JAJS829D May   1998  – November 2023 LM6171

PRODUCTION DATA  

  1.   1
  2. 1 特長
  3. 2 アプリケーション
  4. 3 概要
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics: ±15 V
    6. 5.6 Electrical Characteristics: ±5 V
    7. 5.7 Typical Characteristics: LM6171A Only
    8. 5.8 Typical Characteristics
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Circuit Operation
      2. 6.3.2 Slew Rate
    4. 6.4 Device Functional Modes
  8. 7 Application and Implementation
    1. 7.1 Application Information
      1. 7.1.1 Compensation for Input Capacitance
      2. 7.1.2 Power Supply Bypassing
      3. 7.1.3 Termination
      4. 7.1.4 Driving Capacitive Loads
      5. 7.1.5 Using Probes
      6. 7.1.6 Components Selection and Feedback Resistor
    2. 7.2 Typical Applications
      1. 7.2.1 Fast Instrumentation Amplifier
      2. 7.2.2 Multivibrator
      3. 7.2.3 Pulse Width Modulator
    3. 7.3 Power Supply Recommendations
      1. 7.3.1 Power Dissipation
    4. 7.4 Layout
      1. 7.4.1 Layout Guidelines
        1. 7.4.1.1 Printed Circuit Boards and High-Speed Op Amps
  9. 8 Device and Documentation Support
    1. 8.1 ドキュメントの更新通知を受け取る方法
    2. 8.2 サポート・リソース
    3. 8.3 Trademarks
    4. 8.4 静電気放電に関する注意事項
    5. 8.5 用語集
  10. 9 Revision History
  11. 10Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

7.1.5 Using Probes

Active (FET) probes are an excellent choice for taking high-frequency measurements because of a wide bandwidth, high input impedance, and low input capacitance. However, the probe ground leads provide a long ground loop that produces errors in measurement. Instead, ground the probes directly by removing the ground leads and probe jackets and using scope probe jacks.