SNOSDA7F September 2020 – August 2024 LMG3422R030 , LMG3426R030 , LMG3427R030
PRODUCTION DATA
デバイスごとのパッケージ図は、PDF版データシートをご参照ください。
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
SWITCHING TIMES | ||||||
td(on)(Idrain) | Drain-current turn-on delay time | From VIN > VIN,IT+ to ID > 1A, VBUS = 400V, LHB current = 10A, see Figure 6-1 and Figure 6-2 | 28 | 42 | ns | |
td(on) | Turn-on delay time | From VIN > VIN,IT+ to VDS < 320V, VBUS = 400V, LHB current = 10A, see Figure 6-1 and Figure 6-2 | 32 | 52 | ns | |
tr(on) | Turn-on rise time | From VDS < 320V to VDS < 80V, VBUS = 400V, LHB current = 10A, see Figure 6-1 and Figure 6-2 | 2.5 | 4 | ns | |
td(off) | Turn-off delay time | From VIN < VIN,IT– to VDS > 80V, VBUS = 400V, LHB current = 10A, see Figure 6-1 and Figure 6-2 | 44 | 65 | ns | |
tf(off) | Turn-off fall time(1) | From VDS > 80V to VDS > 320V, VBUS = 400V, LHB current = 10A, see Figure 6-1 and Figure 6-2 | 21 | ns | ||
Minimum IN high pulse-width for FET turn-on | VIN rise/fall times < 1ns, VDS falls to < 200V, VBUS = 400V, LHB current = 10A, see Figure 6-1 | 24 | ns | |||
STARTUP TIMES | ||||||
t(start) | Driver start-up time | From VVDD > VVDD,T+(UVLO) to FAULT high, CLDO5V = 100nF, CVNEG = 2.2µF at 0V bias linearly decreasing to 1.5µF at 15V bias | 310 | 470 | us | |
FAULT TIMES | ||||||
toff(OC) | Overcurrent fault FET turn-off time, FET on before overcurrent | VIN = 5V, From ID > IT(OC) to ID < 50A, ID di/dt = 100A/µs | 110 | 145 | ns | |
toff(SC) | Short-circuit current fault FET turn-off time, FET on before short circuit | VIN = 5V, From ID > IT(SC) to ID < 50A, ID di/dt = 700A/µs | 65 | 100 | ns | |
Overcurrent fault FET turn-off time, FET turning on into overcurrent | From ID > IT(OC) to ID < 50A | 200 | 250 | ns | ||
Short-circuit fault FET turn-off time, FET turning on into short circuit | From ID > IT(SC) to ID < 50A | 80 | 180 | ns | ||
IN reset time to clear FAULT latch | From VIN < VIN,IT– to FAULT high | 250 | 380 | 580 | us | |
t(window)(OC) | Overcurrent fault to short-circuit fault window time | 50 | ns | |||
IDEAL-DIODE MODE CONTROL TIMES | ||||||
Overtemperature-shutdown ideal-diode mode IN falling blanking time | 150 | 230 | 360 | ns | ||
ZERO-VOLTAGE DETECTION AND ZERO-CURRENT DETECTION TIMES | ||||||
tWD_ZVD | ZVD/ZCD Pulse Width | See Figure 6-3 | 75 | 100 | 140 | ns |
tDL_ZVD | Time delay between IN rise to ZVD pulse's rising edge | See Figure 6-3 | 15 | 30 | ns | |
t3rd_ZVD | 3rd quadrant conduction time when the ZVD pulse starts to appear | Vbus = 10V, IL = 5A, Rdrv = 5V, measure the 3rd quadrant conduction time when the ZVD pulse starts to appear. See Figure 6-3 | 42 | 56 | ns | |
tZCD_Blank | Effective blanking time of ZCD pulse after FET turns on. | RDRV held to 5V (100V/ns). IL = 5A | 60 | 96 | 140 | ns |
tzc_Det | Time from current crossing zero to ZCD Pulse | Di/dt = 30A/µs | 20 | 57 | ns |