JAJSB56H August   1999  – December 2017 LM35

PRODUCTION DATA.  

  1. 1 特長
  2. 2 アプリケーション
  3. 3 概要
    1.     Device Images
      1.      基本的な摂氏温度センサ(2℃～150℃)
      2.      全範囲の摂氏温度センサ
  4. 4 改訂履歴
  5. 5 Pin Configuration and Functions
    1.     Pin Functions
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics: LM35A, LM35CA Limits
    6. 6.6 Electrical Characteristics: LM35A, LM35CA
    7. 6.7 Electrical Characteristics: LM35, LM35C, LM35D Limits
    8. 6.8 Electrical Characteristics: LM35, LM35C, LM35D
    9. 6.9 Typical Characteristics
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 LM35 Transfer Function
    4. 7.4 Device Functional Modes
  8. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Capacitive Drive Capability
    2. 8.2 Typical Application
      1. 8.2.1 Basic Centigrade Temperature Sensor
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Design Procedure
        3. 8.2.1.3 Application Curve
    3. 8.3 System Examples
  9. 9 Power Supply Recommendations
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  11. 11デバイスおよびドキュメントのサポート
    1. 11.1 ドキュメントの更新通知を受け取る方法
    2. 11.2 コミュニティ・リソース
    3. 11.3 商標
    4. 11.4 静電気放電に関する注意事項
    5. 11.5 Glossary
  12. 12メカニカル、パッケージ、および注文情報

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

6.8 Electrical Characteristics: LM35, LM35C, LM35D

Unless otherwise noted, these specifications apply: −55°C ≤ TJ ≤ 150°C for the LM35 and LM35A; −40°C ≤ TJ ≤ 110°C for the LM35C and LM35CA; and 0°C ≤ TJ ≤ 100°C for the LM35D. VS = 5 Vdc and ILOAD = 50 μA, in the circuit of Full-Range Centigrade Temperature Sensor. These specifications also apply from 2°C to TMAX in the circuit of Figure 14.
PARAMETERTEST CONDITIONSLM35LM35C, LM35DUNIT
MINTYPMAXMINTYPMAX
Accuracy, LM35, LM35C(4) TA = 25°C ±0.4 ±0.4 °C
Tested Limit(2) ±1 ±1
Design Limit(3)
TA = –10°C ±0.5 ±0.5
Tested Limit(2)
Design Limit(3) ±1.5
TA = TMAX ±0.8 ±0.8
Tested Limit(2) ±1.5
Design Limit(3) ±1.5
TA = TMIN ±0.8 ±0.8
Tested Limit(2)
Design Limit(3) ±1.5 ±2
Accuracy, LM35D(4) TA = 25°C ±0.6 °C
Tested Limit(2) ±1.5
Design Limit(3)
TA = TMAX ±0.9
Tested Limit(2)
Design Limit(3) ±2
TA = TMIN ±0.9
Tested Limit(2)
Design Limit(3) ±2
Nonlinearity(5) TMIN ≤ TA ≤ TMAX,
–40°C ≤ TJ ≤ 125°C		 ±0.3 ±0.2 °C
Tested Limit(2)
Design Limit(3) ±0.5 ±0.5
Sensor gain
(average slope)		 TMIN ≤ TA ≤ TMAX,
–40°C ≤ TJ ≤ 125°C		 10 10 mV/°C
Tested Limit(2) 9.8
Design Limit(3) 9.8
10 10
Tested Limit(2) 10.2
Design Limit(3) 10.2
Load regulation(1)
0 ≤ IL ≤ 1 mA		 TA = 25°C ±0.4 ±0.4 mV/mA
Tested Limit(2) ±2 ±2
Design Limit(3)
TMIN ≤ TA ≤ TMAX,
–40°C ≤ TJ ≤ 125°C		 ±0.5 ±0.5
Tested Limit(2)
Design Limit(3) ±5 ±5
Line regulation(1) TA = 25°C ±0.01 ±0.01 mV/V
Tested Limit(2) ±0.1
Design Limit(3) ±0.1
4 V ≤ VS ≤ 30 V,
–40°C ≤ TJ ≤ 125°C		 ±0.02 ±0.02
Tested Limit(2)
Design Limit(3) ±0.2 ±0.2
Quiescent current(6) VS = 5 V, 25°C 56 56 µA
Tested Limit(2) 80 80
Design Limit(3)
VS = 5 V, –40°C ≤ TJ ≤ 125°C 105 91
Tested Limit(2)
Design Limit(3) 158 138
VS = 30 V, 25°C 56.2 56.2
Tested Limit(2) 82 82
Design Limit(3)
VS = 30 V,
–40°C ≤ TJ ≤ 125°C		 105.5 91.5
Tested Limit(2)
Design Limit(3) 161 141
Change of quiescent current(1) 4 V ≤ VS ≤ 30 V, 25°C 0.2 0.2 µA
Tested Limit(2) 2
Design Limit(3) 2
4 V ≤ VS ≤ 30 V,
–40°C ≤ TJ ≤ 125°C		 0.5 0.5
Tested Limit(2)
Design Limit(3) 3 3
Temperature coefficient of quiescent current –40°C ≤ TJ ≤ 125°C 0.39 0.39 µA/°C
Tested Limit(2)
Design Limit(3) 0.7 0.7
Minimum temperature for rate accuracy In circuit of Figure 14, IL = 0 1.5 1.5 °C
Tested Limit(2)
Design Limit(3) 2 2
Long term stability TJ = TMAX, for 1000 hours ±0.08 ±0.08 °C
(1) Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating effects can be computed by multiplying the internal dissipation by the thermal resistance.
(2) Tested Limits are ensured and 100% tested in production.
(3) Design Limits are ensured (but not 100% production tested) over the indicated temperature and supply voltage ranges. These limits are not used to calculate outgoing quality levels.
(4) Accuracy is defined as the error between the output voltage and 10 mv/°C times the case temperature of the device, at specified conditions of voltage, current, and temperature (expressed in °C).
(5) Non-linearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the rated temperature range of the device.
(6) Quiescent current is defined in the circuit of Figure 14.