The First-Order Approximation (Linear)
        3. 7.3.2.3 First-Order Approximation (Linear) Over Small Temperature Range
      3. 7.3.3 OVERTEMP and OVERTEMP Digital Outputs
        1. 7.3.3.1 OVERTEMP Open-Drain Digital Output
          1. 7.3.3.1.1 Determining the Pullup Resistor Value
            1. 7.3.3.1.1.1 Example Calculation
      4. 7.3.4 TRIP_TEST Digital Input
      5. 7.3.5 VTEMP Analog Temperature Sensor Output
        1. 7.3.5.1 Noise Considerations
        2. 7.3.5.2 Capacitive Loads
        3. 7.3.5.3 Voltage Shift
    4. 7.4 Device Functional Modes
  8. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 ADC Input Considerations
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curves
  9. 9 Power Supply Recommendations
    1. 9.1 Power Supply Noise Immunity
  10. 10Layout
    1. 10.1 Layout Guidelines
      1. 10.1.1 Mounting and Temperature Conductivity
    2. 10.2 Layout Example
  11. 11Device and Documentation Support
    1. 11.1 Documentation Support
      1. 11.1.1 Related Documentation
    2. 11.2 Related Links
    3. 11.3 Receiving Notification of Documentation Updates
    4. 11.4 Community Resources
    5. 11.5 Trademarks
    6. 11.6 Electrostatic Discharge Caution
    7. 11.7 Glossary
  12. 12Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ

1 Features

  • Low 1.6-V Operation
  • Low Quiescent Current
  • Latching Function: Device Can Latch the Over Temperature Condition
  • Push-Pull and Open-Drain Temperature Switch Outputs
  • Wide Trip Point Range of 0°C to 150°C
  • Very Linear Analog VTEMP Temperature Sensor Output
  • VTEMP Output Short-Circuit Protected
  • Accurate Over –50°C to 150°C Temperature Range
  • Excellent Power Supply Noise Rejection
  • LM26LVQISD-130 and LM26LVQISD-135 are AEC-Q100 Qualified and are Manufactured on an Automotive Grade Flow:
    • Device Temperature Grade 0: –40°C to 150°C Ambient Operating Temperature Range
    • Device HBM ESD Classification Level 3 A
    • Device CDM ESD Classification Level C6
    • Device MM ESD Classification Level M3

2 Applications

  • Cell Phones and Wireless Transceivers
  • Digital Cameras
  • Battery Management Systems
  • Automotive Applications
  • Disk Drives
  • Games and Appliances

3 Description

The LM26LV and LM26LV-Q1 are low-voltage, precision, dual-output, low-power temperature switches and temperature sensors. The temperature trip point (TTRIP) can be preset at the factory to any temperature in the range of 0°C to 150°C in 1°C increments. Built-in temperature hysteresis (THYST) keeps the output stable in an environment of temperature instability.

In normal operation the LM26LV or LM26LV-Q1 temperature switch outputs assert when the die temperature exceeds TTRIP. The temperature switch outputs will reset when the temperature falls below a temperature equal to (TTRIP – THYST). The OVERTEMP digital output, is active-high with a push-pull structure, while the OVERTEMP digital output, is active-low with an open-drain structure.

The analog output, VTEMP, delivers an analog output voltage with Negative Temperature Coefficient (NTC).

Driving the TRIP_TEST input high causes the digital outputs to be asserted for in-situ verification and causes the threshold voltage to appear at the VTEMP output pin, which could be used to verify the temperature trip point.

The LM26LV's and LM26LV-Q1's low minimum supply voltage makes them ideal for 1.8-V system designs. The wide operating range, low supply current, and excellent accuracy provide a temperature switch solution for a wide range of commercial and industrial applications.

Device Information(1)

PART NUMBER PACKAGE BODY SIZE (NOM)
LM26LV, LM26LV-Q1 WSON (6) 2.20 mm × 2.50 mm
  1. For all available packages, see the orderable addendum at the end of the data sheet.

Redundant Protection and Monitoring

LM26LV LM26LV-Q1 20204702.gif

Typical Transfer Characteristic

LM26LV LM26LV-Q1 20204724.gif