JAJSFD4A May 2018 – November 2018 LM5122ZA
PRODUCTION DATA.
Losses in the high-side N-channel MOSFET device can be separated into conduction loss, dead-time loss, and reverse recovery loss. Switching loss is calculated for the low-side N-channel MOSFET device only. Switching loss in the high-side N-channel MOSFET device is negligible because the body diode of the high-side N-channel MOSFET device turns on before and after the high-side N-channel MOSFET device switches.
High-side conduction loss is approximately calculated as follows:
Dead-time loss is approximately calculated as follows:
where
Reverse recovery characteristics of the high-side N-channel MOSFET switch strongly affect efficiency, especially when the output voltage is high. Small reverse recovery charge helps to increase the efficiency while also minimizes switching noise.
Reverse recovery loss is approximately calculated as follows:
where
An additional Schottky diode can be placed in parallel with the high-side switch to improve efficiency. Usually, the power rating of this parallel Schottky diode can be less than the high-side switch’s because the diode conducts only during dead-times. The power rating of the parallel diode should be equivalent or higher than high-side switch’s if bypass operation is required, hiccup mode operation is required or any load exists before switching.